Table 22 - Minimum Et Diagnostics - Honeywell ST 700 User Manual

Time Since Method
Last ET Up
Min ET Limit Parameter
ET Lower Limit
for Stress
Condition
Min ET Value Parameter
Time Below Parameter
Lower Stress
Limit
Time Since Method
Last ET Down
Page 80
Description
Set-up
NVM
Table 22 – Minimum ET Diagnostics
Description
Set-up
Description
Example
Set-up
Description
Set-up
NVM
Description
Set-up
NVM
Description
Set-up
NVM
ST 700 Series HART/DE Option User's Manual
Time that has passed since the last time
device's Electronics Temperature has
passed above the value of "ET Upper
Stress Limit" (in days, hours and minutes).
None.
Backup once each 8 hour period
Electronics Temperature (ET) lower
operating limit from specification.
Units are same degree units as has been
selected for SV (Secondary Variable).
None.
Actual limit used in "Time Below Limit" and
"Time Since Last Event". Value is equal to
"Min ET Limit" plus 10% of limits range.
Electronics Temperature range is -40C to
85C for a total of 125C.
ET Lower Stress Limit= -40C + 10% of
125C = -27.5C.
None: calculation is automatic.
Lowest Electronics Temperature ever
experienced by the device.
Units are same degree units as has been
selected for SV (Secondary Variable).
None.
Update every 8 hour.
Accumulation of minutes that device's
Electronics Temperature has been below
the value of "ET Lower Stress Limit".
None.
Backup once each 8 hour period
Time that has passed since the last time
device's Electronics Temperature has
passed below the value of "ET Lower Stress
Limit" (in days, hours, and minutes).
None.
Backup once each 8 hour period
Revision 4.0