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Error History Function; Event History Function; Self-diagnostic Function - Mitsubishi Electric MELSEC iQ-R C User Manual

Melsec iq-r series, intelligent function module, application.
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Error history function

Errors occurred in a C intelligent function module are stored in maximum 16 buffer memory as a history. If a major/moderate
error occurs, even if new errors have occurred, the history is not updated.

Event history function

The errors occurred in a C intelligent function module and operations executed are sampled in the CPU module as an event
information.
Event information occurred in a C intelligent function module is sampled and held in the data memory or an SD memory card
in a CPU module.
An event information sampled by CPU module can be displayed by an engineering tool and the occurrence history can be
checked chronologically.
Setting method
Event history function can be set from the event history setting screen of an engineering tool.
For the setting method, refer to the following section.
MELSEC iQ-R CPU Module User's Manual (Application)
■Checking an event history
Can be checked from an engineering tool.
For details on the operating procedures and how to read the displayed information, refer to the following manual.
GX Works3 Operating Manual

Self-diagnostic function

Self-diagnostics test is performed to check the hardware of a C intelligent function module.
Self-diagnostics test is as follows.
• Automatic Hardware Test (Page 54 Automatic hardware test)
• Hardware test for LED check (Page 55 Hardware test for LED check)
1 FUNCTION
28
1.3 RAS Function

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