HT COMBITEST422 User Manual page 15

4. Note the correct voltage values between L-N and L-PE as
shown in the screen to the side.
5. Press the GO/STOP key on the instrument or the START key on the remote switch
probe. The instrument will start the automatic test sequence.
If message "Measuring..." appears on the display, the instrument is
performing measurement. During this whole stage, do not disconnect the
test leads of the instrument from the mains.
6. The Ra test starts and the screen to the side appears on
the display. After approx. 20s, the Ra
values of Z Z I
L-N, L-PE, SCMin,
the display.
In case of a positive result of all the tests sequentially
performed as Ra (Z
L-N
goes on with the test on the trip-out current and trip-out
time of the RCD.
7. The RCD test starts and the screen to the side appears
on the display. The trip-out current and the trip-out time
values appear on the display.
In case of a positive result of all the tests sequentially
performed during the RCD test (Trcd and Ircd
parameters) (see § 12.4), the instrument goes on with the
test on insulation resistance between L-N, L-PE and N-
PE conductors.
CAUTION
ends and the
I immediately appear on
FCMin
and Z <199), the instrument
L-PE
EN - 15
COMBITEST422
15/10 – 18:04
A U T O
>  <
T N
Z L - N = - - - Ω
I s c = - - - A
Z L - P E = - - - Ω
I f c = - - - A
T r c d = - - - m s I r c d = - - - m A
F R E Q = 5 0 . 0 0 H z U t = - - - V
V L - P E = 2 3 1 V V L - N = 2 3 2 V
30mA 500V 1.00M
In Type Vtest Lim
15/10 – 18:04
A U T O
>  <
T N
I s c = 1 4 3 7 A Z L - N = 0 . 1 6 Ω
I f c = 1 2 7 7 A Z L - P E = 0 . 1 8 Ω
T r c d = - - - m s I r c d = - - - m A
F R E Q = 5 0 . 0 0 H z U t = - - - V
V L - P E = 2 3 1 V V L - N = 2 3 2 V
M e a s u r i n g . . .
30mA 500V 1.00M
Type Vtest Lim
In
15/10 – 18:04
A U T O
>  <
T N
I s c = 1 4 3 7 A Z L - N = 0 . 1 6 Ω
I f c = 1 2 7 7 A Z L - P E = 0 . 1 8 Ω
T r c d = 2 5 m s I r c d = 2 7 . 0 m A
F R E Q = 5 0 . 0 0 H z U t = 1 . 5 V
V L - P E = 2 3 1 V V L - N = 2 3 2 V
M e a s u r i n g . . .
30mA 500V
1.00M
In Type Vtest Lim