Agilent Technologies N4906B Serial BERT User Manual page 10

Planning the Test
10
The following references may also be helpful in determining how to
test your device.
• For a list of recommended patterns for your device and application,
see "When to Use Which Pattern?" on page 22.
• For a list of recommended connection diagrams for your device and
application, see "Connecting the DUT" on page 13.
What are the Testing Requirements of Your Device?
Considering the requirements of your device will help you choose
which instrument functions to use during the test setup and when
making measurements.
• Do you need to use a custom test pattern?
If you have a long series of 1's or 0's in your custom pattern, be sure
to avoid false sync. See "What is False Synchronization?" on
page 114
• Do you want to use alternating patterns?
Then you must first import or create a custom pattern that contains
an A half (pattern A) and B half (pattern B). See "Pattern
Alternation" on page 76.
• Are you aware of how custom pattern size can affect the pattern
output?
See "Why the Serial BERT Repeats Memory-Based Patterns" on
page 28.
• Does your device change the input pattern it receives?
If your device inverts logic, then select Data Inverted in the
Sampling Point Setup window. If your device changes patterns in
other ways, then you must know the expected output pattern and
select it as the error detector reference pattern.
• What logic family is your device compatible with?
The pattern generator has preset voltage levels to work with ECL,
SCFL, LVPECL, LVDS, and CML. Be sure to select the correct logic
family. See "Understanding how the Serial BERT Uses Logic
Families and Terminations" on page 56.
• What is the input termination voltage of your device?
Make sure it is the same voltage as displayed in the pattern
generator termination list.
Agilent N4906B Serial BERT, User's Guide, October 2005
Which Test is Appropriate?