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Appendix B.
'
Diagnostic Tests
This appendix contains reference information that is to be used by second-level
support personnel or a service representative who has been directed here by a
service p r a d u r e .
The tape unit contains internal diagnostics to aid in analyzing problems. The proce-
dure to run the tests is in "Running Diagnostic TestsJ' on page A-5.
Power-On Self-Test
When the machine is powered up, a sequence of tests are performed. The
sequence used when the tape unit is powered on is different from the Test
0
(power-on) sequence started on an already powered up tape unit.
At power on, each of the processors is tested by a similar kernel test. The testing
takes place in parallel between all processors to make the power-on time shorter.
When all processors have completed their own tests, a power-on signal takes place
between the processors. The controller card is then placed in control to start a test
sequence which completes the diagnostic power up procedure.
1. Controller card
Kernel tests
Tape unit specific tests
Front panel lights
2. Buffer card
Kernel tests
Buffer tests
3. lnterface card
Kernel tests
lnterface specific tests
4. Power on signal
Complete dual-port direct-access storage test
Loop back tests
Sequence Tests
A sequence test is a group of other tests which may also be sequence tests. The
purpose of a sequence test is to test more function by pressing fewer keys. When a
sequence is selected, the tape unit runs the tests in the sequence until an error
occurs or until the sequence completes successfully. Tests with numbers below 40
are sequence tests.
Diagnostic Test 0 (Power On)
Diagnostic Test 0 tests the digital data paths and normal machine operation. This
sequence test runs tests similar to those normally run at power on time. The tests
for each controller are run serially in this test, not in parallel, as in an actual power
on. The tests are run in the following sequence:
Test 13
Test 14
O
Copyright IBM Corp.
1989,1992
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