Processor Technology 8KRA Assembly And Test Instructions page 45

PROCESSOR TECHNOLOGY CORPORATION
APPENDIX VI
8KRA STATIC READ/WRITE MEMORY MODULE
0 03B 0188
• 3
HAS WRITE DATA
0 038
0 189 «
2 HAS READ DATA (ERROR)
0 038 0 190 0 HAS PAGE DOWN COUNT
0 038 0210
♦
0 038
0215
♦
0 038 E5 0216 ERROR PUSH H STUFF ADDRESSES
0 0 30 57
0220 MOV D, A GET WRITE DATA
0 038 5E 0225
MOV
E,M GET READ DATA
0 0 3E D5 0230 PUSH D
PUT ON STACK
0 0 3F 05 0235 PUSH 8
ALL OF IT
0 040 76 0240 AHHHH HLT
STOP THIS NONSENSE
0 04! 0245
«
0 041
0250 *
VI. 2 8KRA LONG MEMORY TEST
This test requires a terminal which has an ESCAPE function.
It provides a more thorough test than the short test and also prints
out a map which simplifies identification of defective components.
VI. 2.1 Test Procedure
To use the 8KRA Long Memory Test, proceed as follows:
NOTE 1
The 8KRA to be tested MUST be unpro ­
tected. Also, the address offset
switches (A10, All and A12) on the
8KRA to be tested MUST all be in the
off position.
They remain in this
position throughout the entire test.
NOTE 2
The test program will defeat attempts
to test the lowest 8K of memory which
contains the test program itself.
( ) Step 1 . Set DIP Switches Al 5, A14 and Al 3 on the 8KRA as
described in Section III, Paragraph 3.5 of this manual to
select one of these starting addresses: 2000, 4000, 6000,
8000, A000 , C000 or E000 (all hex).
NOTE 1
The 8KRA to be tested MUST be ad ­
dressed at one of the seven preceding
addresses .
AVI- 3