Characteristics For The Digital I/O Pins; Test Switch; Table 30: Digital I/O Characteristics - Alcatel MTK-40131 Datasheet And User Manual

Characteristics for the Digi-
tal I/O pins
CODSP, plus TST, PU, BR, RNG of
SHLIC

Table 30: Digital I/O Characteristics

Symbol Parameter
Vil Low level input voltage
Vih High level input voltage
Iil Low level input current
(except PU, see below RPD)
Iih High level input current
(except PU, see below RPD)
Cinp (*) Input capacitance
RPD Pull down resistance at pin PU
VOL output level PU pin, driven low
VIL Low-level input voltage, CODSP
VIH High-level input voltage, CODSP
VOL Low-level output voltage, CODSP
VOH High-level output voltage, CODSP
CIN Input pin capacitance, CODSP
COUT Load capacitance, CODSP

Test Switch

The internal test switch is between the
pins SB and SSB. Connecting an exter-
nal load between SSB and SA allows
test of the transmission characteristics in
(simulated) off- and on hook conditions.
The typical on-resistance of the test
switch is around 75 ohms, and has to
be taken into account when defining the
external load. The test switch is on
when RNG=0, PU=1, TST=1, BR=0
Test Conditions Limits
Min.
0.7*V3VD
VDD = 5.25 V -1
VDD = 5.25 V -1
18
Overtemperature OT
activated, Ipu=0.2mA,
Tested at high temp.
only.
0.8*V3VD
0.8*V3VD
34
MTK-40131
Typ. Max.
0.3*V3VD V
+1
+1
7
30 40
0.5
0.2*V3VD 3V3D
0.4
1
100
Unit
V
µA
µA
pF
kohm
V
3V3D
V
3V3D
pF
pF