Split Test Access - Nortel NTRN10AN Planning Manual

Split test access

The split test access is an intrusive, service-affecting operation. The original
cross connection is split, with the incoming signal being connected (via TAP)
to the test unit receiver and the outgoing signal is fed from the transmitter of
test unit. See
Figure 2-57
Test access-split state
The split test access configurations that are supported include:
• Single Facility Access Digroup, Split Equipment side (Single FAD,
SPLTE) see
• Single Facility Access Digroup, Split Facility side (Single FAD, SPLTF)
see Figure 2-59
• Single Facility Access Digroup, Split Equipment input and continue from
TAP (Single FAD, SPLTA) see
• Dual Facility Access Digroup, Split Equipment and Facility sides (Dual
FAD, SPLTEF) see
Note: In
shows the direction(s) of the connection under test.
Single FAD, SPLTE and Single FAD SPLTF
In a single FAD environment, only one direction of the signal can be tested at
a time.
In the case of Single FAD, SPLTE, both the A and B paths are interrupted with
the input of A path-equipment side going to the TAP input and the output to B
path-equipment side as shown in
Planning and Ordering Guide—Part 1 of 2 NTRN10AN
Operation, administration, and maintenance (OAM) features 2-165
Figure 2-57.
Input
Figure 2-58
Figure 2-61
Figure 2-58 to Figure 2-61
Figure
Output
TAP IN
TAP Out
Figure 2-60
"equipment side" and "facility side"
2-58.
Rel 12.1 Standard Iss 1 Apr 2004
EX1398
Test
Unit