Hitachi Relion 670 Series Commissioning Manual page 238
Line distance protection
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Also See for Relion 670 Series:
- Applications manual (438 pages) ,
- Commissioning manual (242 pages) ,
- Product manual (192 pages)
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Section 11
Testing functionality by secondary injection
I E D T E S T S E T
ANSI10000013 V1 EN-US
Figure 55:
1.
Connect the test set for three-phase current injection to the appropriate IED terminals as shown in
Figure
2.
Increase the injected current and note the operated value (pickup value) of the studied step of the
function.
3.
Decrease the current slowly and note the reset value.
4.
Connect a trip output contact to a timer.
5.
Set the injected current to 200% of the operate level of the tested stage. Switch on the current and
check the time delay.
6.
Check that all trip and pickup contacts operate according to the configuration (signal matrices).
7.
Finally check that pickup and trip information is stored in the event memory.
Completing the test
Continue to test another function or end the test by changing the TESTMODE setting to Disabled.
Restore connections and settings to the original values, if changed for testing purposes.
11.11.7.8
Zero sequence overcurrent protection LCZSPTOC (51N)
Prepare the IED for verification of settings as outlined in section
for test"
in this chapter.
1.
Connect the test set for three-phase voltage injection (A, B, C) or residual voltage injection (N) to
the appropriate IED terminals. This is dependent on how the IED is fed from the CT.
2.
Increase the injected zero-sequence current and note the operated value (pickup value) of the
studied step of the function.
3.
Decrease the current slowly and note the reset value.
4.
Connect a trip output contact to a timer.
5.
Set the injected current to 200% of the operate level of the tested stage. Switch on the current and
check the time delay.
6.
Check that all trip and pickup contacts operate according to the configuration (signal matrices).
7.
Finally check that pickup and trip information is stored in the event memory.
232
IA
IB
IC
Connection of test equipment to the IED
55
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IA
IB
IC
IED
ANSI10000013-1-en.vsd
GUID-DF48CC20-7275-4543-84D1-0856A946520A v2
"Requirements"
and section
Line distance protection REL670
1MRK506371-UUS Rev. M
"Preparing
Commissioning manual
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