Test conditions assume signal transition time of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
I
/I
and 100-pF load capacitance.
OL
OH
are specified with a load capacitance of 5 pF as in (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
8.
t
, t
, and t
HZOE
HZCE
HZWE
9.
At any given temperature and voltage condition, t
10. The internal write time of the memory is defined by the overlap of CE
and the transition of any of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates
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