Stanford Research Systems SR860 Operation Manual page 215

Dsp lock-in amplifier
Table of Contents

Advertisement

SR860 Performance Test Record
Serial Number _____________________
Firmware Revision
Equipment Used
dc Offset
Input Coupling
AC
DC
Common Mode Rejection
Frequency
1 kHz
Sine Output Amplitude and Flatness
Sine Output Ampl.
Sine Ampl.
100 mV
Note the readings recorded as (
Amplitude Accuracy and Flatness, and Amplitude Linearity, both of which are on the next page.
Test Record sheet 1 of 4
_________________
__________________________________________________
__________________________________________________
__________________________________________________
__________________________________________________
__________________________________________________
Reading
_______
_______
Reading
_______
1.00 V
300 mV
100 mV
30 mV
10.0 mV
1.00 mV
Frequency
10 kHz
100 kHz
500 kHz
) through (
) will be used to determine lower and upper limits for the
A
J
Performance Test Record
Tested By __________________________
Date ______________________________
Upper Limit
0.500 mV
0.500 mV
Upper Limit
30 µV
Lower Limit
Reading
0.490 V
(
)_______
A
147.0 mV (
)_______ 153.0 mV
B
49.0 mV
(
)_______
C
14.70 mV (
)_______ 15.30 mV
D
4.98 mV
(
)_______
E
0.490 mV (
)_______ 0.510 mV
F
Lower Limit
Reading
49.0 mV
(
)_______
G
49.0 mV
(
)_______
H
49.0 mV
(
)_______
J
SR860 DSP Lock-in Amplifier
197
Upper Limit
0.5100 V
51.0 mV
5.10 mV
Upper Limit
51.0 mV
51.0 mV
51.0 mV

Advertisement

Table of Contents
loading

Table of Contents