Speed Scanning For Increased Production Test Throughput - Keithley DAQ6510 User Manual

DAQ6510 Data Acquisition / Multimeter System User's Manual
There is no internal connection between protective earth (safety ground) and the LO
terminals of the DAQ6510. Therefore, hazardous voltages (more than 30 V
LO terminals. This can occur when the instrument is operating in any mode. To prevent
hazardous voltage from appearing on the LO terminals, connect the LO terminal to protective
earth (safety ground) if your application allows it. You can connect the LO terminal to the
chassis ground terminal on the front panel or the chassis ground screw terminal on the rear
panel. Note that the front-panel terminals are isolated from the rear-panel terminals.
Therefore, if you are using the front-panel terminals, ground to the front-panel LO terminal. If
using the rear-panel terminals, ground to the rear panel LO terminal. Failure to follow these
guidelines can result in injury, death, or instrument damage.

Speed scanning for increased production test throughput

This application demonstrates how to configure the DAQ6510 to execute scans at the best scan
speed. You will eliminate certain measurement options that add to overall test time. The scan
completion times of the 7700 and 7710 20-channel differential multiplexer modules will be compared,
and you will see the speed improvement attributed to solid-state relays over electromechanical relays
used in some multiplexer modules.
For this application, you will:
• Use the sample code (either SCPI or TSP) to issue commands that:
Fix the DCV measurement range for all channels and remove the delay time introduced through

autoranging.
Eliminate the autozero feature to remove extra correction measurements from being performed.

Set the display digits to a low resolution and turn off the front panel to bypass any delays that would

come from updates/refreshes.
Turn off channel statistics calculation so that the instrument puts its processing power into data

acquisition and transmission.
Disable line synchronization.

Execute a 20-channel scan with a count of 1000 for a total sample count of 20,000 readings.

Incrementally extract the most current scan measurements until complete and either save them to a file

or print them to the computer display.
• Evaluate the time elapsed.
DAQ6510-900-01Rev. A / April 2018
Section 9: Speed scanning for increased test throughput
) can appear on
RMS
9-3