HP 4262A Operating And Service Manual page 42

Junction Capacitance Measurement
FO OC BAS Cannector
Setup-
Procedure -
SELF TEST scaun eaaa ea E rei OFF
CIRCUIT MODE. 4.208 254044 AUTO
PUNCTION unserer C
LER RANGE 22.02 AUTO
LOSS) ia oe oe be ee are D
DO RANGE -ooro tie aana ae Re AUTO
TEST SIGNAL 222,222. 1a es ae es 1kHz
TRIGGER: 22.222.350 unsere INT
2. Press TEST SIGNAL LOW LEVEL and PRL CIRCUIT MODE buttons. The test signal
level is now 50mV and the parallel equivalent circuit mode is selected.
Note
A semiconductor junction capacitance meas-
urement must be made with a low level test
signal. If desired, TEST SIGNAL fequency may
be set to 10kHz.
3. Adjust C ZERO ADJ control for zero counts on LCR DISPLAY.
Note
If necessary, apply DC bias voltage internally
or externally at rear panel EXT DC BIAS con-
nector. External DC bias source should be
stable with low noise. Set DC BIAS switch in
EXT position during application of external DC
bias.
"Figure 3-8. Semiconductor Device Measurement (Sheet 1 of 2).