Description Of Test Parameters - Extech Instruments 7630 Operation Manual

4.3.1 Description of Test Parameters

Voltage-HI: The maximum voltage allowable at the DUT Power Input Terminal that when
exceeded triggers a failure.
Voltage-LO: The minimum voltage allowable at the DUT Power Input Terminal that when not
exceeded triggers a failure.
Amp-HI: The maximum allowable current-flow through the DUT that when exceeded triggers
a failure.
Amp -LO: The minimum allowable current-flow through the DUT that when not exceeded
triggers a failure.
Dwell Time: A length of time that is allowed for all programmed parameters set to be applied.
Delay Time: A length of time needed to ensure the DUT has reached proper operating
conditions, during which the HI and LO limit detectors are disabled. The over current
judgment is activated at the end of the Delay Time. The instrument will not indicate that an
over current limit has been exceeded until the Delay Time period has expired.
Leakage-HI: The maximum leakage current allowable through the measuring device that
when exceeded triggers a failure.
Leakage-LO: The minimum leakage current allowable through the measuring device that
when not exceeded triggers a failure.
Power-HI: The maximum allowable power consumption by the DUT that when exceeded
triggers a failure.
Power-LO: The minimum allowable power consumption by the DUT that when not exceeded
triggers a failure.
PF-HI: The maximum allowable Power Factor that when exceeded triggers a failure.
PF-HI: The minimum allowable Power Factor that when not exceeded triggers a failure.
HI-Limit: A maximum threshold set point that when exceeded triggers a failure.
Offset: This function allows the instrument to compensate for leakage current during a touch
current test.
Scanner Setup: (This parameter will only be seen on units equipped with a scanner). This
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