Related Manuals for Tektronix TLA5204B
Summarization of Contents
Preface
Key Features
Highlights the capabilities and benefits of Tektronix Logic Analyzers for design verification and debugging.
Documentation
Version Differences
Explains potential icon differences in the document due to software version variations.
Basic Setups
Installation Documentation
Guides users through initial setup, controls, and connectors for the instrument.
Connecting to a Network
Provides recommendations for secure network connection of the instrument.
Connecting Probes to the System Under Test
Details methods for attaching logic analyzer probes to the system under test.
Connecting to Your Instrument
Describes how to connect the logic analyzer application to the instrument (Local, Remote Host, Remote Desktop).
Local Connection
Explains how to establish a direct connection to work on the instrument itself.
Remote Host Connection
Details how to control the instrument remotely from a PC via a network connection.
Offline
Instructions for working with saved setups or data without a live instrument connection.
Remote Desktop
Steps to enable and use Remote Desktop for instrument control from a PC.
Navigating the Logic Analyzer Windows
Overview of different methods for navigating the instrument's windows and interface elements.
Toolbar Buttons
Explains how to use toolbar buttons for quick navigation between key operational windows.
System Window
Describes the System window's block diagram representation of modules and data windows.
Basic Steps for Using a Logic Analyzer
Summarizes the fundamental sequence for operating the logic analyzer for data acquisition and analysis.
Data Window Overview
Introduces various data windows used for displaying and analyzing acquired instrument data.
Getting Acquainted with Your Instrument
Set the Default System
Instructions for loading the factory default settings to prepare the instrument.
Configure the Setup Window
Details on setting up data signals, clocking, and probe threshold voltages for analysis.
Specify the Sampling Method
Explains asynchronous (timing) and synchronous (state) sampling methods and how to select them.
Set the Storage Options
Guides on specifying data acquisition length and how the acquisition data is stored.
Deskew the Probe Signals
Procedure for adjusting timing differences between probe signals for accurate measurements.
Create Groups
Explains how to logically group probe signals, often related to busses, for easier management.
Check Signal Activity
How to visually check signal status (high, low, transitioning) using indicators in the Setup window.
Define the Trigger Window
Instructions for setting up trigger conditions to control data acquisition based on specific events.
Define the Waveform Window
Steps for configuring the Waveform window to display acquired timing data.
Add Waveforms
Procedure for adding defined waveforms from the Setup window to the Waveform display.
Acquire Data
Steps for acquiring single or repetitive sequences of data after defining setups and connecting probes.
Making a Single Acquisition
Details on how to perform a one-time data acquisition and check its status.
Making Repetitive Acquisitions
Instructions for setting up continuous data acquisition cycles.
Using the Tabbed Trigger Window
Describes how to define trigger programs directly within the Tabbed Trigger window.
Analyzing Data
Zooming Data
How to magnify specific sections of waveform data in the Waveform window for detailed examination.
Measure Waveform Data using Cursors
Explains how to use cursors to measure time differences between signal edges in waveform data.
Using the Data Measurement Window
Guides on how to perform and view various measurements using the Data Measurement window.
View Acquired Data with MagniVu High-Resolution Timing
Details on displaying and analyzing high-resolution MagniVu timing data alongside deep timing data.
Managing Data
Saving Setups
Procedure for saving the current instrument configuration for future use.
Loading Setups
Instructions on how to load previously saved instrument configurations.
iView Integrated Measurements
Connecting the Logic Analyzer and the Oscilloscope
Steps to connect an external Tektronix oscilloscope to the logic analyzer for integrated measurements.
Acquiring the iView Data
Process for capturing initial data from both the logic analyzer and the oscilloscope for iView analysis.
Aligning the Oscilloscope Data with the Logic Analyzer Data
Method for fine-tuning the time alignment between oscilloscope and logic analyzer waveforms.
Specifications
Atmospheric characteristics
Details operating and non-operating environmental conditions like temperature, humidity, and altitude.
Product Features
Lists key product features, mainframe slots, memory depths, and channel counts for various models.
Warranted Specifications
Presents guaranteed performance specifications for parameters like threshold accuracy, skew, and sampling rates.
Mechanical characteristics
Provides dimensions and weights for different TLA5000B and TLA7000 series models.
Application Examples
Triggering on a Glitch
Demonstrates how to configure the logic analyzer to detect and trigger on transient signal glitches.
State Acquisition
Explains how to perform state data analysis using an external clock from the target system.
Triggering on a Setup & Hold Violation
Illustrates capturing and analyzing setup and hold violations using specific trigger settings.
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