Agilent Technologies B1500A Training Manual page 15

Semiconductor device analyzer
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Module 5. Basic Measurement
SMU Fundamentals
Classic Test Environment
SMUs Connected in Series or Parallel
Cabling and Fixture Issues
Kelvin and Driven Guard
Probes and Prober Connections
Triax and Coax Adapters
Safety Interlock Issues
Module 6. Low Current Measurement
Low-Current Measurement Challenges
Calibration and Zero Cancel
Effect of Cable Movement
ASU for Ultra Low-Current Measurement
Low-Current Subthreshold
Trade-Off Speed Vs Accuracy
Low-Current Gummel Plot
Low-Current Gate Oxide Leakage
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