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TRF7963A
SLOS758G – DECEMBER 2011 – REVISED MARCH 2020
5 Specifications
5.1
Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
Input voltage range, V
IN
Maximum current, I
IN
Maximum operating virtual junction temperature, T
Storage temperature, T
STG
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions are not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to substrate ground terminal VSS.
(3) The maximum junction temperature for continuous operation is limited by package constraints. Operation above this temperature may
result in reduced reliability or lifetime of the device.
5.2
ESD Ratings
V
Electrostatic discharge
(ESD)
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
5.3
Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
V
Operating input voltage
IN
T
Operating ambient temperature
A
T
Operating virtual junction temperature
J
8
Specifications
(1)
Any condition
(3)
J
Continuous operation, long-term reliability
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001
Charged-device model (CDM), per JEDEC specification JESD22‑C101
Machine model (MM)
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(2)
(1)
Copyright © 2011–2020, Texas Instruments Incorporated
TRF7963A
www.ti.com
MIN
MAX
UNIT
–0.3
6
V
150
mA
140
°C
125
–55
150
°C
VALUE
UNIT
±2000
(2)
±500
V
±200
MIN
NOM
MAX
UNIT
2.7
5
5.5
V
–25
25
85
°C
–25
25
125
°C
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