Table of Contents
Advertisement
3.3
Semiconductor test matrix
Two important advantages of a matrix switching system are
the ability to connect a variety of instruments to the device or
devices under test, as well as the ability to connect any
instrument terminal to any device test node. The following
paragraphs discuss a typical semiconductor matrix test sys-
tem and how to use that system to perform a typical test:
common-source characteristic testing of a typical JFET.
3.3.1 System configuration
Figure 3-5 shows the configuration for a typical multi-
purpose semiconductor test matrix. Instruments in the
system perform the following functions.
Model 617 Electrometer/Source: Measures current, and
also could be used to measure voltages up to ±200VDC. The
DC voltage source can supply a maximum of ±100V at cur-
rents up to 2mA.
Figure 3-5
Semiconductor test matrix
Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com
220
196
230
Current
DMM
V Source
Source
V Measure
HI
LO
HI
LO
HI LO
G
S G S G
S G S G
SG SG SG SG S G
A
B
C
D
E
F
G
H
1 2 3 4 5 6 7 8 9 10
7174A Matrix Card
707A Switching Matrix
Model 230 Voltage Source: Sources DC voltages up to
±101V at a maximum current of 100mA.
Model 590 CV Analyzer: Adds CV sweep measurement
capability to the system.
Model 220 Current Source: Used to source currents up to a
maximum of 101mA with a maximum compliance voltage
of 105V.
Model 196 DMM: Measure DC voltages in the range of
100nV to 300V. The Model 196 could also be used to mea-
sure resistance in certain applications.
Device Under Test: A three-terminal picture for testing such
devices as bipolar transistors and FETs. Additional connec-
tions could easily be added to test more complex devices, as
required.
Device Under Test
Drain
Gate
Source
S
G
HI
617
I Measure
S
LO
G
S
HI
G
V Source
S
LO
G
HI
S
590
G
G
CV
S
LO
G
11
12
Applications
3-5
Advertisement
Table of Contents
