Basic Test Procedure; Test Block Diagram; Dac3282 Gui Front Panel - Texas Instruments DAC3282 User Manual

Basic Test Procedure

3 Basic Test Procedure
This section outlines the basic test procedure for testing the EVM.
3.1

Test Block Diagram

The test setup for general testing of the DAC328x with the TSW3100 pattern generation card is shown in
Figure 3.
4
DAC3282
Figure 2. DAC3282 GUI Front Panel
Copyright © 2010, Texas Instruments Incorporated
SLAU304C – February 2010 – Revised November 2010
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