Table of Contents
Advertisement
PROCESSOR TECHNOLOGY CORPORATION
8KRA STATIC READ/WRITE MEMORY MODULE
VI. I
SHORT 8K MEMORY TEST
APPENDIX VI
The short 8K memory test will find most errors in any 8K segment
of memory. The long 8K MEMORY TEST very thoroughly tests any 8K
segment of memory and also prints out a map which identifies the probable
bad memory IC. The short test is useful since it does not require a terminal.
The short test is performed in two segments: write and read. Write
begins at the bottom of the 8K address (LOAD), writing zero and then
writing an incrementing pattern to the "top".
After each location is read
and compared to its proper pattern, and if no errors are found, the start
ing pattern is incremented and the test is once again performed.
This read-write sequence continues until an error is found or until
the machine is halted. If an error is found, all information relating to the
error is saved in locations
000 — 006.
ADDRESS
1
High Address Error Pointer
2
Low Address Error Pointer
3
Write Data
4
Read Data (Error)
5
Page Down Count
VI. 1.1
Test Procedure
To use the test program given in Paragraph V.1.2, proceed as
follows :
(
)
Step 1 ♦ C lear memory . locations
0000
through
0006
and load the hex code starting from location
0007.
(
)
Step 2. A s the code is entered, check the address for
each input as a test of proper code and location.
(
)
Step 3. Check each location for the proper bits after a
all code is entered.
(
)
Step 4. Press RESET and RUN switches. The test
should proceed as indicated by the address lights.
NOTE
A full test of all 256 bit patterns
to all 8192 locations takes about
one minute with a fast memory.
(
)
Step 5. Repeat test for one hour with the computer
cover in place
AVI-1
Advertisement
Table of Contents
