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Model 6487 User's Manual
Table 2-1
Summary of measurement considerations
Considerations
Input bias current
Voltage burden
Noise
Ground loops
Triboelectric effects
Piezoelectric and stored
charge effects
Electrochemical effects
Humidity
Light
Electrostatic interference
Magnetic fields
Electromagnetic interference
(EMI)
See Model 6487 Reference Manual, Appendix G for details.
Offset current of Model 6487 could affect low current measurements.
Offset voltage of Model 6487 could cause errors if it is high in
relation to the voltage of the measured circuit.
Noise generated by source resistance and source capacitance.
See
Appendix B
for details.
Multiple ground points can create error signals.
Charge currents generated in a cable by friction between a conductor
and the surrounding insulator (i.e., bending a triax cable).
Currents generated by mechanical stress on certain insulating
materials.
Currents generated by the formation of chemical batteries on a
circuit board caused by ionic contamination.
Reduces insulation resistance on PC boards and test connection
insulators.
Light sensitive components must be tested in a light-free
environment.
Charge induced by bringing a charged object near your test circuit.
The presence of magnetic fields can generate EMF (voltage).
EMI from external sources (i.e., radio and TV transmitters) can
affect sensitive measurements.
Description
Connections
2-11
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