Keithley 7174A Instruction Manual page 75

8×12 low current matrix card
Table of Contents

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A
Applications 3-1
B
Basic CV test procedure 3-3
Block diagram 4-2
C
Cable connections 3-10
Card connectors 2-2
Card installation and removal 2-2
Coaxial jumper access 2-25
Component layout and schematic diagram
5-1
Computerized system configuration 3-1
Connections 2-2
CV measurements 3-1
E
Electromagnetic Interference (EMI) 2-22
Environment conditions 4-5
Environmental considerations 2-1
F
Factory service 5-1
Features 1-1
G
Gaining circuit access 4-4
General information 1-1
General instrument connections 2-5
Ground loops 2-22
Guarding 2-24
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H
Handling and cleaning precautions 4-1
Handling precautions 2-1
I
ID data circuits 4-2
Inspection for damage 1-2
Instruction manual 1-2
Internal matrix expansion 2-21
Introduction 1-1, 2-1, 3-1, 4-1, 5-1
Isolator relays 4-4
K
Keeping connectors clean 2-23
Keithley instrument connections 2-11
M
Magnetic fields 2-22
Manual addenda 1-2
Matrix configuration 2-18
Matrix expansion effects on card specifica-
tions 2-24
Measurement considerations 2-22
N
Noise currents caused by cable flexing
2-23
O
Offset current verification 4-6
Operation 2-1
Optimizing CV measurement accuracy
3-3
Optional accessories 1-2
Ordering information 5-1
Index
P
Packing for shipment 1-2
Parts list 5-1
Path isolation verification 4-7
Path isolators 2-18
Path resistance verification 4-9
Performance verification 4-5
Power-on sequence 4-3
Principles of operation 4-2
R
Recommended cables and adapters 2-3
Recommended equipment 4-4
Recommended test equipment 4-5
Reed pack replacement 4-11
Relay control 4-3
Replaceable parts 5-1
Resistivity calculations 3-9
Resistivity measurements 3-7
S
Safety symbols and terms 1-2
Semiconductor IV characterization 3-9
Semiconductor test matrix 3-5
Service information 4-1
Shielding 2-23
Shipment contents 1-2
Special handling of static-sensitive devices
4-5
Specifications 1-2
Stand alone system configuration 3-1
Switching matrix 2-18
System configuration 3-5
T
Test configuration 3-7, 3-9
Test procedure 3-7
Testing common-source characteristic of
FETs 3-6
Triax banana plug adapter 2-4
i-1

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