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19 Device and Documentation Support
19.1 Documentation Support
For additional information, see the following related documents:
•
BQ76952 Technical Reference Manual
•
BQ76952 Evaluation Module User's Guide
•
Using Low-Side FETs with the BQ76952 Battery Monitor Family
•
Cell Balancing with BQ76952, BQ76942 Battery Monitors
•
Multiple FETs with the BQ76952, BQ76942 Battery Monitors
19.2 Support Resources
TI E2E
™
support forums
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's
19.3 Trademarks
TI E2E
™
is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
19.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
19.5 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
20 Mechanical, Packaging, Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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