Test Parameters Setup Procedures; Test Parameters - Extech Instruments 7470 Operation Manual

5. Test Parameters Setup Procedures

5.1. Test Parameters

Description of Test Parameters
Voltage: The Voltage that is applied to the High Voltage and Return terminals or the
Current and Return terminals during a test.
HI-Limit: A maximum current or resistance threshold that when exceeded triggers a
failure.
LO-Limit: A minimum current or resistance threshold that when not exceeded triggers a
failure.
Ramp-UP: A length of time that is allowed for the test voltage to climb from 0 to the
voltage set point.
Dwell Unit: Allows for the selection of seconds or minutes as the Dwell timers base
unit.
Dwell: A length of time that is allowed for the set point voltage to be applied.
Ramp-DOWN: A length of time that is allowed for the test voltage to decay from set
point to zero.
Arc Detect: This function when turned on activates the Arc Detection threshold
controlled by the Arc Sense parameter.
Arc Sense: The numbers corresponding to the different arc sensitivity levels are 1
through 9, 1 meaning the maximum threshold of allowable arcing, 9 meaning the
minimum threshold of allowable arcing. During Hipot testing, some low current arcing
may be allowable. Arc sense is a maximum allowable threshold for arcing.
Frequency: This parameter is available in AC tests only and is selectable using the
settings menu between 50 and 60Hz.
Connect: This function when turned ON will connect or link the current memory to the
next memory. This function allows all 50-memory locations to be connected together.
Ramp-HI: Ramp-HI will allow current higher than the normal HI-Limit current setting of
the DC Withstand Voltage test, during the Ramp-Up time, to avoid false failure due to
charging current. Ramp-HI may be selected ON or OFF using a softkey. A
description of how to set up this parameter is given in the 5.2.11 Ramp-Hi selection
section of this manual.
Charge–LO: The Charge-LO function is used to check if the cables are connected
properly at the beginning of a test. This function is only available in DC Withstand and
Insulation resistance testing. A description of how to set up this parameter is given in
the 5.2.10 Charge-Lo setting section of this manual.
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