Keithley 7174A Instruction Manual page 11

2 Operation
Figure 2-1 Model 7174A installation .......................................................................................................................... 2-2
Figure 2-2 Card connectors ......................................................................................................................................... 2-3
Figure 2-3 Triax connector configuration ................................................................................................................... 2-3
Figure 2-4 Triax cable preparation ............................................................................................................................. 2-4
Figure 2-5 General instrument connections ................................................................................................................ 2-6
Figure 2-6 Model 617 electrometer connections ...................................................................................................... 2-11
Figure 2-7 Model 196 DMM connections ................................................................................................................ 2-12
Figure 2-8 Model 230 voltage source connections ................................................................................................... 2-13
Figure 2-9 Model 590 CV analyzer connections ...................................................................................................... 2-14
Figure 2-10 Model 220 current source connections ................................................................................................... 2-15
Figure 2-11 Model 236/237/238 source measure unit connections ............................................................................ 2-16
Figure 2-12 Typical test fixture connections .............................................................................................................. 2-17
Figure 2-13 Equivalent circuit of test fixture connections .......................................................................................... 2-18
Figure 2-14 Matrix configuration ............................................................................................................................... 2-19
Connecting three cards for an 8 × 36 matrix ........................................................................................... 2-21
Figure 2-15
Figure 2-16 Jumper connector locations ..................................................................................................................... 2-21
Figure 2-17 Two cards in daisy chain configuration .................................................................................................. 2-22
Figure 2-18 Power line ground loops ......................................................................................................................... 2-23
Figure 2-19 Eliminating ground loops ........................................................................................................................ 2-23
Figure 2-20 Shielded and guarded .............................................................................................................................. 2-24
Figure 2-21 Guarded circuit ........................................................................................................................................ 2-24
Figure 2-22 Coaxial jumper access ............................................................................................................................. 2-25
3 Applications
Figure 3-1 Stand alone CV system configuration ........................................................................................................ 3-2
Figure 3-2 Computerized CV system configuration .................................................................................................... 3-2
Figure 3-3 Typical quasistatic CV curve generated by Model 595 ............................................................................. 3-4
Figure 3-4 Typical high-frequency CV curve generated by Model 590 ...................................................................... 3-4
Figure 3-5 Semiconductor test matrix ......................................................................................................................... 3-5
Figure 3-6 System configuration for measuring common-emitter characteristics ....................................................... 3-6
Figure 3-7 Typical common-source FET IV characteristics ........................................................................................ 3-6
Figure 3-8 Resistivity test configuration ..................................................................................................................... 3-7
Figure 3-9 Resistivity measurement conventions ........................................................................................................ 3-8
Figure 3-10 Multi-unit test system using Models 236 and 237 source measure units ................................................. 3-10
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List of Illustrations
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