Fluke TiX870 User Manual page 70

TiX870, TiX875, TiX880, TiX885,
TiX875U, TiX885U, TiX1060, TiX1080
Users Manual
Model
Temperature Measurement and Analysis
Temperature
Measurement Range
Extended temperature
range
Accuracy
High/low temperature
capture
Reference temperature
compensation
Automatic temperature
difference calculation
Temperature
measurement methods
Correction settings
Full-screen emissivity
correction
Area emissivity
correction
Analysis in the Imager
Analysis software
Supported languages
66
TiX1060 TiX1080 TiX870
-40 °C to 700 °C (-40 °C to 150 °C；0 °C to 350 °C；0 °C to 700 °C）
300°C to 2000°C
±1 °C or 1 % of rdg.,
whichever is greater
@
-10 °C to 150 °C；
±2 °C or ±2 %,
whichever is greater
@ other temperature
ranges
Yes. The full-screen and measurement mark temperature are displayed as the difference between the actual
Calculation of the difference between measurement markers or between a measurement marker and the fixed
The highest and lowest temperature can be set within an area, and the highest/lowest temperature point can
Emissivity, Reflected Temperature, Humidity, Ambient Temperature, Test Distance, Transmittance
Perform point, area, and line temperature analysis on saved images
TiX875 TiX880
1200 °C
±2 °C or ± 2 % of rdg., whichever is greater
Yes
temperature and the fixed temperature
TREF
be automatically located
0.01 to 1.00, built-in emissivity table
Yes
SmartView IR
Simplified Chinese/English
TiX885 TiX875U TiX885U
1200 °C