Invisible Smear Level; Excellent Signal-To-Noise Ratio; Super Evs (Enhanced Vertical Definition System); Clear Scan And Ecs (Extended Clear Scan) - Sony BVP-900 Series Product Information Manual

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SONY ADVANCED ELECTRONIC IMAGING TECHNOLOGIES
the photo sensor area by precisely positioning a microlens over each
pixel. As a result, the camera sensitivity is doubled, achieving a
figure of F10.0 at 2000 lux with OHB-750WSA/P, OHB-730WS/P and
OHB-730/P. (F8.0 with OHB-750A/P.) The following Figure 3-5
shows how the OCL enhances sensitivity.
On-Chip-Lens
Al
Si
Hole Accumulated Layer
N+
P+
2nd
P-Well
N-Substrate
C.S
(Channel
R.O.G
stop) (Read out gate)
V-register
Figure 3-3 On-chip-lens structure

3-7. Invisible Smear Level

The OCL layer in the Power HAD imager effectively concentrates the
incoming light on the photo sensor so that leakage of light is greatly
reduced. The direct result of this is a very low smear level (even on
the IT sensors). This further improvement of the masking
techniques in the Power HAD 1000 (FIT) has reduced the smear to a
level of -145 dB (FIT), which is invisible. The following Figure 3-4
and 3-5 shows the new techniques.
N+
P+
C.S V-register R.O.G
(Channel (Read out
stop) gate)
Figure 3-4 Smear Pattern of the previous generation of CCDs
19
Al
Si
P+
N+
1st P-Well
Sensor
Sensed light
N+
P+ P+
Sensor
Masking
Ai
Si
N+
P+
2nd
P-Well
N-Substrate
C.S
(Channel
V-register R.O.G
stop)
(Read out gate)
Figure 3-5 Power HAD 1000 CCD imager

3-8. Excellent Signal-to-Noise Ratio

The superior structure of the Power HAD imager greatly contributes
to a reduction in the dark current noise to 1/10 of that in the
previous generation of CCDs. This gives a corresponding reduction
in the fixed pattern noise, maintaining low noise characteristics in all
imaging situations. In combination with an advanced CCD support
system, the Power HAD 1000 incorporated in the BVP-900 Series
achieves the excellent signal-to-noise ratio of 65 dB (typical) for
NTSC and 63 dB (typical) for PAL.

3-9. Super EVS (Enhanced Vertical Definition System)

The basic Enhanced Vertical Definition System (EVS) can sometimes
cause line flicker due to the increase in vertical definition. Super
EVS, which is available on BVP-900 Series cameras fitted with FIT
sensors, allows the vertical resolution to be enhanced over a range of
400 to 450 lines for NTSC and from 450 to 530 lines for PAL This is
achieved by changing the charge mixing ratio in the CCD read out.
This function is remotely controlled from the MSU-700 Master Set-up
Unit and permits the balance between vertical resolution and motion
blur to be optimized for different scene contents, while keeping line
flicker to a minimum.

3-10. Clear Scan and ECS (Extended Clear Scan)

The well proven Clear Scan and ECS functions eliminate banding
effects when shooting monitor displays by allowing the shutter speed
to be adjusted so that it exactly matches the various scanning
frequencies that are in use. For FIT CCDs, the Clear Scan shutter
speed range is 60.1 to 7000 Hz for NTSC and 50.2 to 9000 Hz for
PAL, the ECS range is 30.4 to 58.3 Hz for NTSC and 25.4 to 48.5 Hz
for PAL. For IT CCDs it is 60.1 to 7000 Hz for NTSC and 50.2 to 9000
Hz for PAL. The ECS function is especially effective for shooting
computer displays that have vertical scanning rates below 60 Hz.
Ai
Si
P+
N+
Hole Accumulated Layer
1st P-Well
Sensor