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8 Specifications
All specifications are measured at the module pins using the TI WL1835MODCOM8 evaluation board. All
measurements are performed with V
unless otherwise indicated.
For level-shifting I/Os with the TI WL18x5MOD, see the
8.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
V
BAT
V
IO
Input voltage to analog pins
Input voltage limits (CLK_IN)
Input voltage to all other pins
Operating ambient temperature
Storage temperature, T
stg
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under Operating Conditions is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
4.8 V cumulative to 2.33 years, including charging dips and peaks
(3)
In the WL18xx system, a control mechanism exists to ensure T
manages the transmitter patterns.
8.2 ESD Ratings
V
Electrostatic discharge
(ESD)
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
8.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
(1)
V
DC supply range for all modes
BAT
V
1.8-V I/O ring power supply voltage
IO
V
I/O high-level input voltage
IH
V
I/O low-level input voltage
IL
V
Enable inputs high-level input voltage
IH_EN
V
Enable inputs low-level input voltage
IL_EN
V
High-level output voltage
OH
V
Low-level output voltage
OL
T
,T
Input transitions time T
r
f
T
Output rise time from 10% to 90% (digital pins)
r
T
Output fall time from 10% to 90% (digital pins)
f
Ambient operating temperature
Copyright © 2021 Texas Instruments Incorporated
= 3.7 V, V
BAT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001
Charged device model (CDM), per JEDEC specification JESD22-C101
,T
from 10% to 90% (digital I/O)
r
f
(2)
(2)
Product Folder Links:
WL1801MOD WL1805MOD WL1831MOD WL1835MOD
WL1801MOD, WL1805MOD, WL1831MOD, WL1835MOD
= 1.8 V, 25°C for typical values with matched RF antennas,
IO
Note
Level Shifting WL18xx I/Os application
(1)
< 125°C. When T
approaches this threshold, the control mechanism
j
j
0.65 × VDD_IO
At 4 mA
VDD_IO –0.45
At 4 mA
(2)
C
< 25 pF
L
C
< 25 pF
L
SWRS152N – JUNE 2013 – REVISED APRIL 2021
MIN
MAX UNIT
4.8
–0.5
–0.5
–0.5
VDD_IO
–0.5
(VDD_IO + 0.5 V)
–20
70
–40
VALUE
(1)
±1000
(2)
±250
MIN
TYP
2.9
3.7
1.62
1.8
VDD_IO
0
0.35 × VDD_IO
1.365
VDD_IO
0
VDD_IO
0
1
–20
Submit Document Feedback
report.
(2)
V
2.1
V
2.1
V
V
V
(3)
°C
85
°C
UNIT
V
MAX
UNIT
4.8
V
1.95
V
V
V
V
0.4
V
V
0.45
V
10
ns
5.3
ns
4.9
ns
70
°C
9
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