Error History Function; Event History Function; Self-Diagnostic Function - Mitsubishi Electric MELSEC iQ-R Series User Manual

Error history function

Errors occurred in a C intelligent function module are stored in maximum 16 buffer memory as a history. If a major/moderate
error occurs, even if new errors have occurred, the history is not updated.

Event history function

Errors occurred and operations performed in a C intelligent function module are sampled in a CPU module as event
information.
Event information occurred in a C intelligent function module is sampled and retained in the data memory or an SD memory
card in a CPU module.
Event information sampled in a CPU module can be displayed in an engineering tool, and the occurrence history can be
checked chronologically.
Setting method
The event history function can be set in the event history setting screen of an engineering tool.
For the setting method, refer to the following:
MELSEC iQ-R CPU Module User's Manual (Application)
Checking an event history
An event history can be checked in an engineering tool.
For details on the operating procedures and how to read the displayed information, refer to the following:
GX Works3 Operating Manual
CW Configurator Operating Manual

Self-diagnostic function

Self-diagnostics test is performed to check the hardware of a C intelligent function module.
Self-diagnostics test is as follows.
• Automatic Hardware Test (Page 67 Automatic hardware test)
• Hardware test for LED check (Page 68 Hardware test for LED check)
1 FUNCTION
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1.3 RAS Function