Stanford Research Systems SR850 User Manual page 244

SR850 Performance Test Record
5. Amplitude Linearity
Sensitivity
1 V
6. Frequency Accuracy
Input Frequency
10 kHz
7. Phase Accuracy
Frequency
10 Hz
100 Hz
1 kHz
10 kHz
8. Sine Output Amplitude and Flatness
Sensitivity
1 V
200 mV
50 mV
10 mV
Sine Ampl.
1.000 Vrms
9. DC Outputs and Inputs
Output
CH1
Calibrator Ampl.
1.0000 Vrms
100.00 mVrms
10.000 mVrms
4.000 mVrms
Lower Limit
9.990 kHz
Lower Limit
-1.0 deg
-1.0 deg
-1.0 deg
-1.0 deg
Sine Output Ampl.
1.000 Vrms
0.200 Vrms
0.050 Vrms
0.010 Vrms
Frequency
24 kHz
48 kHz
72 kHz
96 kHz
Offset
-100.00
-50.00
0.00
50.00
100.00
7-26
Lower Limit Reading
0.9900 V _______
0.0990 V _______
0.0098 V _______
0.0038 V _______
Reading Upper Limit
_______ 10.010 kHz
Reading Upper Limit
_______ +1.0 deg
_______ +1.0 deg
_______ +1.0 deg
_______ +1.0 deg
Lower Limit Reading
0.9800 V _______
196.00 mV _______
49.000 mV _______
9.800 mV _______
Lower Limit Reading
0.9800 V _______
0.9800 V _______
0.9800 V _______
0.9800 V _______
Lower Limit Reading
9.960 V _______
4.960 V _______
-0.020 V _______
-5.040 V _______
-10.040 V _______
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Upper Limit
1.0100 V
0.1010 V
0.0102 V
0.0042 V
Upper Limit
1.0200 V
204.00 mV
51.000 mV
10.200 mV
Upper Limit
1.0200 V
1.0200 V
1.0200 V
1.0200 V
Upper Limit
10.040 V
5.040 V
0.020 V
-4.960 V
-9.960 V