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This user's guide describes the characteristics, operation, and use of the TPD1E05U06-Q1 EVM
evaluation module (EVM). This EVM includes six TPD1E05U06-Q1s in various configurations for testing.
Five TPD1E05U06-Q1s are configured for IEC 61000-4-2 compliance testing and one is configured for 2-
port s-parameter analysis. This user's guide includes setup instructions, schematic diagrams, a bill of
materials, and printed-circuit board layout drawings for the evaluation module.
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3.1
IEC 61000-4-2 ESD Rating Tests
3.2
3.3
±8-kV ESD Clamping Waveforms
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Board Layout
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Schematic
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Bill of Materials
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Ideal Contact Discharge Waveform of the Output Current of the ESD Simulator at 8-kV
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IEC 61000-4-2 Test Levels
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Waveform Parameters in Contact Discharge Mode
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SLVUAT8 - July 2016
Submit Documentation Feedback
TPD1E05U06-Q1 Evaluation Module
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Copyright © 2016, Texas Instruments Incorporated
Contents
List of Figures
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List of Tables
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TPD1E05U06-Q1 Evaluation Module
User's Guide
SLVUAT8 - July 2016
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Summary of Contents for Texas Instruments TPD E05U06-Q1 Series
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Page 1: Table Of Contents
TPD1E05U06-Q1EVM Top Layer and Silkscreen ..................TPD1E05U06-Q1EVM Schematic List of Tables ....................IEC 61000-4-2 Test Levels ..............Waveform Parameters in Contact Discharge Mode ....................... Bill of Materials SLVUAT8 – July 2016 TPD1E05U06-Q1 Evaluation Module Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated... -
Page 2: Introduction
Stress Level Step Simulator Voltage Ipeak ±15% [A] Rise Time ±25% Current at 30 ns Current at 60 ns [kV] [nS] ±30% [A] ±30% [A] 22.5 TPD1E05U06-Q1 Evaluation Module SLVUAT8 – July 2016 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated... -
Page 3: Setup
While the simulator is in direct contact with the test point during contact, it is not during air-gap. SLVUAT8 – July 2016 TPD1E05U06-Q1 Evaluation Module Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated... -
Page 4: Scattering Parameters
ESD strike. Caution must be taken when capturing clamping waveforms during an ESD event so as not to damage the oscilloscope. The procedures in Section 3.3.1 outline a proper method. TPD1E05U06-Q1 Evaluation Module SLVUAT8 – July 2016 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated... - Page 5 Recommended settings for the time axis is 20 ns/div and for the voltage axis is 10 V division. The voltage levels of the ESD applied to J1.Pin1 should not exceed ±8 kV while capturing clamping waveforms. SLVUAT8 – July 2016 TPD1E05U06-Q1 Evaluation Module Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated...
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Page 6: Tpd1E05U06-Q1Evm Top Layer And Silkscreen
FR408HR at 0.062 inch thickness. Layers 2, 3, and 4 are ground planes and not shown here. Figure 3. TPD1E05U06-Q1EVM Top Layer and Silkscreen Schematic Figure 4. TPD1E05U06-Q1EVM Schematic TPD1E05U06-Q1 Evaluation Module SLVUAT8 – July 2016 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated... -
Page 7: Bill Of Materials
J1, J2 Connector, TH, End launch Connector, TH, 142-0761-881 Johnson SMA 50 Ω End launch SMA Standard Banana Jack, 6092 6092 Keystone Insulated, Black SLVUAT8 – July 2016 TPD1E05U06-Q1 Evaluation Module Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated... - Page 8 STANDARD TERMS AND CONDITIONS FOR EVALUATION MODULES Delivery: TI delivers TI evaluation boards, kits, or modules, including any accompanying demonstration software, components, or documentation (collectively, an “EVM” or “EVMs”) to the User (“User”) in accordance with the terms and conditions set forth herein. Acceptance of the EVM is expressly subject to the following terms and conditions.
- Page 9 FCC Interference Statement for Class B EVM devices NOTE: This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation.
- Page 10 【無線電波を送信する製品の開発キットをお使いになる際の注意事項】 開発キットの中には技術基準適合証明を受けて いないものがあります。 技術適合証明を受けていないもののご使用に際しては、電波法遵守のため、以下のいずれかの 措置を取っていただく必要がありますのでご注意ください。 1. 電波法施行規則第6条第1項第1号に基づく平成18年3月28日総務省告示第173号で定められた電波暗室等の試験設備でご使用 いただく。 2. 実験局の免許を取得後ご使用いただく。 3. 技術基準適合証明を取得後ご使用いただく。 なお、本製品は、上記の「ご使用にあたっての注意」を譲渡先、移転先に通知しない限り、譲渡、移転できないものとします。 上記を遵守頂けない場合は、電波法の罰則が適用される可能性があることをご留意ください。 日本テキサス・イ ンスツルメンツ株式会社 東京都新宿区西新宿６丁目２４番１号 西新宿三井ビル 3.3.3 Notice for EVMs for Power Line Communication: Please see http://www.tij.co.jp/lsds/ti_ja/general/eStore/notice_02.page 電力線搬送波通信についての開発キットをお使いになる際の注意事項については、次のところをご覧くださ い。http://www.tij.co.jp/lsds/ti_ja/general/eStore/notice_02.page SPACER EVM Use Restrictions and Warnings: 4.1 EVMS ARE NOT FOR USE IN FUNCTIONAL SAFETY AND/OR SAFETY CRITICAL EVALUATIONS, INCLUDING BUT NOT LIMITED TO EVALUATIONS OF LIFE SUPPORT APPLICATIONS.
- Page 11 Notwithstanding the foregoing, any judgment may be enforced in any United States or foreign court, and TI may seek injunctive relief in any United States or foreign court. Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2015, Texas Instruments Incorporated...
- Page 12 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue.