Figure 104 Selective Self-Test Test Span Example - Hitachi HTS541616J9AT00 - Travelstar 160 GB Hard Drive Specifications

2.5 inch ata/ide hard disk drive
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definition with three test spans defined. In this example, the test terminates when all three test spans have been
scanned.

Figure 104 Selective self-test test span example

After the scan of the selected spans described above, a user may wish to have the rest of media read
scanned as an off-line scan. In this case, the user shall set the flag to enable off-line scan in addition to
the other settings. If an error occurs during the scanning of the test spans, the error is reported in the
self-test execution status in the SMART READ DATA response and the off-line scan is not executed.
When the test spans defined have been scanned, the device shall then set the offline scan pending and
active flags in the Selective self-test log to one, the span under test to a value greater than five, the
self-test execution status in the SMART READ DATA response to 00h, set a value of 03h in the off-line
data collection status in the SMART READ DATA response and shall proceed to do an off-line read scan
through all areas not included in the test spans. This off-line read scan shall completed as rapidly as
possible, no pauses between block reads, and any errors encountered shall not be reported to the host.
Instead error locations may be logged for future reallocation. If the device is powered-down before the
off-line scan is completed, the off-line scan shall resume when the device is again powered up. From
power-up, the resumption of the scan shall
be delayed the time indicated in the Selective self-test pending time field in the Selective self-test log.
During this delay time the pending flag shall be set to one and the active flag shall be set to zero in the
Selective self-test log. Once the time expires, the active flag shall be set to one, and the off-line scan shall
resume. When the entire media has been scanned, the off-line scan shall terminate, both the pending and
active flags shall be cleared to zero, and the off-line data collection status in the SMART READ DATA
response shall be set to 02h indicating completion.
During execution of the Selective self-test, the self-test executions time byte in the Device SMART Data
Structure may be updated but the accuracy may not be exact because of the nature of the test span
segments. For this reason, the time to complete off-line testing and the self-test polling times are not
valid. Progress through the test spans is indicated in the selective self-test log.
A hardware or software reset shall abort the Selective self-test except when the pending bit is set to one
in the Selective self-test log (see 7.39.7). The receipt of a SMART EXECUTE OFF-LINE IMMEDIATE
command with 0Fh, Abort off-line test routine, in the LBA Low register shall abort Selective self-test
regardless of where the device is in the execution of the command. If a second self-test is issued while a
selective self-test is in progress, the selective self-test is aborted and the newly requested self-test is
executed.
14.39.1.6 S.M.A.R.T. Read Log Sector (Subcommand D5h)
This command returns the specified log sector contents to the host.
The 512 bytes data are returned at a command and the Sector Count value shall be set to one. The LBA Low shall be
set to specify the log sector address.
Log sector address
00h
Travelstar 5K160 (PATA) Hard Disk Drive Specification
Content
Log Directory
154 / 188
Type
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