Omron V680 Series User Manual page 39

V700-A80 Attachment
 RF Tag Heat Resistance
• Storing RF Tags under high temperatures or under heat cycles will adversely affect the performance
of the internal parts and the service life of the RF Tags.
An LTPD of 10% was used for evaluation of RF Tags that reached the end of their service life after
testing under the following test conditions.
Heat cycle:
High-temperature storage:
LTPD: Lot Tolerance Percent Defective
The lower limit of the malfunction rate for lots to be considered unacceptable during reliability testing.
40
24
18
31±0.2
22
1,000 cycles of 30 minutes each between -10 and 150°C. No failures
occurred in 22 samples.
200 cycles of 30 minutes each between -10 and 180°C. No failures
occurred in 22 samples.
1,000 hours at 150°C. No failures occurred in 22 samples.
200 hours at 180°C. No failures occurred in 22 samples.
Mounting Hole Dimensions
31±0.2
Materials PPS resin
Section 1
Product Overview
(Unit: mm)
Two, M3 holes
RFID System
User's Manual
(Modbus TCP)
37