Tektronix TLA500 Series Technical Reference
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Tektronix TLA500 Series Technical Reference

Tektronix TLA500 Series Technical Reference

Logic analyzer
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TLA5000 Series Logic Analyzer
xx
Product Specifications & Performance Verification
ZZZ

Technical Reference

This document applies to TLA System Software Version
5.1SP1 and above
Warning
These servicing instructions are for use by qualified personnel
only. To avoid personal injury, do not perform any servicing
unless you are qualified to do so. Refer to all safety summaries
prior to performing service.
www.tektronix.com
071-2502-00

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  • Page 1: Technical Reference

    5.1SP1 and above Warning These servicing instructions are for use by qualified personnel only. To avoid personal injury, do not perform any servicing unless you are qualified to do so. Refer to all safety summaries prior to performing service. www.tektronix.com 071-2502-00...
  • Page 2 Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions. Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material.
  • Page 3 Tektronix, with shipping charges prepaid. Tektronix shall pay for the return of the product to Customer if the shipment is to a location within the country in which the Tektronix service center is located. Customer shall be responsible for paying all shipping charges, duties, taxes, and any other charges for products returned to any other locations.

  • Page 5: Table Of Contents

    Table of Contents General Safety Summary ..................Service Safety Summary..................Environmental Considerations .................. Preface ......................Related Documentation ..................Certifications and Compliances ................... Specifications ....................... External Oscilloscope (iView) Characteristics ..............Performance Verification Procedures................Summary Verification ..................Certification ....................Test Equipment....................Functional Verification ..................Performance Verification..................
  • Page 6 Table of Contents List of Figures Figure 1: Dimensions of the TLA5000 series logic analyzer..........Figure 2: Defining group parameters................Figure 3: Setting trigger parameters................Figure 4: Set the trigger states ................... Figure 5: Threshold Accuracy test fixture ..............Figure 6: Solder square pins to the SMA connector ............Figure 7: Solder the SMA connectors together ..............
  • Page 7 Table of Contents List of Tables Table i: Related Documentation ................. Table 1: Atmospheric characteristics................Table 2: TLA5000 input parameters with probes ............... Table 3: TLA5000 timing latencies ................Table 4: TLA5000 external signal interface ..............Table 5: TLA5000 channel width and depth ..............Table 6: Reference clock (CLK10) ................

  • Page 8: General Safety Summary

    General Safety Summary General Safety Summary Review the following safety precautions to avoid injury and prevent damage to this product or any products connected to it. To avoid potential hazards, use this product only as specified. Only qualified personnel should perform service procedures. While using this product, you may need to access other parts of a larger system.
  • Page 9 General Safety Summary Terms in this Manual These terms may appear in this manual: WARNING. Warning statements identify conditions or practices that could result in injury or loss of life. CAUTION. Caution statements identify conditions or practices that could result in damage to this product or other property.

  • Page 10: Service Safety Summary

    Service Safety Summary Service Safety Summary Only qualified personnel should perform service procedures. Read this Service Safety Summary and the General Safety Summary before performing any service procedures. Do Not Service Alone. Do not perform internal service or adjustments of this product unless another person capable of rendering first aid and resuscitation is present.

  • Page 11: Environmental Considerations

    Directive 2002/96/EC on waste electrical and electronic equipment (WEEE). For information about recycling options, check the Support/Service section of the Tektronix Web site (www.tektronix.com). Mercury Notification. This product uses an LCD backlight lamp that contains mercury. Disposal may be regulated due to environmental considerations.
  • Page 12 Environmental Considerations viii TLA5000 Series Product Specifications & Performance Verification...

  • Page 13: Preface

    The following table lists related documentation available for your logic analyzer. The documentation is available on the TLA Documentation CD included with your logic analyzer, and on the Tektronix Web site (www.Tektronix.com). To obtain documentation not specified in the table, contact your local Tektronix representative. Table i: Related Documentation...
  • Page 14 Self-service documentation for modules and mainframes TLA Application Software Release Notes Software description, compatibility, impact of changes, contact information, installation, upgrade, and operational notes, and known issues. Go to Start→All Programs→Tektronix logic Analyzer→TLA Release Notes TLA5000 Series Product Specifications & Performance Verification...

  • Page 15: Certifications And Compliances

    Certifications and Compliances The certifications and compliances apply to all components of the Tektronix Logic Analyzer family unless otherwise noted. Certifications and Compliances EC Declaration of Meets intent of Directive 2004/108/EEC for Electromagnetic Compatibility. Compliance was demonstrated to the following specifications as listed in the Conformity –...
  • Page 16 Certifications and Compliances U.S. Nationally Recognized UL 61010B-1: 2004, 2 Edition. Standard for electrical measuring and test equipment. Testing Laboratory Listing Canadian Certification CAN/CSA C22.2 No. 61010-1:2004. Safety requirements for electrical equipment for measurement, control, and laboratory use. Part 1. Additional Compliances IEC 61010-1: 2001.
  • Page 17 Certifications and Compliances Installation (Overvoltage) Terminals on this product may have different installation (overvoltage) category designations. The installation categories are: Category Descriptions Measurement Category IV. For measurements performed at the source of low-voltage installation. Measurement Category III. For measurements performed in the building installation.

  • Page 18: Specifications

    The instrument must have been calibrated/adjusted at an ambient temperature between +20 °C and +30 °C. For optimum performance using an external oscilloscope, please consult the documentation for any external oscilloscopes used with your Tektronix logic analyzer to determine the warm-up period and signal-path compensation requirements.

  • Page 19: Table 2: Tla5000 Input Parameters With Probes

    Specifications Table 2: TLA5000 input parameters with probes Characteristic Description ±100 mV Threshold Accuracy Threshold range and step size Settable from +4.5 V to -2 V in 5 mV steps Threshold channel selection 16 threshold groups assigned to channels. P6410, P6417, P6418, and P6419 probes have two threshold settings, one for the clock/qualifier channel and one for the data channels.

  • Page 20: Table 4: Tla5000 External Signal Interface

    Specifications Table 3: TLA5000 timing latencies (cont.) Characteristic Description System Trigger and LA Probe Tip to External System Trigger Out 778 ns + SMPL External Signal Output LA Probe Tip to External OR function 772 ns + SMPL Latencies (Typical) Signal Out via Signal 3, AND function 772 ns + SMPL...

  • Page 21: Table 5: Tla5000 Channel Width And Depth

    Specifications Table 4: TLA5000 external signal interface (cont.) Characteristic Description System trigger output TTL compatible output via rear panel mounted BNC connectors Source selection System trigger Source mode Active (true) low, falling edge latched Active period Outputs system trigger state during valid acquisition period, resets system trigger output to false state between valid acquisitions Output levels 50 Ω...

  • Page 22: Table 6: Reference Clock (Clk10)

    Specifications Table 5: TLA5000 channel width and depth (cont.) Characteristic Description Acquisition memory depth Product Memory depth TLA520XB 2 M or optionally 8 M or 32 M samples TLA520X 512 K or optionally 2 or 8 M samples PowerFlex options Table 6: Reference clock (CLK10) Characteristic Description...

  • Page 23: Table 7: Tla5000 Clocking

    Specifications Table 7: TLA5000 clocking Characteristic Description Asynchronous clocking 500 ps to 50 ms in a 1-2-5 sequence. Storage control can be used to only Internal sampling period store data when it has changed (transitional storage) 2 ns minimum for all channels 1 ns minimum for half channels (using 2:1 demultiplex mode) 0.5 ns minimum for quarter channels (using 4:1 demultiplex mode) Minimum recognizable word...
  • Page 24 Specifications Table 7: TLA5000 clocking (cont.) Characteristic Description Setup and hold window range For each channel, the setup and hold window can be moved from +8.0 ns (Ts) to -8.0 ns (Ts) in 0.125 ns steps. The hold time follows the setup time by the setup and hold window size.

  • Page 25: Table 8: Tla5000 Trigger System

    Specifications Table 7: TLA5000 clocking (cont.) 2X Demux clocking TLA5201, TLA5202 Unlike 2X demultiplexing, the channels within a group of four cannot arbitrarily drive the others. A1(7:0) to A0(7:0), D1(7:0), D0(7:0) TL:A5202 only C3(7:0) to C2(7:0), A3(7:0), A2(7:0) Time between Demultiplex clock edges (Typical) Same limitations as normal synchronous acquisition Clocking state machine Pipeline delays...
  • Page 26 Specifications Table 8: TLA5000 trigger system (cont.) Characteristic Description Transition detector 16 transition detectors. Any channel group can be enabled or disabled to detect a rising transition, a falling transition, or both rising and falling transitions between the current valid data sample and the previous valid data sample.

  • Page 27: Table 9: Tla5000 Magnivu Feature

    Specifications Table 8: TLA5000 trigger system (cont.) Characteristic Description By event Storage can be turned on or off; only the current sample can be stored. The event storage control overrides any global storage commands. Block storage When enabled, 31 samples are stored before and after the valid sample. Not allowed when glitch storage or setup and hold violation is enabled.

  • Page 28: Table 11: Tla5000 Data Handling

    Specifications Table 10: TLA5000 Data Placement (cont.) Characteristic Description Relative timestamp accuracy (Typical) ±100 ps + sample uncertainty + backplane 10 MHz clock jitter and tolerance This specification can be used to indicate the accuracy of a time measurement between samples. When measuring between samples, only the time difference between samples should be used to indicate accuracy.

  • Page 29: Table 13: Tla5000 Internal Controller

    Specifications Table 12: TLA5000B internal controller (cont.) Characteristic Description CD-DVD drive Standard PC compatible IDE (Integrated Device Electronics) CD-RW/DVD-R drive residing on an EIDE interface. Continually subject to change due to the fast-moving PC component environment. Floppy disk drive Standard 3.5 inch 1.44 MB PC compatible high-density, double-sided floppy disk drive on the USB bus Table 13: TLA5000 internal controller Characteristic...

  • Page 30: Table 15: Tla5000 Front-Panel Interface

    Specifications Table 14: TLA5000 display system (cont.) Characteristic Description Display modes Three displays can be driven independently, the LCD display and two external displays. The LCD display and one of the external displays are driven from the ATI RAGE Mobility M1 chip and are the primary displays;...

  • Page 31: Table 17: Tla5000 Ac Power Source

    Specifications Table 16: TLA5000 rear-panel interface (cont.) Characteristic Description Mouse Port PS/2 compatible mouse port utilizing a mini DIN connector Keyboard Port PS/2 compatible keyboard port utilizing a mini DIN connector Table 17: TLA5000 AC power source Characteristic Description Source Voltage and Frequency 100 V to 240 V ±10%, 47 Hz to 63 Hz...

  • Page 32: Figure 1: Dimensions Of The Tla5000 Series Logic Analyzer

    Specifications Figure 1: Dimensions of the TLA5000 series logic analyzer TLA5000 Series Product Specifications & Performance Verification...

  • Page 33: External Oscilloscope (Iview) Characteristics

    External Oscilloscope (iView) Characteristics The following table lists the characteristics for iView (Integrated View) and for the Tektronix logic analyzer when connected to an external oscilloscope. For detailed information on the individual specifications of the external oscilloscope, refer to the documentation that accompanies the oscilloscope.

  • Page 34: Table 21: Tds1000, Tds1000B, Tds2000, And Tds2000B Series Oscilloscope Waveform Edge

    External Oscilloscope (iView) Characteristics Table 20: External oscilloscope (Integrated View or iView) characteristics (cont.) Characteristic Description Time correlation uncertainty (Typical at system trigger) 3 ns Logic analyzer triggers external oscilloscope (2 ns + logic analyzer sample period + external oscilloscope sample period) 5 ns External oscilloscope triggers logic...

  • Page 35: Performance Verification Procedures

    Performance Verification Procedures This chapter contains procedures for functional verification, certification, and performance verification procedures for the TLA5000 and TLA5000B series logic analyzer mainframes. Generally, you should perform these procedures once per year or following repairs that affect certification. Summary Verification Functional verification procedures verify the basic functionality of the instrument inputs, outputs, and basic instrument actions.

  • Page 36: Test Equipment

    fixture Some timing generators (for example, the Tektronix DTG5274) include an internal DC voltage source that can be used instead of a separate power source. Only needed to verify the output of the voltage source if the source does not meet specification. In this case, the DMM becomes the traceable instrument.

  • Page 37: Functional Verification

    Performance Verification Procedures Functional Verification The following table lists functional verification procedures for the benchtop and portable mainframes. If necessary, refer to the TLA5000B Series Logic Analyzer Installation Manual for installation instructions. Table 23: Functional verification procedures Instrument Procedure TLA5000 Series logic analyzers Power-on and fan operation Power-up diagnostics Extended diagnostics...
  • Page 38 Performance Verification Procedures Extended Diagnostics Do the following steps to run the extended diagnostics: NOTE. Running the extended diagnostics will invalidate any acquired data. If you want to save any of the acquired data, do so before running the extended diagnostics.

  • Page 39: Performance Verification

    Performance Verification Procedures Performance Verification This section contains procedures to verify that the instrument performs as warranted. Verify instrument performance whenever the accuracy or function of your instrument is in question. Tests Performed Do the following tests to verify the performance of the TLA5000 Series logic analyzers.

  • Page 40: Checking The 10 Mhz System Clock (Clk10)

    Performance Verification Procedures Checking the 10 MHz System Clock (CLK10) The following procedure checks the accuracy of the 10 MHz system clock: Equipment required Frequency counter Precision BNC cable Prerequisites Warm-up time: 30 minutes 1. Verify that all of the prerequisites above are met for the procedure. 2.

  • Page 41: Threshold Accuracy

    Performance Verification Procedures Threshold Accuracy This procedure verifies the threshold voltage accuracy of the logic analyzer. Equipment required Precision voltage reference or a DC signal generator and precision digital voltmeter Threshold Accuracy test fixture Logic analyzer probe Prerequisites Warm-up time: 30 minutes Test Equipment Setup Connect a P6410, P6417, or P6418 probe from the logic analyzer to the voltage source, using the Threshold Accuracy test fixture.

  • Page 42: Figure 3: Setting Trigger Parameters

    Performance Verification Procedures 4. Go to the Trigger window and select the Power Trigger tab. Create a trigger program that triggers the logic analyzer when it doesn’t see all highs or all lows: a. Click the If Then button. b. Set the channel definition to match the figure below. Figure 3: Setting trigger parameters c.
  • Page 43 Performance Verification Procedures Verification Procedure Complete the following steps to complete this procedure. Record the results on the copy of the Calibration Data Sheet. 1. Go to the Setup window of the logic analyzer and set the probe threshold voltages to 4 V. 2.

  • Page 44: Setup And Hold

    Performance Verification Procedures Setup and Hold This procedure verifies the setup and hold specifications of the logic analyzer. Digital timing generator Equipment required Precision BNC cable Setup and Hold test fixture Prerequisites Warm-up time: 30 minutes Digital Timing Generator 1. Verify that the digital timing generator (DTG) has been calibrated so that the channel-to-channel skew is minimized.
  • Page 45 Performance Verification Procedures TLA5000 Setup 1. Start the TLA Application and open the Setup Window. 2. Click the DM button to default the module. 3. Set the following parameters: a. Clocking: External b. Acquire: Normal c. Acquisition Length: 1K or greater d.

  • Page 46: Figure 4: Set The Trigger States

    Performance Verification Procedures Figure 4: Set the trigger states TLA5000 Series Product Specifications & Performance Verification...
  • Page 47 Performance Verification Procedures Verification Procedure Complete the following steps to complete this procedure. Record the results on the Calibration Data Sheet. 1. Press the RUN button and wait a few seconds to verify that it doesn’t trigger. 2. Increase the delay of the DTG clock channel (starting from 0.000 ns), until triggering begins to occur.

  • Page 48: Test Fixtures

    Test Fixtures Test Fixtures This section includes information and procedures for building the test fixtures used in the performance verification tests. Threshold Accuracy Test Fixture Use this fixture to gain access to the logic analyzer probe pins. The fixture connects all ground pins together, and all signal pins together. Equipment Required You will need the following items to build the test fixture: Item...

  • Page 49: Setup And Hold Test Fixture

    Test Fixtures Setup and Hold Test Fixture This fixture provides square-pin test points for logic analyzer probes when they are used to probe in-line SMA connections. Note that you need a minimum of two test fixtures to complete the procedure. Equipment Required You will need the following items to build the test fixture: Item...

  • Page 50: Figure 7: Solder The Sma Connectors Together

    Test Fixtures 5. Align the second SMA connector to the first as shown and solder the center conductors of the connectors together. (See Figure 7.) Figure 7: Solder the SMA connectors together 7. Solder the ground conductors of the SMA connectors together. 8.

  • Page 51: Calibration Data Report

    Calibration Data Report Calibration Data Report Photocopy this table and use it to record the performance test results for your instrument. TLA5000 Series Instrument model number: Serial number: Certificate number: Verification performed by: Verification date: Test Data Characteristic Specification Tolerance Incoming data Outgoing data Clock frequency...

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