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Table 4-1. Self -Test LEOs and Subtest Descriptions
Maintenance
CODE
LED
INDICATION
HEX
NO.
H
I J K L M N
*
SUBTEST
DESCRIPTION
1
0 0
0
0
0 0 1 1
Z-80
Inst ruct ion set
2
0 0
0
0 0 1 0 1
EPROM
Checksum
3
0
0 0
0 0 1 1 1
Station Add ress PROM
Checksum
4
0
0
0
0 1 0 0
1 High Byte Latch
5
0
0 0
0 1
0 1 1 Byte RAM Data
Even add resses
6
0 0
0
0 1 1 0
1 Byte RAM Data
Odd addresses
7
0 0
0
0 1 1
1 1 Byte RAM Address
Inc rement ing addresses
8
0 0
0 1
0
0 0 1 Byte RAM Address
Dec rement ing addresses
9
0 0 0
1 0 0 1 1 Word RAM
Address tests
A 0 0
0 1
0 1 0
1 Word/Byte Address
Add ress mapping
B
0 0
0 1
0 1 1
1
Z-80
Memory reference ins t ru c t ion s
C
0 0
0 1 1 0
0
1 MDIAG registe r
Proper state 'after reset
SYSCON register
D
0 0 0
1 1 0 1 1 CTC
Data test
E
0 0 0
1 1 1
0
1 CTC
Mode 0 counting
F
0 0 0
1 1 1 1 1 CTC
Mode 2 counting
10
0 0 1 0
0
0 0
1 CTC
Mode
4
counting
11
0 0 1 0 0 0
1 1 Interrupt PAL
Bit 4 set and cleared
12
0 0 1 0 0 1 0
1
Z-80
interrupt
e
13
0 0 1 0
0 1 1 1
Z-80
NMI
Non-Maskable Interrupt
14
0
0 1
0
1
0
0 1 MHSDIS
DMA Handshake Disabled
Feb 85
4-5
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