Emc Immunity - Fluke ScopeMeter 123 Service Manual

123
Service Manual

2.8 EMC Immunity

The Fluke 123, including standard accessories, conforms with the EEC directive 89/336
for EMC immunity, as defined by IEC1000-4-3, with the addition of tables 2-1 to 2-3.
Trace Disturbance with STL120
No visible disturbance
Frequency range 10 kHz to 27 MHz
Frequency range 27 MHz to 1 GHz
Disturbance less than 10% of full scale
Frequency range 10 kHz to 27 MHz
Frequency range 2 MHz to 1 GHz
(-): no visible disturbance
Test tool ranges not specified in Table 2-1 and Table 2-2 may have a disturbance of more than 10% of full
scale.
Multimeter disturbance
•
•
Disturbance less than 1% of full scale
Frequency range 10 kHz to 27 MHz
VDC, VAC, VAC+DC
OHM, CONT, DIODE
CAP
Frequency range 27 MHz to 1 GHz
VDC, VAC, VAC+DC
OHM, CONT, DIODE
CAP
Test tool ranges not specified in Table 2-3 may have a disturbance of more than 10% of full scale.
2-12
Table 2-1. No Visible Trace Disturbance
Table 2-2. Trace Disturbance < 10%
VDC, VAC, and VAC+DC with STL 120 and short ground lead
OHM, CONT, DIODE, and CAP with STL120 and black test lead to COM
Table 2-3. Multimeter Disturbance < 1%
See Table 2-1 and Table 2-2.
E= 3 V/m
50 mV/div to 500 V/div
50 mV/div to 500 V/div
E= 3 V/m
10 mV/div to 20 mV/div
5 mV/div to 20 mV/div
See Table 2-3.
E= 3 V/m
500 mV to 1250V
500Ω to 30 MΩ
50 nF to 500 µF
500 mV to 1250V
500Ω to 30 MΩ
50 nF to 500 µF
E= 10 V/m
500 mV/div to 500 V/div
50 mV/div to 500 V/div
E= 10 V/m
50 mV/div to 200 mV/div
-
E= 10 V/m
500 mV to 1250V
500Ω to 30 MΩ
50 nF to 500 µF
500 mV to 1250V
500Ω to 30 MΩ
50 nF to 500 µF