Preparing The Ied To Verify Settings - ABB Relion 670 Series Commissioning Manual

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Section 10
Testing IED operation
10.1.2

Preparing the IED to verify settings

If a test switch is included, start preparation by making the necessary connections to the test switch. This
means connecting the test equipment according to a specific and designated IED terminal diagram.
Put the IED into the test mode to facilitate the test of individual functions and prevent unwanted operation
caused by other functions. The busbar differential protection is not included in the test mode and is not
prevented to trip during the test operations. The test switch should then be connected to the IED.
Verify that analog input signals from the analog input module are measured and recorded correctly by
injecting currents and voltages required by the specific IED.
To make testing even more effective, use PCM600. PCM600 includes the Signal monitoring tool, which is
useful in reading the individual currents and voltages, their amplitudes and phase angles. In addition,
PCM600 contains the Disturbance handling tool. The content of reports generated by the Disturbance
handling tool can be configured which makes the work more efficient. For example, the tool may be
configured to only show time tagged events and to exclude analog information and so on.
Check the disturbance report settings to ensure that the indications are correct.
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This IED is designed for a maximum continuous current of four times the rated current.
All references to CT and VT must be interpreted as analog values received from merging
units (MU) via IEC/UCA 61850-9-2LE communication protocol, analog values received
from the transformer input module, or analog values received from the LDCM.
When using a MU test simulator, make sure it is set to the correct SVID and that the
system frequency is set to the same as in the IED.
Please observe the measuring accuracy of the IED, the test equipment and the angular
accuracy for both of them.
Consider the configured logic from the function block to the output contacts when
measuring the trip time.
After intense testing, it is important that the IED is not immediately restarted, which might
cause a faulty trip due to flash memory restrictions. Some time must pass before the IED
is restarted. For more information about the flash memory, refer to section "Configuring
the IED and changing settings".
If the IED is used together with a merging unit and no time synchronization is available,
for example, in the laboratory test, the IED will synchronize to the SV data
stream. During the re-synchronization, the protection functions will be blocked once a
second for about 45 ms, and this will continue for up to 10 minutes. To avoid this,
configure PTP (IEEE 1588) to On for the access point where the merging unit is
configured.
© 2017 - 2021 Hitachi Power Grids. All rights reserved
1MRK 511 403-UUS Rev. K
M11741-2 v12
Bay control REC670
Commissioning manual

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