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The controller does not report an UNIT ATTENTION condition by AEN after
power-on or reset sequence.
The EAENP (Error AEN Permission) bit of 0 indicates that the controller shall not
report it by AEN when a deferred error is detected. The EAENP bit of 1 indicates
that such a report is permissible.
The controller does not report a Deferred Error by AEN.
The Read AEN Holdoff Period specifies the minimum delay time in milliseconds
(ms) from the controller initiated a power-on or reset sequence till issuing a report
by AEN.
The controller does not support Ready AEN Holdoff Period specification.
The Busy Timeout Period field specifies the maximum time, in 100 milliseconds
increments, that the initiator allows for the target to remain busy for
unanticipated conditions which are not a routine part of commands from the
initiator. A 0000
in this field is defined as an unlimited period.
The Extended Self-Test Completion Time field contains advisory data that an
application client may use to determine the time in seconds that the device server
requires to complete an extended self-test when the device server is not
interrupted by subsequent commands and no errors occur during excecution of the
self-test. The application client should expect this time to increase significantly if
other commands are sent to the logical unit while a self-test is in progress or it
errors occur during excecution of the self-test. Device servers supporting Self-Test
Code field values other than (000)b for the SEND DIAGNOSTIC command(see
5.29), shall support the Extended Self-Test Completion Time field.
[ Mode Page C
Bit
Byte
0
Reserved
1
2
ND
MODE SELECT:(15h)
5 COMMAND DESCRIPTIONS
value in this field is undefined by this standard. An FFFF
H
]
H
Table 5.49 Notch and Partition Page (Page Code = C
7
6
5
SPF
0
0
0
0
0
0
LPN
1
0
4
3
Page Code(0C
0
1
Page Length(16
)
H
1
0
Reserved
0
0
OEM MANUAL:K6602924
H
)
H
2
1
0
)
H
1
0
0
1
1
0
0
0
0
(cont'd)
Revision: 1 / Date: 2003.03.06
Page: 145 / 273
value
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