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6 Buffer memory
Chapter 6: Buffer memory
6.1 Buffer memory assignment
(1) Configurable sections (Un \ G0 to Un \ G1100, Un \ G2000 to Un \ G2100)
Table 6.1-1 Configurable sections (Un\G0 to Un\G1100, Un\G2000 to Un\G2100)
Address
(decimal)
Item
CH1
1-99
100
1000
1001
1002
1003
1004
Configur-
1005
able
section
1006-
1049
1050
1051
1052
1053
1054
1055
1056-
1100
*1: Pr indicates setting data, and Md indicates monitoring data.
*2: It indicates readable / writable status from the sequence program.
R: Readable
W: Writable
*3: Even if the power failure is restored, data is held because data is backed up by the nonvolatile memory.
*4: For the procedure for using the test mode, refer to section 4.2.5.
The following describes buffer memory assignment.
Point
Do not write data into the prohibited area in the buffer memory from system area
and sequence program. If data are written into these areas, it may cause
malfunction.
Data
*1
type
CH2
0
Pr
Phase wire system
-
System area
Leak current, Leak current for
Md
resistance multiplying factor
n
(x 10
)
2000
Pr
2001
Pr
2002
Pr
Leak
2003
Pr
current
2004
Pr
2005
Pr
2006-
-
System area
2049
2050
Pr
2051
Pr
2052
Pr
Leak
current for
2053
Pr
resistance
2054
Pr
2055
Pr
2056-
-
System area
2100
Default
Description
value
3
-
0
primary alarm
0
value
primary alarm
0
reset method
primary alarm
0
delay time
secondary
0
alarm value
secondary
alarm reset
0
method
secondary
alarm delay
0
time
-
primary alarm
0
value
primary alarm
0
reset method
primary alarm
0
delay time
secondary
0
alarm value
secondary
alarm reset
0
method
secondary
alarm delay
0
time
-
6 – 1
QE82LG
Value during the
Backup
*2
test mode
R/W
*3
CH1
○
R/W
3
-
-
0
○
R
-2
○
R/W
0
○
R/W
0
○
R/W
0
○
R/W
0
○
R/W
0
○
R/W
0
-
-
-
○
R/W
0
○
R/W
0
○
R/W
0
○
R/W
0
○
R/W
0
○
R/W
0
-
-
-
*4
CH2
0
0
0
0
0
0
-
0
0
0
0
0
0
-
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