Basic Test Procedure With Tsw1400; Tsw1400 Overview; Test Block Diagram For Tsw1400; Test Set-Up Block Diagram For Tsw1400 - Texas Instruments DAC348 Series User Manual

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Basic Test Procedure with TSW1400

This section outlines the basic test procedure for testing the EVM with the TSW1400.
3.1

TSW1400 Overview

The TSW1400 is a high speed data capture and pattern generator board. When functioning as a pattern
generator, it has a maximum LVDS bus rate of 1.5 GSPS, and this allows evaluation of the DAC348x with
maximum 750 MSPS of input data rate per channel.
See the TSW1400 user's guide (SLWU079) for more detailed explanation of the TSW1400 setup and
operation. This document assumes that the High Speed Data Converter Pro software (SLWC107) is
installed and functioning properly.
3.2

Test Block Diagram for TSW1400

The test set-up for general testing of the DAC348x with the TSW1400 pattern generation card is shown in
Figure 8.
USB
J5
TSW1400
SLAU432 – February 2012
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PC
+5V
J12
J4 J13
J18
Figure 8. Test Set-up Block Diagram for TSW1400
Copyright © 2012, Texas Instruments Incorporated
USB
J9 J14
DAC348X
IF
+6V
Basic Test Procedure with TSW1400
Signal
Generator
(CLK Source)
Spectrum
Analyzer
DAC348x EVM
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