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Power Automation and Protection Division
4.4.1. Contact Input Test
The Contact Input module (Appen-
dix D) can be conveniently tested,
using the Contact Input Test Func-
tion.
To activate this function, continually
depress the DISPLAY key until the
"TEST" LED is illuminated. Then
depress the "FUNCTION RAISE' or
"FUNCTION LOWER" key until the
word "OPTI" appears in the FUNC-
TION field.
The "VALUE" field will display the
status of the contact inputs, using
two hexadecimal digits, as ex-
plained below.
When the contacts close (voltage is applied across two input terminals), the corresponding bit
is set to binary "1"; an open set of contacts results in a binary "0". The following correspondence
exists:
FUNCTION
Not used
Stub Bus
Not used
Target Reset
52b
Not Used
Not Used
Not Used
For Example:
The functions listed below,
• Target Reset
• 52b contact
• Remaining contacts
will result in the following binary pattern:
Bit Pattern
Bit Number
HEX "Value"
Field Display
For reference, refer to Table 4-2 for the binary-to-hexadecimal conversion.
REL 352 Version 1.00
Table 4-1:
Test Mode Functions
Functi
on
STAT
Relay Self-Check Status
TEST
Phase comparison TEST ENABLE Signal
TLDT
Test Mode Computation of Local Delay Time
Monitor Standing Relay Trip Signal
SRT
OPTI
Display Opto Input Status
TRIP
Relay Test:Trip Relays
BFI
Relay Test:BFI Relays
SRI
Relay Test:SRI Relay (RI1)
3RI
Relay Test:3RI Relay (RI2)
R B
Relay Test:Reclose Block Relay
GS
Relay Test:General Start Relay
FALM
Relay Test:Failure Alarm Relay
TALM
Relay Test:Trip Alarm Relay
CALM
Relay Test:Channel Alarm Relay
BIT NUMBER
0
1
2
3
4
5
6
7
(closed)
(closed)
(open)
0 0 0 1
1 0 0 0
7 6 5 4
3 2 1 0
1
8
I.L. 40-201.9
Description
4-5
4
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