Keithley 7077 Instruction Manual page 10

8x12 isolated coaxial matrix card
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2
Operation
Figure 2-1
Model 7077 simplified schematic and crosspoint assignments ................................................................... 2-2
Figure 2-2
Simplified component layout ....................................................................................................................... 2-3
Figure 2-3
Single-ended switching example (using 4801 coaxial cable) ...................................................................... 2-4
Figure 2-4
Differential switching example .................................................................................................................... 2-4
Figure 2-5
Sensing example .......................................................................................................................................... 2-4
Figure 2-6
BNC connector identification ...................................................................................................................... 2-5
Figure 2-7
Backplane jumper configuration (factory default)....................................................................................... 2-7
Figure 2-8
Model 707 backplane configured for row expansion................................................................................... 2-7
Narrow matrix expansion (8 × 36) ............................................................................................................... 2-8
Figure 2-9
Wide matrix expansion (16 × 12)................................................................................................................. 2-9
Figure 2-10
Partial matrix example (16 × 24) ................................................................................................................. 2-9
Figure 2-11
Figure 2-12
Single card example ................................................................................................................................... 2-11
Figure 2-13
Multiple card system example ................................................................................................................... 2-12
Figure 2-14
Multiple switching matrix example – Model 707 ...................................................................................... 2-14
Figure 2-15
Multiple switching matrix example – Model 708 ...................................................................................... 2-15
Figure 2-16
Matrix/multiplexer system ......................................................................................................................... 2-16
3
Applications
Figure 3-1
Thick film resistor network testing .............................................................................................................. 3-2
Four-terminal Ω measurement ..................................................................................................................... 3-2
Figure 3-2
Figure 3-3
Voltage divider checks................................................................................................................................. 3-4
Figure 3-4
Transistor checking ...................................................................................................................................... 3-5
Figure 3-5
Transistor current gain checks ..................................................................................................................... 3-6
Figure 3-6
Common emitter characteristics of an NPN silicon transistor ..................................................................... 3-7
Figure 3-7
Transistor I
Figure 3-8
Transistor V
4
Service Information
Figure 4-1
Matrix card installation ................................................................................................................................ 4-3
Figure 4-2
Path resistance testing .................................................................................................................................. 4-6
Figure 4-3
Common mode offset current testing........................................................................................................... 4-7
Figure 4-4
Differential offset current testing ................................................................................................................. 4-7
Figure 4-5
Path isolation testing (guarded).................................................................................................................... 4-9
Figure 4-6
Differential isolation testing....................................................................................................................... 4-11
Figure 4-7
Common mode isolation testing ................................................................................................................ 4-11
Figure 4-8
ID data timing diagram .............................................................................................................................. 4-12
List of Illustrations
measurements ......................................................................................................................... 3-8
E
measurements...................................................................................................................... 3-9
BE
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