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Texas Instruments TSW140 Series User Manual

Texas Instruments TSW140 Series User Manual

High speed data capture/pattern generator card

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TSW140x High Speed Data Capture/Pattern Generator
The Texas Instruments TSW1400 Evaluation Module (EVM) is a next generation of pattern generator and
data capture card used to evaluate performances of a wide range of Texas Instruments (TI) high-speed
analog-to-digital converters (ADC) and digital-to-analog converters (DAC). For an ADC, capturing the
sampled data over an LVDS interface when using a high-quality, low-jitter clock, and a high-quality input
frequency, the TSW1400 can be used to demonstrate data sheet performance specifications. Together
with the accompanying Labview based Graphic User Interface (GUI), it is a complete system that captures
and evaluates data samples from ADC EVM's and generates and sends desired test patterns to DAC
EVM's
The TSW1405 is a low cost data capture card with limited capabilities as compared with the TSW1400.
The TSW1405 supports pattern capture for most LVDS format TI ADC EVMs, but with a capture buffer
limitation of 64K samples. The TSW1405 draws its power from the USB connection to the PC for easy
setup and operation. The same TSW1400 Graphical User Interface supports the TSW1405 as well,
making for a consistent feel across the different platforms.
The TSW1406 is a low cost pattern generator card with limited capabilities as compared with the
TSW1400. The TSW1406 supports pattern generation for most LVDS format TI DAC EVMs, but with a
pattern limitation of 64K samples. The TSW1406 draws its power from the USB connection to the PC for
easy setup and operation. The same TSW1400 GUI supports the TSW1406 as well.
TSW1400
TSW1405
TSW1406
1
Functionality
1.1
ADC EVM Data Capture
1.2
DAC EVM Pattern Generator
2
Hardware Configuration
2.1
Power Connections
2.2
Switches, Jumpers and Fuses
2.3
LED's
2.4
Connectors
3
Software Start up
3.1
Installation Instructions
3.2
USB Interface and Drivers
3.3
Device ini Files
4
User Interface
4.1
Toolbar
4.2
Status Windows
All trademarks are the property of their respective owners.
SLWU079 – February 2012
Submit Documentation Feedback
Table 1. TSW140x EVM Features
I/O Interface
LVDS
CMOS
Future
Yes
Firmware
Release
Yes
No
Yes
No
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Copyright © 2012, Texas Instruments Incorporated
JESD
16 Bit Memory Depth
Future
Firmware
512M
Release
No
64K
No
64K
Contents
TSW140x High Speed Data Capture/Pattern Generator Card
User's Guide
SLWU079 – February 2012
Card
Data Capture
Data Source
Yes
Yes
Yes
No
No
Yes
10
10
11
14
3
4
4
4
5
5
6
6
7
7
8
1

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Summary of Contents for Texas Instruments TSW140 Series

  • Page 1 The Texas Instruments TSW1400 Evaluation Module (EVM) is a next generation of pattern generator and data capture card used to evaluate performances of a wide range of Texas Instruments (TI) high-speed analog-to-digital converters (ADC) and digital-to-analog converters (DAC). For an ADC, capturing the sampled data over an LVDS interface when using a high-quality, low-jitter clock, and a high-quality input frequency, the TSW1400 can be used to demonstrate data sheet performance specifications.
  • Page 2 TSW1400 EVM Interfacing to a DAC EVM ................TSW1400EVM GUI DAC Mode Top Level ......................DAC Selection ................... TSW1400 Output Data to DAC EVM SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 3 (FIRMWARE) Data and Clock Signals Interface Pattern and Data Clock SERIAL DAC LVDS INTERFACE PORT Figure 1. TSW1400EVM Block Diagram SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 4 If the DAC EVM supports a CMOS single-ended format, then the TSW3100 system is intended to be used. Hardware Configuration In this section, the various portions of the TSW1400EVM hardware are described. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 5 Fuse F2, when installed, will provide 6VDC to the DAC EVM interface connector J4. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 6 The ADC EVM has shorter standoff posts so that the TSW1400EVM and ADC EVM will lay flat on a bench or table and stay snapped together during use. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 7 HighSpeed Data Converter Pro GUI software. • Follow the on-screen instructions during installation. • Once installed, the GUI executable will reside in the following directory. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 8 Software Start up www.ti.com • C:\Program Files\Texas Instruments\High Speed Data Converter Pro. • Connect one end of a mini-USB cable to J5 (top right corner) of the TSW1400 and the other end to a host PC USB port. NOTE: Launch and connect the TSW1400 GUI to the EVM before starting older TI HSDC GUI’s.
  • Page 9 Device Manager. If the drivers are present in the Device Manager window and the software still does not connect, cycle power to the board and repeat the steps above. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 10 TSW1400 software controls are available from the main screen, such as “ADC or DAC” mode, “Select device”, “Capture and Test Selection” (ADC mode only), and “Load File to transfer to TSW1400” (DAC mode only). SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 11 EVM to communicate properly with the TSW1400EVM. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 12 Cursor Locks, an option to display 2 channels, and a dBFs/dBc display option as shown in Figure Figure 10. Test Options SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 13 ADC is under test. To remove the second channel display and go back to a single channel display, click on this option again to remove the selected check mark. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 14 IDLE message. A new window will also open in the middle of the screen describing what the GUI is currently doing. An example showing these status windows during a firmware load is shown in Figure SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 15 If the GUI is in ADC mode, clicking on the drop down arrow will display the ADC options available, as shown in Figure 16. If in DAC mode, the list will display available DAC’s. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 16 Two tone mode sets up cursors and displays results normally used with this type of testing. ACPR is currently not supported with this release. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 17 FFT presumes the sample of the input is part of a continuous input signal. If the input and sampling frequency is not coherent, and the sampled SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 18 (sometimes called coherent frequency). Figure 20. Data Windowing Options SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 19 M1, M2, Delta – Displays the power level of the location of markers M1 and M2. These markers can be moved around on the spectrum with the mouse. The Delta parameter displays the power difference between M2 and M1. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 20 The ACPR option, when selected, will display the Adjacent Channel power of the captured data. This function is currently not supported. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 21 4096 to 512M (single column) in increments of 32. The GUI comes with several example test files that can be found under the following directory: C:\Program Files\Texas Instruments\High Speed Data Converter Pro\TSW1400 Details\Testfiles. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 22 TSW1400 to a DAC EVM under test. This pattern is a looping test pattern that constantly runs until the send button is clicked on again. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 23 Start up the TSW1400 GUI as described in the Software Start Up section. • The TSW1400 EVM connected to an ADS5281 EVM is shown in Figure 24 SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 24 • Click on the “Capture” button to perform a data capture. The results should like similar to those shown Figure SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 25 26. If the user does not power down the TSW1400, any one of the devices with a black diamond can be tested without doing another firmware load. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 26 USB cable between the host PC and EVM. Failure to do this can cause a blue screen reboot to occur on the host PC. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 27 GUI is selected. After clicking on “DAC”, the top level GUI shall look as shown in Figure SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 28 NOTE: If the TSW1400 is not receiving a valid clock from the DAC evm, USER_LED3 and USER_LED4 will be off. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 29 To shut down the GUI, click on the “File” tab in the upper right corner of the GUI and select “Exit” in the pop up window that opens. This will specify that the USB ports are released by the software. SLWU079 – February 2012 TSW140x High Speed Data Capture/Pattern Generator Card Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
  • Page 30 Any exceptions to this is strictly prohibited and unauthorized by Texas Instruments unless user has obtained appropriate experimental/development licenses from local regulatory authorities, which is responsibility of user including its acceptable authorization.
  • Page 31 REGULATORY COMPLIANCE INFORMATION (continued) FCC Interference Statement for Class B EVM devices This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications.
  • Page 32 Japan with respect to this product. Also, please do not transfer this product, unless you give the same notice above to the transferee. Please note that if you could not follow the instructions above, you will be subject to penalties of Radio Law of Japan. Texas Instruments Japan Limited (address) 24-1, Nishi-Shinjuku 6 chome, Shinjukku-ku, Tokyo, Japan http://www.tij.co.jp 【ご使用にあたっての注】...
  • Page 33 FDA Class III or similar classification, then you must specifically notify TI of such intent and enter into a separate Assurance and Indemnity Agreement. Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2012, Texas Instruments Incorporated...
  • Page 34 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete.

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