Glossary - Omron F400 - 06-1999 Operation Manual

Colorgray Filter
It is possible to create a filter for the object to be detected. The hue and saturation for
the object to be detected are set. Refer to Introduction Manual (Z131) for details.
Surface Defect
One of the measurement methods used by the F400. Surface defect measurements
detect uneven or damaged areas caused by uneven density.
1. Small boxes are created inside the measurement region. These boxes are called
Element
2. The density of each element is compared with that of the element on its left and
Comparison with element to the left
3. The defects are calculated for all of the elements. The measurement region is
Note Measurements are performed using differences in density. If there are marks, pat-
terns, or letters in the measurement region, these will be detected as defects and the
measurement will be incorrect. Use the Search Method for measurements when
inspecting measurement regions with marks, patterns, or letters. The image is
compared with a model to determine the degree of conformity called the "correlation."
Calibration
Images are made up of many points, with each point having its own density. These
points, which are the smallest units that make up an image, are called "pixels." The
F400 obtains measurements from the density of the pixels. "Calibration" is used to
convert the measurement results in pixels to actual dimensions. To perform calibra-
tion, the relationship between actual coordinates and camera coordinates (e.g., coor-
dinate system, position of origin, magnification, etc.) must be set.
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elements, and the density is calculated for each element.
The size of the boxes and the space between
them can be changed from the menus.
the element above. The larger of these two differences is the "defect" of that ele-
ment.
Element
A
judged to have a defect if the largest defect is greater than the evaluation criteria.
Several samples should be taken to determine a suitable judgement criteria.

Glossary

Comparison with element above
The larger of these differences
is the "defect" of element A.
Measurement region