Keysight N773X Optical Switch - Keysight N7744A Getting Started Manual

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Getting Started

Keysight N773x Optical Switch

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code compatibility with existing test setups based on Keysight's range
of full-size and compact tunable lasers is a great asset. In system
loading applications, it may be preferable to grid-tune the lasers like
system transmitters, simply by changing the channel index. The
channel grid is adjustable to standard ITU-T grid spacing like 50 GHz,
and to arbitrary grids. Likewise, the zero frequency (base channel) of
the chosen grid is adjustable. A 12 GHz fine-tuning range allows de-
tuning the frequency.
Targeted for high test throughput, lowest cost-per-channel, and narrow
footprint, all members of Keysight's 77-Series optical test instruments
are built on a common platform and a common PC-based user
interface. A complete set of control interfaces including LAN, USB2.0
and GPIB simplifies integration with manufacturing control systems.
Code compatible to Keysight's Lightwave Measurement System
modules, the new instrument generation can serve as plug-in
replacements in existing test solutions. The N77 viewer software
allows to control all features of the N7711/4A tunable laser sources.
The Keysight N77-Series optical switches are available for both single-
mode and multimode fiber test applications. The excellent repeatability,
compact format and flexible control interfacing support high-
performance automated setups. The multimode switch has excellent
mode fidelity.
These instruments are used for automatic routing of optical signals for
testing devices like transceivers, amplifiers, and passive components.
Optical switches optimize the investment in automated test equipment
by improving repeatability and throughput and supporting parallel
measurements of multiport and multiple devices.
These switches can be used to avoid repeated reconnections during your
measurements and are critical to automated procedures. The excellent
switching repeatability assures that the signal level is constant from
cycle to cycle. The low IL and PDL and high repeatability assure
minimum impact of the switch on measurement accuracy. A typical
setup may use a 1x4 switch to select among several source wavelengths
in a test, while avoiding the time delay for power stabilization if each
source must be cycled on and off. Or the same digital signal may be
switch among several instruments, like a power meter, DCA or BERT.
In many cases, valuable signal source and analysis instrumentation can
be used more effectively in a parallel-test configuration. For example,
multiple cables or components can be tested together during
temperature cycling. On the other hand, an increasing use of inherently
parallel components, as for optical interconnections for 40G or 100G
using 10 Gb/s components, calls for identical testing in multiple paths.
Keysight N77xx Series