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DIPIPM+ Series Application note
3.1.10 Power Life Cycles
When DIPIPM is in operation, repetitive temperature variation will happen on the IGBT junctions (ΔTj). The
amplitude and the times of the junction temperature variation affect the device lifetime.
Fig.3-1-20 shows the IGBT power cycle curve as a function of average junction temperature variation (ΔTj).
(The curve is a regression curve based on 3 points of ΔTj=46, 88, 98K with regarding to failure rate of 0.1%, 1%
and 10%. These data are obtained from the reliability test of intermittent conducting operation)
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Publication Date: September 2016
1%
0.1%
Average junction temperature variation ΔTj (K)
接合温度変化⊿Tj(K)
Fig.3-1-20 Power cycle curve
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