Agilent Technologies B1500A Training Manual page 47

Semiconductor device analyzer
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Test Record List Area
Results > Filter > Show Deleted Data
Flag Setup Name
...
...
*
Expand Application Test Results
The test result records are listed in the test record list area. The area also lists the following data.
•Append measurement data marked with ...
•Deleted data marked with * if Results > Filter > Show Deleted Data is checked
•Test name defined in the application test definition if Results > Filter > Expand Application Test
Results is checked
If Results > Filter > Show All Append Data is checked, all append data will be listed and the symbol
will be changed to A for the data obtained by the Append measurement or S for the data obtained by
the Single measurement.
Vth gmMax
#
ID-VD1
ID-VD1
Vth gmMax
!
ID-VD1
Flag Setup Name
...
#
Vth gmMax
...
#
Vth gmMax
...
ID-VD1
ID-VD1
!
Vth gmMax
!
Vth gmMax
*
ID-VD1
2-13
Flag Setup Name
A
Vth gmMax
#
A
#
Vth gmMax
S
?
Vth gmMax
S
?
Vth gmMax
A
ID-VD1
A
ID-VD1
S
ID-VD1
ID-VD1
!
Vth gmMax
!
Vth gmMax
*
ID-VD1
Show All Append Data
Module 2
Getting Started

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