Page 1 ST4030 Instruction Manual IMPULSE WINDING TESTER Be sure to read this manual before using the instrument.  p.5 When using the instrument for the Troubleshooting first time Parts Names and Functions Maintenance and Service p.199   Communication Command Error Display and Solution p.207...
Page 3 Measurement Flowchart The basic measuring flow is as described below. Preparation See “2 Preparation for Measurements” (p. 13) Master workpiece Workpiece (known-good winding) under test Setting Test Conditions and Judgment Conditions [SETTING] Select in test conditions settings mode. (p. 18) Select the settings table that will acquire the master waveform.
Page 4 Calibrate the voltage and acquire the master waveform. (p. 49) Set the judgment criteria. (p. 53) Implementing tests [TEST] Select in test mode. (p. 18) Select the settings table that acquired the master waveform to be used in the test (p. 29) Connect the workpiece under test to the test lead.
Page 5: Table Of Contents
......... 46 waveform acquisition Preparation for Trigger Delay .........47 Voltage Calibration .......49 Measurements Setting Judgment Connecting the Test Lead (on the Conditions ST4030) ..........14 Connecting the Power Cord ....15 Overview Power Supply ON/OFF ..........51 ......16 ......... 51 ......16 Judgment types...
Page 6 Contents Graph Display Settings Threshold value of the test waveform ......108 discharge amount over the master Overlay settings ........108 ...... 73 waveform discharge amount ......109 Waveform color settings Deviation threshold value of the test ....111 LC and RC graph scale settings ......
Page 7 Contents ......180 Deleting files and folders Communications Creating folders ........181 Interface .. 182 Changing the folder name and file name Information display ........183 11.1 Overview ..........140 Speciﬁcations ......... 140 Screen display 11.2 Specifications ........141 ..........141 RS-232C 13.1 General Specifications .......185 GP-IB...
Page 8 Contents 15.3 Rack Mount .........216 Metal fitting dimensions ......217 ........219 Installation method 15.4 Dimensions Diagram ......221 15.5 Repeat Accuracy (Reference Value) Reproducibility of the voltage generated .. 222 ..223 Oscillation waveform reproducibility 15.6 Max. Applicable Voltage (Reference Value) According to the Workpiece Inductance ....224 15.7 Voltage Switching Time (Reference...
Page 9: Introduction
Introduction Introduction Thank you for choosing the Hioki ST4030 Impulse Winding Tester. Preserve this manual carefully and keep it handy to make full use of this instrument for a long time. Read the separate document “Operating Precautions” carefully before using the instrument.
Page 10: Notations
Notations Notations Safety symbols In this document, the risk seriousness and the hazard levels are classified as follows. Indicates a potentially hazardous situation that may result in death or serious WARNING injury to the operator. Indicates a potentially hazardous situation that may result in minor injury to the CAUTION operator or damage to the instrument or malfunction.
Page 11: Confirming Package Contents
When you receive the instrument, inspect it carefully to ensure that no damage occurred during shipping. In particular, check the accessories, panel switches, and connectors. If damage is evident, or if it fails to operate according to the specifications, contact your authorized Hioki distributor or reseller.
Page 12: Options (Sold Separately)
Options (Sold separately) Options (Sold separately)  Model ST9000 Discharge Detection Upgrade (Optional when shipped from factory)  Model L2250 Clip Type Lead  Model Z3000 GP-IB Interface  Model 9151-02 GP-IB Connector Cable (2 m)  Model Z3001 RS-232C Interface ...
Page 13: Usage Notes
• Keep discs inside a protective case and do not expose them to direct sunlight, high temperature, or high humidity. • Hioki is not liable for any issues your computer system experiences in the course of using this disc. Test lead CAUTION •...
Page 14 Usage Notes...
Page 15: Overview
The condition is called a “layer short circuit”. The ST4030 Impedance Winding Tester not only compares and judges waveform conformance through comparisons with existing response waveforms, but also detects layer short circuits using judgment methods that employ the rendering of response waveforms as numerical values (LC and RC values).
Page 16: Parts Names And Functions
Parts Names and Functions 1.3 Parts Names and Functions Front Rear Bottom...
Page 17 Parts Names and Functions Name Function Reference Display 8.4-inch color TFT liquid crystal display. p. 10 Comes with a resistant film touch panel. START button Starts measurements. p. 77 OUTPUT lamp Shows the voltage Red: Voltage is being applied p. 84 application status.
Page 18: Screen Operations
Screen Operations 1.4 Screen Operations The instrument uses a touch panel for all settings and changes to the measuring conditions. Gently touch the onscreen keys to select the items and values set for those keys. CAUTION Do not press the touch panel forcefully or jab it with the point of a hard object. Doing so may cause a malfunction.
Page 19: Moving Windows
Screen Operations Moving windows Press and hold the window title bar while dragging the window to move the window to a new position. Window title bar Touch keyboard inputs [SET] to confirm. To cancel, tap [CANCEL]. Enter text and then tap Moves the cursor to the left.
Page 20: Screen Configuration
Screen Operations Screen configuration The instrument settings windows are configured using the following stages. Measurement screen MODE SETTING VOLT OUTPUT PULSE SAMPLING DELAY JUDGE LCRC AREA DISCHARGE AREA DIFF AREA FLUTTER LAPLACIAN TEST OUTPUT START NONE STEP PULSE SAMPLING TABLE LCRC AREA JUDGE DISCHARGE...
Page 21: Preparation For Measurements
Preparation for Measurements Make sure to read through both “Usage Notes” (p. 5) in this manual and the separate “Operating Precautions” before starting the preparations that precede measuring. For rack mounts, see “15.3 Rack Mount” (p. 216). Installing the device. p.
Page 22: Connecting The Test Lead (On The St4030)
Connecting the Test Lead (on the ST4030) 2.1 Connecting the Test Lead (on the ST4030) Connect the test lead to the voltage output terminal on the instrument. CAUTION To prevent damage to the coaxial connectors or joint, make sure to unlock first, and grasp the coaxial connector and pull it out.
Page 23: Connecting The Power Cord
Connecting the Power Cord 2.2 Connecting the Power Cord To supply power to the instrument, connect the power cord to the power supply inlet on the rear of the instrument. WARNING Before turning on the power supply, check that the power supply voltage described on the power supply connector on the instrument and the power supply voltage to be used match each other.
Page 24: Power Supply On/Off
Power Supply ON/OFF 2.3 Power Supply ON/OFF Turn ON the main power supply on the rear of the instrument beforehand to enable turning ON and OFF the power supply using the startup button on the front. This is convenient if incorporating the instrument into an automated machine or assembly line.
Page 25: Sleep Mode
Power Supply ON/OFF Sleep mode This is the mode in which the device power supply is OFF. Only the circuit that turns on the startup button lamp is operating. With the main power supply switch turned ON, press and hold the startup button for approx. 2 sec.
Page 26: Select Measuring Mode
Select Measuring Mode 2.4 Select Measuring Mode [MODE] in the measurement screen to display the measuring mode selection window. Choose from 4 types of measuring mode. [SETTING] Test conditions settings mode Sets the test conditions, sets the judgment conditions, and acquire the master waveforms.
Page 27: Inspecting Before Measurement And Verifying Operations
Inspection Before using the instrument for the first time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you find any damage, contact your authorized Hioki distributor or reseller. This may cause electric shock or short circuit, Is the sheath of the cable so replace with an undamaged cable.
Page 28: Checking The Voltage Generated
Implement the test with nothing connected to the voltage output terminal. Check that the peak voltage (value displayed on the instrument) is 3300 V ±1%. IMPORTANT Contact your authorized Hioki distributor or reseller if the peak voltage differs from the set voltage by 1% or greater.
Page 29: Checking The Impulse Response Waveforms
Inspecting before Measurement and Verifying Operations Checking the impulse response waveforms Implement impulse testing on the inspection master workpiece to check that there are no abnormalities in the instrument or equipment. Set the test conditions according to the workpiece. Tools to be prepared Master workpiece (a workpiece close to the mass production master workpiece, or a coil of approx.
Page 30 Inspecting before Measurement and Verifying Operations (2) Waveform reproducibility is poor. Periods of magnetic saturation reduces the workpiece inductance, so the vibration frequency of the response waveform increases (i.e., inclination is more sudden). The waveform may experience major variation when multiple impulse tests are performed on the same workpiece because of the magnetic characteristics of the core.
Page 31 Prepare a new master workpiece, and implement voltage calibration. (4) Test lead insulation is worn. Prepare a new test lead, and implement voltage calibration. IMPORTANT If none of these apply, there is a risk that the instrument is damaged. Contact your authorized Hioki distributor or reseller.
Page 32 Inspecting before Measurement and Verifying Operations...
Page 33: Switching Test Conditions (Table Functions)
Switching Test Conditions (Table Functions) 3.1 Overview • The test conditions, judgment conditions, and master waveform are saved to the instrument’s internal memory as settings tables. A maximum of 255 settings tables (No. 001 to No. 255) can be created. •...
Page 34: Items That Can Be Saved
Overview Items that can be saved The following items can be saved to settings tables. Test conditions settings VOLT Applied voltage PULSE No. of applied pulses, No. of degaussing pulses, min. interval between pulse outputs SAMPLING Sampling frequency, No. of sampling data DELAY Trigger delay Judgment conditions settings...
Page 35: Operations Flowchart In Test Conditions Settings Mode And Test Mode
Overview Operations flowchart in test conditions settings mode and test mode In test conditions settings mode and test mode, select the table to be used before you move on to the next operation, by using the operations procedure as shown in the diagram. Test conditions Test mode settings mode...
Page 36: Screen Configuration
Overview Screen configuration (Measurement screen) [MODE] > [SETTING] [TEST] > [TABLE] Current table number Number and name of the (current) table that is presently set. Table name Tables list List of the tables that have been saved. The table in which the characters are light blue is the present table. Scroll bar Drag to scroll the table.
Page 37: Current Table Selection
Current Table Selection 3.2 Current Table Selection Sets the table used as the test conditions as the current table (i.e., the table to be used from now on). (Measurement screen) [MODE] > [SETTING] [TEST] > [TABLE] Tap the table that is to be set as the current table. The table selected will be surrounded by a yellow frame.
Page 38: Table Initialization
Table Initialization 3.3 Table Initialization Restores the settings details of the selected table to their default values. Also deletes the master waveform. Reference: “Default settings table” on the application disc (Measurement screen) [MODE] > [SETTING] > [TABLE] Tap the table. Tap [INIT].
Page 39 Table Deletion 3.4 Table Deletion Deletes the settings details from unnecessary tables. After deletion, the [TABLE NAME] displayed as [– – –]. (Measurement screen) [MODE] > [SETTING] > [TABLE] Tap the table to be deleted. Tap [DELETE]. The confirmation window will be displayed. Tap [OK].
Page 40: Changing The Table Name
Changing the Table Name 3.5 Changing the Table Name Changes the name of the table saved to the instrument. [MODE] [SETTING] [TABLE] (Measurement screen) > > Tap the table whose name you want to change. Tap [RENAME]. Enter the new name of the table. Reference: “Touch keyboard inputs”...
Page 41: Table Copying
Table Copying 3.6 Table Copying You can copy the table that has been created and paste it to your chosen table. (Measurement screen) [MODE] > [SETTING] > [TABLE] Tap the table to be copied. Tap [COPY]. Tap the table to be pasted. Tap [PASTE].
Page 42 Table Copying...
Page 43: Setting The Test Conditions
Setting the Test Conditions 4.1 Overview Use the master workpiece to set the test conditions in order to judge whether or not the workpiece to be tested is defective. In test conditions settings mode, set the output conditions and the judgment conditions such as the pulse to be applied, etc., and acquire the master waveform.
Page 44: Screen Configuration
Overview Screen configuration Measurement screen Graph display Displays the waveform graph and the LC and RC graph. Reference: “Graph display (display graph switching)” (p. 37) Menu icons [MODE]: See “2.4 Select Measuring Mode” (p. 18) [TABLE]: See “3.2 Current Table Selection” (p. 29) [OUTPUT]: See “4 Setting the Test Conditions”...
Page 45 Overview Graph display (display graph switching) Waveform graph display Displays the waveform graph only. Number of applied pulses and [P:XX/XX]: Number of pulses that have been applied/Total number of peak voltage display pulses [xxxV]: Max. peak voltage value of the response waveform Waveform judgment area and Blue: AREA judgment area LC and RC values operation...
Page 46 Overview LC and RC graph display Displays only the LC and RC graph. LC and RC graph Blue (dots): Latest LC and RC values Yellow (dots): Imported LC and RC values master data Gray (solid): LC and RC values PASS judgment area Note: Dotted colors operate in tandem with the waveform colors.
Page 47 Overview Display the waveform graph and the LC and RC graph Displays the waveform graph and the LC and RC graph simultaneously.
Page 48 Overview Instrument status display and error display Current measurement Voltage application disabled mode mode display Test conditions settings mode Test mode BDV mode Current table display Displays the number and table name of the table presently being used. Communications Displays the settings for the communications interface presently being interface settings display used.
Page 49: Applied Voltage
Applied Voltage 4.2 Applied Voltage Sets the peak voltage value of the pulse applied to the workpiece. Inputs can be set either by using the up and down keys, or be entered using the numeric keypad. (Measurement screen) [MODE] > [SETTING] >...
Page 50: Number Of Applied Pulses
Number of Applied Pulses 4.3 Number of Applied Pulses Sets the number of test pulses to be used in the tests and the number of degaussing pulse applications to eliminate magnetic fields from the workpiece. Both the test pulses and degaussing pulses continue to be applied until their set number is reached.
Page 51 Number of Applied Pulses (Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [PULSE] Set the number of test pulses. Setting range: 1 to 32 Increases by 1.  Decreases by 1.  Sets to the default values. Set the number of degaussing pulses. Setting range: 0 to 10 Increases by 1.
Page 52: Sampling Frequency/Number Of Sampling Data
Sampling Frequency/Number of Sampling Data 4.4 Sampling Frequency/Number of Sampling Data Sets the voltage sampling frequency and the number of sampling data to be imported to the instrument. Sets the voltage sampling frequency. If a sufficiently long response waveform cannot be imported because SAMPLING the response waveform vibration period is long, you can extend the (Sampling frequency)
Page 53 Sampling Frequency/Number of Sampling Data (Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [SAMPLING] Set the sampling frequency. Setting range: 10 MHz, 20 MHz, 50 MHz, 100 MHz, 200 MHz Slows the sampling frequency.  Accelerates the sampling frequency.  Set the number of sampling data.
Page 54: Automatic Settings For Range Of Waveform Acquisition
Sampling Frequency/Number of Sampling Data Automatic settings for range of waveform acquisition You can automatically adjust and set the sampling frequency and number of sampling data during voltage calibration so that the waveform acquisition range is optimal. (Measurement screen) [MODE] >...
Page 55: Trigger Delay
Trigger Delay 4.5 Trigger Delay Sets the delay time (trigger delay) from the start of measuring to the application of the first pulse. If using this function, you can start measuring after the workpiece connection status has stabilized even if trigger timing and probing timing are the same when combined in the equipment. Trigger delay Pulse application Trigger...
Page 56 Trigger Delay (Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [DELAY] Set the trigger delay. Setting range: 0.000 s to 9.999 s (resolution: 0.001 s) Increases by 1.  Decreases by 1.  Sets to the default values. 10-KEY Displays the numeric keypad.
Page 57: Voltage Calibration
Voltage Calibration 4.6 Voltage Calibration Calibrates the voltages after the test conditions settings are finished. Voltage calibration adjusts the output voltage so that the set voltage is applied to the workpiece, and then imports the master waveform using the output voltage after making the adjustments. Items implemented using voltage calibration Gradually raise and adjust the output voltage so that the max.
Page 58 Voltage Calibration (Measurement screen) [MODE] > [SETTING] > [OUTPUT] CAL]. The settings window will open. Select the calibration type. TYPE1 If an error is detected such as being unable to apply the set voltage or the waveform is unstable due to the workpiece characteristics, the error finishes the operation and the master waveform is not imported.
Page 59: Setting Judgment Conditions
Setting Judgment Conditions 5.1 Overview Applies a set impulse voltage using voltage calibration to the workpiece to be tested, and compares the response waveform, LC and RC values, and discharge composition amount to the master workpiece data to judge whether or not the workpiece being tested conforms to quality. LC and RC values judgments Waveform judgments Discharge judgments...
Page 60: Settings Operations Procedure
Overview Settings operations procedure Imports the master workpiece waveform as the master waveform, and sets the threshold values for each judgment function from the master waveform. Turns ON the [ENABLE] settings for the Test conditions judgment functions to be used. (p. 55) settings mode •...
Page 61: Lc And Rc Values Area Judgments [Lcrc Area]
LC and RC Values Area Judgments [LCRC AREA] 5.2 LC and RC Values Area Judgments [LCRC AREA] What are LC and RC values? The equivalence circuit for the impulse tests is viewed as a LCR linear equivalence circuit as shown in the diagram below, and is the value that was quantified as the 2 parameters of “L*C”...
Page 62 LC and RC Values Area Judgments [LCRC AREA] LC and RC values judgments Test conditions settings mode The PASS judgment area is created based on multiple LC and RC values imported from the master workpiece after voltage calibration has been implemented. LC and RC graph (Test conditions settings mode) Yellow dots: Imported LC and RC master values...
Page 63: Enabling The Lc And Rc Values Judgments Function
LC and RC Values Area Judgments [LCRC AREA] Enabling the LC and RC values judgments function (Measurement screen) [MODE] > [SETTING] > [JUDGE] > [LCRC AREA] Tap [ENABLE], and turn [ON] the LC and RC values area operation functions. Tap [JUDGE], and turn [ON] the LC and RC values judgments functions.
Page 64: Importing Lc And Rc Master Values
LC and RC Values Area Judgments [LCRC AREA] Importing LC and RC master values Implement voltage calibration and import the master waveform before importing multiple LC and RC values as the master values. Test while implementing voltage calibration to save the LC and RC values acquired for each test as master values to the instrument.
Page 65 LC and RC Values Area Judgments [LCRC AREA] LC and RC cursor values [No.XXX]: Master data number of the cursor value. [(XXX)]: Total number of master data that have been imported. [DELETE] Deletes the master data for the LC and RC values shown by the cursor. Reference: “Importing LC and RC master values”...
Page 66: Auto Creation Of The Pass Judgment Area
LC and RC Values Area Judgments [LCRC AREA] Auto creation of the PASS judgment area The PASS judgment area is created automatically from the imported LC and RC master values. (Measurement screen) [MODE] > [SETTING] [CREATE] (on the measurements screen). [AREA TYPE] to set the shape of the area when the PASS judgment area is created automatically.
Page 67: Manually Creating The Pass Judgment Area
LC and RC Values Area Judgments [LCRC AREA] Manually creating the PASS judgment area You can set the PASS judgment area manually. You can manually micro-adjust the PASS judgment area after auto creation. (Measurement screen) [MODE] > [SETTING] > [JUDGE] >...
Page 68 LC and RC Values Area Judgments [LCRC AREA] Use the numeric keypad to enter the threshold values. Settings range: ±(0.000 f to 1.000) (effective number of digits: 4) Set the value to 0. − Enter a minus sign. Multiplies the entered value by ×1000. Multiplies the entered value by ×1/1000.
Page 69: Waveform Judgments
Waveform Judgments 5.3 Waveform Judgments Surface area comparison judgments [AREA] Compares the master waveform surface area and the test waveform surface area in the area specified by the user and judges whether the workpiece being tested conforms by the extent of the difference.
Page 70 Waveform Judgments Setting the surface area comparison judgment threshold value (Measurement screen) [MODE] > [SETTING] > [JUDGE] > [AREA] Tap [LIMIT]. Use the numeric keypad to enter the surface area comparison threshold value. Settings range: 0.00% to 99.99% (resolution: 0.01%) Surface area comparison value operations are implemented, but judgments are not.
Page 71: Differential Surface Area Comparison Judgments [Diff Area]
Waveform Judgments Differential surface area comparison judgments [DIFF AREA] Calculates the surface area surrounded by the master waveform and test waveform in the user- designated area to judge whether the test workpiece within that area conforms. The surface area surrounded by the master and test waveforms in the judgment area (surface area in a solid orange color) is calculated as shown in the “Differential surface area calculation example”...
Page 72 Waveform Judgments Setting the differential surface area comparison judgment threshold value (Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DIFF AREA] Tap [LIMIT]. Use the numeric keypad to enter the threshold values. Settings range: 0.00% to 99.99% (resolution: 0.01%) Differential surface area comparison value operations are implemented, but judgments are not. [SET] to confirm.
Page 73: Flutter Detection Judgments [Flutter]
Waveform Judgments Flutter detection judgments [FLUTTER] The amount of the high-frequency component expressed by the test waveform in the user- designated area is detected, and the size of the amount used to judge the discharge. The response waveform is primarily differentiated and the surface area of the differentiated waveform calculated as the amount of the high-frequency component.
Page 74 Waveform Judgments Enabling waveform flutter detection judgment functions (Measurement screen) [MODE] > [SETTING] > [JUDGE] > [FLUTTER] Tap [ENABLE], and turn [ON] the flutter detection judgment functions. Setting the flutter detection judgment threshold values [MODE] [SETTING] [JUDGE] [FLUTTER] (Measurement screen) >...
Page 75 Waveform Judgments Setting the flutter detection judgment area (Measurement screen) [MODE] > [SETTING] > [JUDGE] > [FLUTTER] Judgment area bar You can change the judgment area by dragging the lines of the start and end points. Moves 1 point. / [END]: End point Moves 100 points.
Page 76: Secondary Differential Detection Judgments [Laplacian]
Waveform Judgments Secondary differential detection judgments [LAPLACIAN] The amount of the high-frequency component expressed by the test waveform in the user- designated area is detected, and the size of the amount used to judge the discharge. The response waveform is secondarily differentiated and the surface area of the differentiated waveform calculated as the amount of the high-frequency component.
Page 77 Waveform Judgments Setting the secondary differential detection judgment threshold values (Measurement screen) [MODE] > [SETTING] > [JUDGE] > [LAPLACIAN] Tap [LIMIT]. Enter the secondary differential detection judgment threshold values. Setting range: 0 to 999,999 (resolution: 1) Laplacian value operations are implemented, but judgments are not. [SET] to confirm.
Page 78: Waveform Judgment Area And Judgment Threshold Value Automatic Settings Functions
Waveform Judgments Waveform judgment area and judgment threshold value automatic settings functions The judgment areas for judging waveform variations in set voltage during calibration and the judgment threshold values are set internally automatically so that the judgment settings for the waveform judgment functions are optimal.
Page 79: Discharge Judgments (When Incorporating Model St9000)
Discharge Judgments (When Incorporating Model ST9000) 5.4 Discharge Judgments (When Incorporating Model ST9000) Noise manifesting at a fixed level in the overall waveform among the high-frequency components manifesting in the test waveform is eliminated, and only the amount of the partial discharge components manifesting locally are sampled and judged.
Page 80: [Discharge]
Discharge Judgments (When Incorporating Model ST9000) Discharge judgment methods [DISCHARGE] (Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DISCHARGE] Tap [ENABLE], and turn [ON] the discharge judgment methods. Disables the Discharge Detection Upgrade. FIXED Compares the amount of the discharge component of the master waveform and the amount of the discharge component of the test waveform.
Page 81: Threshold Value Of The Test Waveform Discharge Amount Over The Master Waveform Discharge Amount
Discharge Judgments (When Incorporating Model ST9000) Threshold value of the test waveform discharge amount over the master waveform discharge amount When the judgment method is [FIXED] (Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DISCHARGE] Tap [LIMIT]. Enter the threshold value of the test waveform discharge amount over the master waveform discharge amount.
Page 82: Deviation Threshold Value Of The Test Waveform Discharge Amount
Discharge Judgments (When Incorporating Model ST9000) Deviation threshold value of the test waveform discharge amount When the judgment method is [AUTO] (Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DISCHARGE] Tap [LIMIT]. Enter the deviation threshold value of the test waveform discharge amount. Setting range: 3σ...
Page 83: Area
Discharge Judgments (When Incorporating Model ST9000) Setting the discharge amount judgment area Sets the extend of the the response waveform for the discharge judgment to target. Shorten the judgment area to reduce the operations time. (Measurement screen) [MODE] > [SETTING] >...
Page 84 Discharge Judgments (When Incorporating Model ST9000)
Page 85: Implementing Tests
Implementing Tests 6.1 Overview Calls the master waveform that has been set using test conditions settings mode, and tests the workpiece to be tested. The text results are output to the screen, communications, and external control terminal (EXT. I/O). Operations flowchart in test mode In test mode, select the master waveform and implement the test, by using the operations procedure as shown in the diagram.
Page 86: Screen Configuration
Overview Screen configuration Measurement screen Graph display Displays the waveform graph and the LC and RC graph. Reference: “Graph display (display graph switching)” (p. 79) Menu icons [MODE]: “2.4 Select Measuring Mode” (p. 18) [TABLE]: “3.2 Current Table Selection” (p. 29) [SYSTEM]: “9 System Settings”...
Page 87 Overview Graph display (display graph switching) Waveform graph display Displays the waveform graph only. [P:XX/XX]: Number of pulses that have been applied/Total number of Number of applied pulses and peak voltage display pulses [xxxV]: Max. peak voltage value of the response waveform Waveform judgment area and Blue: AREA judgment area LC and RC values operation...
Page 88 Overview LC and RC graph display Displays only the LC and RC graph. LC and RC graph Blue dots: Test LC and RC values (Failures displayed in red) Gray (solid): LC and RC values PASS judgment area LC and RC cursor values [No.XXX, (XXX)]: Cursor value test number, (total number of LC and RC values)
Page 89 Overview Display waveform graph and the LC and RC graph Displays the waveform graph and the LC and RC graph simultaneously.
Page 90 Overview Expanded judgment results Expands and displays the judgment results. Tap the LC and RC values judgments area to check the LC and RC values for each pulse. Judgment settings Displays the set values of the judgment functions. Total judgment results Displays the total judgment results.
Page 91 Overview Instrument status display and error display Present measurement Voltage application disabled mode mode display Test conditions settings mode Test mode BDV mode Current table display Displays the number and table name of the table presently being used. Information saved to Number of data saved to internal memory internal memory Communications...
Page 92: Checking Test Start And Test Results
Checking Test Start and Test Results 6.2 Checking Test Start and Test Results Press the instrument START button to implement the test. (You can start the test from either communications or external control terminal as well.) When a test finishes, the test results are output to the screen and external control terminal (EXT.I/O). Test results can also be acquired using communications.
Page 93: Break Down Voltage Test (Bdv)
Break down voltage test (BDV) 7.1 Overview Implement the test while gradually increasing the voltage applied to the test object, and evaluate the voltage at which the insulation starts to break down from the waveform LC and RC values, discharge amount, and waveform surface area, etc. Operations flowchart in break down voltage test mode Break down voltage test mode evaluates the break down voltage, by using the operations procedure as shown in the diagram.
Page 94: Screen Configuration
Overview Screen configuration Measurement screen Graph display Displays the waveform graph and the LC and RC graph. Reference: “Graph display (display graph switching)” (p. 37) Menu icons [MODE]: “2.4 Select Measuring Mode” (p. 18) [OUTPUT]: “7.3 Setting the Test Conditions” (p. 90) [JUDGE]: “7.4 Setting Insulation Break down Judgment Conditions”...
Page 95 Overview Graph display Number of steps, number [S:X/X]: Present number of steps/total number of steps of applied pulses, and peak [P:X/X]: Present number of pulse applications/total number of pulses voltage value display [xxxxV]: Response waveform peak voltage Response waveform Blue: PASS waveform Red: FAIL waveform Discharge judgment threshold Discharge judgment threshold value...
Page 96 Overview Instrument status display and error display Present measurement Voltage application disabled mode mode display Test conditions settings mode Test mode BDV mode Communications Displays the settings for the communications interface presently being interface settings display used. Test status display Displays the test status.
Page 97: Checking Test Start And Test Results
Checking Test Start and Test Results 7.2 Checking Test Start and Test Results Press the instrument START button to implement the test. (You can start the test from either communications or external control terminal as well.) When a test finishes, the test results are output to the screen, communications, and external control terminal (EXT.
Page 98: Setting The Test Conditions
Setting the Test Conditions 7.3 Setting the Test Conditions Sets the application voltage, number of pulses applied per voltage, and the sampling frequency. Applied voltage settings Sets the start voltage, max. voltage, and voltage rise width. Evaluate the voltage at which isolation break down starts by implementing impulse tests while increasing the voltage for each voltage rise width from the application start voltage that has been set to the max.
Page 99: Number Of Applied Pulses Settings
Setting the Test Conditions Number of applied pulses settings Sets the number of test pulses to be used in the tests and the number of degaussing pulse applications to eliminate magnetic fields from the workpiece. Reference: “4.3 Number of Applied Pulses” (p. 42) PULSE NUM Sets the number of test pulses to be applied.
Page 100: Setting The Sampling Frequency And Number Of Sampling Data
Setting the Test Conditions Setting the sampling frequency and number of sampling data Sets the voltage sampling frequency and the number of sampling data to be imported to the instrument. Sets the voltage sampling frequency. If a sufficiently long response waveform cannot be imported because SAMPLING the response waveform vibration period is long, you can extend the (Sampling frequency)
Page 101: Setting Dielectric Break Down Judgment Conditions
Setting Dielectric Break down Judgment Conditions 7.4 Setting Dielectric Break down Judgment Conditions Sets the conditions for judging dielectric break down from variations in the LC and RC values between multiple pulses, discharge amount, and waveform surface area values for each applied voltage.
Page 102: Discharge Judgment
Setting Dielectric Break down Judgment Conditions Discharge judgment Judges breakdown from the variations in the discharge amount between multiple pulses for each applied voltage. If the variations in the discharge amount between multiple pulses are greater than the set deviation threshold value, dielectric breakdown is judged to have occurred.
Page 103: Waveform Surface Area Comparison Judgment
Setting Dielectric Break down Judgment Conditions Waveform surface area comparison judgment Judges breakdown from the variations in the surface area values between multiple pulses for each applied voltage. If the variations in the surface area values between multiple pulses are greater than the set deviation threshold value, dielectric breakdown is judged to have occurred.
Page 104: Dielectric Break Down Judgments Using Fluctuations In The Peak Voltage Values And Vibration Frequencies
Setting Dielectric Break down Judgment Conditions Dielectric break down judgments using fluctuations in the peak voltage values and vibration frequencies IMPORTANT The peak voltage ad vibration frequency threshold values are set automatically internally when BDV testing starts. Peak voltage value fluctuations Judges break down from the variations in the peak voltage values between multiple pulses for each applied voltage.
Page 105: Other Functions
Other Functions 8.1 Interlock Function The interlock function cuts off instrument outputs by operating in tandem with external devices, etc. All instrument key operations are disabled. If the interlock functions are enabled while the external control terminal (EXT. I/O) No. 3 pin ―...
Page 106 Interlock Function Operations when the interlock is enabled ― ― ― ― ― ― ― ― ― If the external control terminal (EXT. I/O) INTERLOCK pin is OFF while the interlock function is enabled, the interlock is engaged, and [INTERLOCK] is displayed at the bottom right of the screen.
Page 107: Unlocking The Interlocks
Interlock Function Unlocking the interlocks Enter the pass code that has been set, to cancel the interlocks. Make sure not to forget your pass code. If you forget the pass code, full reset to return the system to its factory settings. The default pass code setting is “0000”.
Page 108: Key Lock Function
Key Lock Function 8.2 Key Lock Function The key lock function disables the instrument touch panel operations. You can also set the pass code (PIN). If a pass code has been set, it is necessary to enter the code when unlocking the key locks. Make sure not to forget your pass code. IMPORTANT •...
Page 109: Unlocking The Key Locks
Key Lock Function Unlocking the key locks Enter the pass code that has been set to cancel the key locks. Make sure not to forget your pass code. If you forget the pass code, full reset to return the system to its factory settings. The default pass code setting is “0000”.
Page 110: Double Action Function
Double Action Function 8.3 Double Action Function The double action function prevents misoperations during test startup. When the double action function is enabled, merely pressing the START button does not start the test. Press the STOP button and then press the START button within approx.
Page 111: Memory Function
Memory Function 8.4 Memory Function Saves the test results to the memory in the instrument. (1000 tests max.) You can save the test results that have been stored to USB memory. Further, you can acquire the saved data using communications commands. The items saved by the memory function are described below.
Page 112: Memory Function Settings (On/Off)
Memory Function Memory function settings (ON/OFF) Sets whether to enable or disable the memory functions. If enabled, the test results are automatically saved to the memory in the instrument when the test finishes. (Measurement screen) [SYSTEM] > [SYSTEM] Tap [MEMORY], and set the memory function to ON or OFF. Memory function is disabled.
Page 113: Saving Memory Data
Memory Function Saving memory data The data saved to internal memory is saved to USB memory. (Measurement screen) [SYSTEM] > [SYSTEM] [MEM SAVE]. A confirmation message is displayed. Tap [OK]. CANCEL Cancels the saving. Implements save.
Page 114: Deleting Memory Data
Memory Function Deleting memory data The data saved to internal memory is deleted. (Measurement screen) [SYSTEM] > [SYSTEM] [MEM CLEAR]. A confirmation message is displayed. Tap [OK]. CANCEL Cancels the deletion. Implements deletion.
Page 115: Displays
Displays 8.5 Displays Sets the items to be displayed. (Measurement screen) [SYSTEM] > [SYSTEM] > [DISP] Tap [DISP], and set the display lamps on settings. The display will turn off 10 sec. after the touch panel was last touched. After the display turns off, touching the touch panel again will turn on the display again. The display is always on.
Page 116: Graph Display Settings
Graph Display Settings 8.6 Graph Display Settings You can set the display methods for the graphs displayed on the measurement screen. Overlay settings Sets the overlay of the waveform and LC and RC graphs. When overlay is enabled, you can check visually any variations per waveform and LC and RC values test.
Page 117: Waveform Color Settings
Graph Display Settings Waveform color settings Sets the colors of the waveform and LC and RC graphs. Colors can be set using the test conditions settings mode, test mode, and BDV mode respectively. Test conditions settings mode (Measurement screen) [GRAPH] (Bottom left of screen) Example: Test conditions settings mode screen Tap the item buttons.
Page 118 Graph Display Settings Test conditions settings mode STD WAVE Sets the master waveform color and LC and RC values master data color. SMPL WAVE Sets the test waveform color and the test LC and RC values color. PASS DCHG Sets the waveform color for the part that does not exceed the threshold values on the discharge amount graph.
Page 119: Lc And Rc Graph Scale Settings
Graph Display Settings LC and RC graph scale settings Sets the scale value of the LC and RC graph X axis (LC value) and Y axis (RC value). Overlay can be set from the test conditions settings mode and test mode. (Measurement screen) [GRAPH] (Bottom left of screen)
Page 120: Implementing The Lc And Rc Graph Auto Scale
Graph Display Settings Implementing the LC and RC graph auto scale Implements auto scaling so that the upper and lower limits of the LC and RC graph display X axis (LC values) and Y axis (RC axis) are within a suitable display range. Overlay can be implemented from the test conditions settings mode and test mode.
Page 121: Judgment Beep
Judgment Beep 8.7 Judgment Beep Sets a beep that varies according to the judgment results. (Measurement screen) [SYSTEM] > [SYSTEM] > [JUDGE BEEP] Tap [BEEP], and set the conditions for when to sound the judgment beep. Beep does not sound regardless of the judgment results. PASS Sounds the beep when the overall judgment result is PASS.
Page 122: Key Beep
Key Beep 8.8 Key Beep You can set the keys to beep. (Measurement screen) [SYSTEM] > [SYSTEM] > [KEY BEEP] Tap [BEEP], and set whether or not to sound the key beep. Key beep does not sound. Key beep sounds. Set the scale of the key beep sound.
Page 123: Test Time (Eom) Display
Test Time (EOM) Display 8.9 Test Time (EOM) Display Displays the test time (EOM) for 1 test. Test time= (INDEX + software processing time + judgment times) × Number of pulse applications (Measurement screen) [SYSTEM] > [SYSTEM] [EOM TIME], and set whether to display or hide the test times (EOM). Test times are not displayed.
Page 124: Communications Commands Long Format Settings
Communications Commands Long Format Settings 8.10 Communications Commands Long Format Settings Sets the long format during data transfer using communications commands. When the long format is enabled, you can increase the number of effective digits in the voltage values that are acquired using communications commands. (Measurement screen) [SYSTEM] >...
Page 125: Initializing The Instrument (System Reset)
Initializing the Instrument (System Reset) 8.11 Initializing the Instrument (System Reset) Initializes all the instrument settings. For the initialization items and default set values, see the “Default settings table” on the application disc. If the system reset screen cannot be displayed, implement a full reset. Reference: “14.2 Initializing the Instrument (Full Reset)”...
Page 126 Initializing the Instrument (System Reset)
Page 127: System Settings
System Settings 9.1 Instrument System Information You can check the instrument system information. (Measurement screen) [SYSTEM] > [INFO] Serial No. Serial number Software Version Software version FPGA Main Main FPGA version FPGA Receive Sub FPGA version MAC Address MAC address of the instrument USB ID USB ID Interface Board...
Page 128: Self-Test Function
Reference: “Touch panel correction” (p. 121) IMPORTANT If the black square still cannot be tapped even after panel correction, there is a risk of malfunction. Contact your authorized Hioki distributor or reseller. When the test is finished, tap [EXIT].
Page 129: Touch Panel Correction
Press and hold on the center of the two in order until (green) is displayed. Tap [SET]. [SET] is displayed together with the two when (green) is displayed. IMPORTANT [SET] is not displayed, repairs are necessary. Contact your authorized Hioki distributor or reseller.
Page 130: Screen Display Test
[OUTPUT] [PASS/FAIL] lamps at the bottom of the instrument will also turn on and off according to the screen color. IMPORTANT If the full screen is not the same color, repairs are necessary. Contact your authorized Hioki distributor or reseller.
Page 131: Rom/Ram Test
All ROM/RAM memories are normal. One or more of the ROM/RAM memories is abnormal. IMPORTANT • All instrument operations are disabled during ROM/RAM tests. • If the judgment results display is [NG], repairs are necessary. Contact your authorized Hioki distributor or reseller.
Page 132 The test results will be displayed to the right of [FULL]. PASS All ROM/RAM memories are normal. One or more of the ROM/RAM memories is abnormal. IMPORTANT If the judgment results display is [NG], repairs are necessary. Contact your authorized Hioki distributor or reseller.
Page 133: Ext. I/O Test
Self-test Function EXT. I/O test Checks whether the output signals from the external control terminal (EXT.I/O) are normal, and whether the input signals can be read normally. (Measurement screen) [SYSTEM] > [TEST] Tap [EXEC]. Implement output signal tests and input signal tests. I/O OUT Implements output signal tests.
Page 134: Date And Time Settings
Date and Time Settings 9.3 Date and Time Settings Sets the instrument date and time. You can record and manage data using the set date and time. (Measurement screen) [SYSTEM] > [CLOCK] Set the date and time. Settings range: 00 o’clock 00mins. 00s January 1, 2000 to 23 o’clock 59mins. 59s December 31, 2099 Tap [SET].
Page 135: External Control
External Control (EXT. I/O) WARNING To prevent an electric shock or damage to the equipment, always observe the following precautions when connecting the cables to external control terminal connectors. • Always turn OFF the instrument and any devices that are connected before making connections.
Page 136: External Control Measurement Flow
External Control Measurement Flow 10.1 External Control Measurement Flow The external control measurement flow is as described below. Preparation Checking I/O specifications of the external device to be connected. Setting NPN/PNP in the instrument. p. 129 Connecting the instrument and the external device. p.
Page 137: Sinking Current (Npn) / Sourcing Current (Pnp)
Sinking Current (NPN) / Sourcing Current (PNP) 10.2 Sinking Current (NPN) / Sourcing Current (PNP) You can use NPN/PNP switching to change the type of corresponding programmable controller. NPN is sinking current and PNP is sourcing current. It is set to NPN at the time of shipment from the factory. CAUTION To avoid damaging the instruments, observe the following.
Page 138: Connection (Instrument And Control Devices)
Connection (Instrument and Control Devices) 10.3 Connection (Instrument and Control Devices) Instrument connector and compatible connectors Connectors used (instrument unit side) • D-SUB 37 pin, female #4-40 inch screw Compatible connectors • DC-37P-ULR (solder type) • DCSP-JB37PR (crimp type) Japan Aviation Electronics Industry, Ltd. 19 18 17 16 15 14 13 12 11 10 9 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 Rear...
Page 139 Connection (Instrument and Control Devices) Signal name Logic Function OUT2 – General outputs PASS – Total judgment PASS (Reserved) – – STOP Edge Measurement stopped (Reserved) – – TBL0 Level Table number selection TBL2 Level Table number selection TBL4 Level Table number selection TBL6 Level...
Page 140: Signal Functions
Connection (Instrument and Control Devices) Signal functions (1) Isolated power supply output NPN/PNP switch settings Signal name ISO_5 V Isolated power supply +5 V Isolated power supply −5 V 9, 27 ISO_COM Isolated power supply Isolated power supply common common (2) Input signal Signal name Description...
Page 141: Internal Circuit Configuration
Use ISO_COM for the common terminal for both the input and output signals. If a large current flows through common wiring, branch the output signals common wiring and the input signals common wiring close to the ISO_COM terminal. NPN setting ST4030 Programmable controller, etc. Output (Reserved)
Page 142: Electrical Specifications
Floating from the protective grounded potential and the measurement circuit Insulation rating Voltage between the module and ground: 50 V DC, 30 V rms AC, 42.4 V peak AC or less Connection examples Input circuit ST4030 ST4030 Input Input Connection to the switch Connection to the relay Programmable...
Page 143 Connection (Instrument and Control Devices) Output circuit ST4030 ST4030 Output Output Connection to the LED Connection to the relay ST4030 Output ST4030 Output Output Negative-true logic output Negative-true logic output Wired-OR Programmable Programmable ST4030 ST4030 controller controller Output Output Input...
Page 144: Timing Chart
Timing Chart 10.4 Timing Chart The level of each signal shows the contact ON/OFF status. In the sourcing current (PNP) setting, these are the same as the voltage level of the external control terminal. HI and LO are reversed for the voltage level in the sinking current (NPN) setting.
Page 145: Measurement Timing Example
Timing Chart Measurement timing example START TBL0 to 7 TBL signal imports Measurement Pulse application and Table Trigger delay Operation, judgment processing sampling switching INDEX Judgment Judgment results ERR results IMPORTANT • The instrument outputs judgment results signals before immediately outputting EOM signals. If responses from the input circuit of the external device that is connected are slow, it may take considerable time to import judgment results after an EOM signal ON is detected.
Page 146: Flow Of Starting Measurements From An External Device, And Reading The Judgment Results
If responses from the input circuit of the external device that is connected are slow, it may take considerable time to import judgment results after an EOM signal ON is detected. ST4030 External devices to be connected Measurement start instruction...
Page 147: Communications Interface
• To prevent instrument damage or an electric shock, use only the screws that are originally installed to secure the interface. If you have lost a screw or find that a screw is damaged, please contact your authorized Hioki distributor or reseller.
Page 148: Overview
(p. 149) with the communications class. LAN communications (p. 151) You can implement command control using TCP/IP protocols. ST4030 Screen display The icons at the top right of the screen show the selected interface. If RS-232C is selected. If GP-IB is selected.
Page 149: Specifications
Specifications 11.2 Specifications RS-232C Transmission method Communications method: Full duplex Sync method: Asynchronous transmission system Transmission speed 9600 bps, 19200 bps, 38400 bps, 57600 bps Data length 8 bits Parity None Stop bit 1 bit Message terminators CR+LF, CR (delimiters) Flow control Software (XON/XOFF control) See “Handshaking (Buffer Flow Control)”...
Page 150: Gp-Ib
Compatible OS Windows 7, Windows 8, Windows 10 Connector RJ-45 connector ×1 Electrical Conforms to IEEE802.3 specifications Transmission 10BASE-T/ 100BASE-TX/ 1000BASE-T automatic recognition method Protocol TCP/IP Function Command control Max. cable length 30 m max. Total Command system Unique HIOKI SCPI...
Page 151: Mounting And Removing An Interface
Mounting and Removing an Interface 11.3 Mounting and Removing an Interface You can check onscreen information for interfaces mounted to the instrument. Reference: “9.1 Device System Information” (p. 119): “11.4 Interface Settings” (p. 145) Communicating using Z3000:GP-IB (p. 148) Communicating using Z3001:RS-232C (p. 146) Rear Installation method Required items...
Page 152 When not using the interface after its removal Mount the blank panel. The specifications cannot be satisfied if measuring without mounting the blank panel. To purchase an additional blank panel, contact your authorized Hioki distributor or reseller. Mount the blank panel.
Page 153: Interface Settings
Interface Settings 11.4 Interface Settings You can control the instrument from a PC via RS-232C, GP-IB, USB, or LAN. GP-IB settings are possible only when the optional Z3000 GP-IB interface is mounted, and RS- 232C settings are possible only when the optional Z3001 RS-232C interface is mounted. (Measurement screen) [SYSTEM] >...
Page 154: Connecting And Setting Rs-232C (Model Z3001)
Connecting and Setting RS-232C (Model Z3001) 11.5 Connecting and Setting RS-232C (Model Z3001) Connection method Connect a RS-232C cable to the RS-232C connector of the instrument. Model 9637 RS-232C cable (9pin-9pin/1.8 m) is recommended. D-sub9 Pin male, terminal block screw #4-40 Rear When connecting a controller (DTE), prepare a instrument connector and a cross cable with the controller connector specifications.
Page 155 Connecting and Setting RS-232C (Model Z3001) Setting procedure Set RS-232C communications settings using the system screen. Settable only when the Z3001 RS- 232C interface is mounted to the instrument. [SYSTEM] [I/F] (Measurement screen) > Tap [RS-232C]. Select the baud rate. 9600 9600 bps 19200...
Page 156: Connecting And Setting Gp-Ib (Model Z3000)
Connecting and Setting GP-IB (Model Z3000) 11.6 Connecting and Setting GP-IB (Model Z3000) Connection method Connect a GP-IB cable to the GP-IB connector of the instrument. Model 9151-02 GP-IB connector cable (2 m) is recommended. Rear Setting procedure Set GP-IB communications settings using the system screen. Settable only when a Z3000 GP-IB interface is mounted to the instrument.
Page 157: Connecting And Setting Usb
When the instrument is connected to a PC for the first time, the dedicated USB driver is required. Before connecting the instrument and PC, install the USB driver. The USB drivers are on the enclosed application disc, or you can download them from the Hioki website (http://www.hioki.com).
Page 158 Connecting and Setting USB Setting procedure [SYSTEM] [I/F] (Test screen) > Tap [USB]. Set the terminator. CR+LF CR+LF...
Page 159: Setting And Connecting Lan
When connecting the instrument and hub using a LAN cable, you can control and monitor the instrument from the PC. Connecting a single instrument to multiple PCs LAN cable* LAN cable* ST4030 Connecting multiple instruments to a single PC LAN cable* LAN cable* ST4030 *1: Use either of the following.
Page 160 When connecting the instrument and PC using a LAN cable, you can control and monitor the instrument from the PC. LAN cable* ST4030 *Use either of the following. • 1000BASE-T-compatible cross cable (100 m max.) • 1000BASE-T-compatible straight cable and cross conversion connector (100 m max.) •...
Page 161: Setting Procedure
Setting and Connecting LAN Setting procedure You can implement command control using TCP/IP protocols. Set the instrument according to the network environment in use beforehand. IMPORTANT • Make sure to make the LAN settings before connecting to the network. • If the settings were changed without disconnecting, there is a risk that the IP address will duplicate the address of another instrument on the LAN, so that illegal address information may be sent to the LAN.
Page 162 Setting and Connecting LAN Network environment configuration example Example 1: Connecting the instrument to the existing network If connecting the instrument to an existing network, it is necessary to check the network settings beforehand. It is necessary to allocate IP addresses so that they do not overlap with other network devices. Check the following items with the network administrator, and keep a memo.
Page 163 Setting and Connecting LAN (Measurement screen) [SYSTEM] > [I/F] Tap [LAN]. Set the IP addresses. Set the port numbers. Setting range: 1024 to 65535 Set the subnet mask. Set the gateway. If it is not necessary to set a default gateway, for example if setting the instrument and PC 1-to-1 using a cross cable, the gateway may remain OFF.
Page 164: Remote Mode
Remote Mode 11.9 Remote Mode If starting communications after connecting an interface to the instrument, the instrument will enter remote mode (remote operations mode). In remote mode, operations by tapping the screen are disabled. Remote mode ON Remote mode OFF To return to local mode (normal communications), tap [LOCAL].
Page 165: Communications Monitor
Communications Monitor 11.10 Communications Monitor You can display the communications commands and query responses onscreen by using the communications monitoring functions. (Measurement screen) [SYSTEM] > [I/F] [COMM LOG]. Communications monitor is not displayed. Communications monitor is displayed. Communications monitor is displayed onscreen. The max. number of lines that can be displayed is 30.
Page 166 Communications Monitor Commands and messages displayed by the communications monitor, and their meaning The displayed commands are color-coded as described below. Light blue display Incoming commands Green display Outgoing commands Red display Error messages Error messages are displayed as described below. QUERY ERROR Query error DEVICE-SPECIFIC ERROR...
Page 167: Usb Host
USB Host 12.1 Overview You can save the measured value and instrument settings to USB memory. Further, you can also import the settings that have been saved to USB memory to the instrument. You can save data from the instrument to USB memory. •...
Page 168: Removing The Usb Memory
Removing the USB Memory 12.2 Removing the USB Memory Inserting the USB memory Insert the USB memory into the USB memory connector on the front. • Do not insert anything other than a mass storage class-compatible USB memory. • Not all commercially-available USB memories are compatible. •...
Page 169 Removing the USB Memory Icon display when using the USB When a USB memory is detected normally, the USB memory icon is displayed at the bottom of the measurements screen. When USB memory is being accessed, the icon color turns red. (Blue) If the instrument detects a USB memory (Red)
Page 170: File Window
File Window 12.3 File Window When using USB, the following will be displayed. Further, you can set the format of the file to be saved to USB, the save destination, the text save format, and so on. Header portion [filename +++]: File name [size ++]: File size...
Page 171: Settings For Saving The Data
Settings for Saving the Data 12.4 Settings for Saving the Data Set beforehand to save the measurement results to USB memory. Both auto and manual save are available. You can select the test results (CSV file format) and measurement screen (BMP file format) to be saved.
Page 172: Setting Manual Save
Settings for Saving the Data Setting manual save Tap [SAVE], and set to save the measurement results. (Measurement screen) [FILE] > [SETUP] Set the operations when [SAVE] is tapped. SELECT The save details selection window will be displayed. QUICK Saves the saved items that have been set immediately. Tap [TEXT], and set whether or not to save text (CSV file format) of the test results during manual saving.
Page 173: Text Save Items Settings
Settings for Saving the Data Text save items settings Sets the save items when saving text of the test results (CSV file format). (Measurement screen) [FILE] > [SETUP] Tap [DATE], and set whether or not to save the date and time. Tap [SET], and set whether or not to save the measuring conditions.
Page 174: Setting The Text Save Format
Settings for Saving the Data Setting the text save format Sets the delimiters and quote marks when saving text of the test results (CSV file format). (Measurement screen) [FILE] > [SETUP] > [PAGE] Tap [QUOTE], and set the item quotation type. None “...
Page 175: Setting The Image Save Format
Settings for Saving the Data [DATE FORM], and set the date format. YYYYMMDD Year, month, day MMDDYYYY Month, day, year DDMMYYYY Day, month, year YYMMDD Year, month, day MMDDYY Month, day, year DDMMYY Day, month, year [DATE DELIM], and set the date delimiter type. Slash Hyphen Period...
Page 176: Setting The Name Of The Saved File And Its Folder
Settings for Saving the Data Setting the name of the saved file and its folder Specifies the name of the saved file. IMPORTANT File names are shared between text saved data, image saved data, and memory data. If a file with the same name already exists, “00001” to “65534” will be appended in order after the file name. (Measurement screen) [FILE] >...
Page 177 Settings for Saving the Data Operating the file name input screen (Same as the folder name input screen) Moves the cursor.   Deletes 1 character from the file name that has been entered. Deletes all characters from the file name that has been entered. KEY TYPE Switches the keyboard type.
Page 178: Saving Test Results
Saving Test Results 12.5 Saving Test Results [SAVE] to implement the save. Manual saving QUICK: [SAVE] to save immediately according to the settings details. SELECT: [SAVE] to display the selection window. If automatic saving has been turned ON using [FILE] >...
Page 179 Saving Test Results Only when [SELECT] is selected Select the details to be saved and implement the save operation. TEXT Saves the text data. SCREEN Saves the image. Tap [SAVE]. Implements manual save.
Page 180: Checking The Test Results That Have Been Saved
Saving Test Results Checking the test results that have been saved Saves using TEST mode “ ” ” ” ” “ ” ” HIOKI E.E. CORPORATION ST4030 Ver. 1.00 Header “ ” ” ” Serial No. 123456789 “ ” ”...
Page 181 Saving Test Results Saves using BDV mode “ ” ” ” ” “ ” ” HIOKI E.E. CORPORATION ST4030 Ver. 1.00 Header “ ” ” ” Serial No. 123456789 “ ” ” ” DATE 2019/02/26 Save date and time “...
Page 182: Saving And Importing Test Conditions
Saving and Importing Test Conditions 12.6 Saving and Importing Test Conditions Saves the instrument settings information to USB memory as a settings file. Imports the settings file that has been saved to USB memory and restores the settings. Saving test conditions There are 2 types of test conditions that can be saved.
Page 183 Saving and Importing Test Conditions Saving all table settings (Measurement screen) [FILE] > [PAGE] > [PAGE3/3] [ALL SAVE]. Enter the file name. Reference: “Touch keyboard inputs” (p. 11)
Page 184: Importing Test Conditions
Saving and Importing Test Conditions Importing test conditions You can import the following 2 types of settings file. - User-defined table settings - All settings Importing user-defined table settings (Measurement screen) [FILE] > [PAGE] > [PAGE1/3] Select files with the “TBL” extension. Tap [LOAD].
Page 185 Saving and Importing Test Conditions Importing all settings (Measurement screen) [FILE] > [PAGE] > [PAGE1/3] Select files with the “ALL” extension. Tap [LOAD]. The implementation confirmation window will be displayed. Tap [YES].
Page 186: Editing Files And Folders
Editing Files and Folders 12.7 Editing Files and Folders You can edit the files and folders that have been saved to USB memory. • Formatting USB memory • Deleting files and folders • Creating folders • Changing the names of files and folders •...
Page 187 Editing Files and Folders (Measurement screen) [FILE] > [PAGE2/3] Tap [FORMAT]. The confirmation window will be displayed. Tap [YES]. The confirmation window will be displayed again. Tap [YES].
Page 188: Deleting Files And Folders
Editing Files and Folders Deleting files and folders Deletes the files or folders that have been saved to USB memory. IMPORTANT Deleted files and folders cannot be restored. Check thoroughly before deleting. (Measurement screen) [FILE] > [PAGE] > [PAGE2/3] (When deleting files) (When deleting folders) Select the file or folder to be deleted.
Page 189: Creating Folders
Editing Files and Folders Creating folders Create a folder in USB memory. You can set up to 31 characters max. (Measurement screen) [FILE] > [PAGE 2/3] Tap [FOLDER]. The keyboard will be displayed. Set the folder name. Reference: “Touch keyboard inputs” (p. 11)
Page 190: Changing The Folder Name And File Name
Editing Files and Folders Changing the folder name and file name Changes the name of the files or folders that have been saved to USB memory. (Measurement screen) [FILE] > [PAGE...] Tap a file or folder. Tap [RENAME]. The keyboard will be displayed. Change the name of a file or folder.
Page 191: Information Display
Editing Files and Folders Information display You can use the screen to check the test results files (CSV) and measurements screen files (BMP) that have been saved to USB memory. (Measurement screen) [FILE] Tap the desired file. Tap [VIEW]. Example 1: Measurements screen file (BMP) Example 2: Test results file (CSV)
Page 192 Editing Files and Folders...
Page 193: Speciﬁcations
Specifications 13.1 General Specifications Operating environment Indoor, Pollution Degree 2, altitude up to 2000 m (6562 ft.) Operating temperature and Temperature: 0ºC to 40ºC (32ºF to 104ºF) humidity Humidity: 80% RH or less (no condensation) Storage temperature and Temperature: 10ºC to 50ºC (14ºF to 122ºF) humidity Humidity: 80% RH or less (no condensation)
Page 194: Input Specifications/Output Specifications/Measurement Specifications
Guaranteed accuracy 1 year accuracy period Guaranteed accuracy 1 year period from adjustment made by Hioki Temperature and humidity 23ºC±5ºC, 80% RH or less for guaranteed accuracy Warm-up time 1 hour or longer Power supply frequency 50 Hz/60 Hz ±2 Hz...
Page 195: Functional Specifications
Functional Specifications 13.3 Functional Specifications For the initialization, see the “Default settings table” on the application disc. The set values are saved even after the power supply is turned off. Test conditions settings Applied voltage Sets the values of the impulse voltage applied to the workpiece Settings range: 100 V to 3300 V (resolution: 10 V) Number of applied pulses Sets the number of...
Page 196 Functional Specifications (1) LC and RC value judgments LC and RC values judgments Compares the LC and RC values distribution of the master workpiece and the LC and RC values of the workpiece to be tested. [LCRC AREA] LC and RC values: The quantification of the response waveform as 2 parameters of the LC and RC values Sets the waveform area used in LC and RC values operations.
Page 197: Test Conditions Switching Functions
Functional Specifications Waveform secondary The amount of the high‑frequency component expressed by the test waveform differential detection in the user‑designated area is detected, and judge the discharge by its size. judgments Secondarily differentiates the test waveform, and calculates the surface area of the differentiated waveform as the discharge component amount.
Page 198: Break Down Voltage Test (Bdv) Mode
Functional Specifications Break down voltage test (BDV) mode Test overview Tests the impulse while gradually increasing the voltage applied to the workpiece to examine the break down voltage. Waveform surface area judgments, discharge judgments, and LC and RC values judgments are used in dielectric breakdown judgments. Applied voltage settings Sets the values of the start voltage, max.
Page 199: Safety Protection Function
Functional Specifications Safety protection function Key lock function Disables all settings changes and protects the settings details. Enter the user‑set pass code to unlock the settings. Function settings OFF/ON Pass code 1 to 4-digit number Interlock function Enables test voltage output tests using external input signals. Disables the interlocks by turning ON the external control terminal ―...
Page 200 Functional Specifications Judgment beep setting Sets the items concerning the judgment beeps Judgment beep Settings range: OFF / PASS / FAIL OFF: Beep does not sound regardless of the judgment results PASS: Sounds the beep when the overall judgment result is PASS FAIL: Sounds the beep when the overall judgment result is FAIL...
Page 201: Interface Specifications
Interface Specifications 13.4 Interface Specifications For the initialization, see the “Default settings table” on the application disc. The set values are saved even after the power supply is turned off. External control terminal (EXT.I/O) specifications Connector used D‑SUB 37 pin and socket connection (female) Fixing stud #4‑40 inch screw NPN/PNP Switch settings using the switch on the rear of the main unit.
Page 202 Interface Specifications External control terminal (on instrument) pin layout diagram Signal name Logic Function START Edge Start of measurement (Reserved) – – ーーーーーーーーー INTERLOCK Level Unlocking the interlocks condition TBL1 Level Table number selection TBL3 Level Table number selection...
Page 203: Communications Interface Specifications
Data bit length 8 bits Stop bit Parity bit None Delimiter CR+LF/CR Handshake OFF/X flow Protocol Non-procedure Command system Unique HIOKI SCPI Communications monitor Displays the send and receive status of commands and queries function Settings range: OFF / ON...
Page 204: Usb Host Specifications
Interface Specifications USB host specifications (1) Electrical specifications Connector USB type A connector Electrical specifications USB2.0 (High Speed) Power supply 500 mA max. Number of ports Compatible USB memory USB Mass Storage Class compatible (2) USB host operations Save the test results Function Saves the test results presently displayed onscreen Save items...
Page 205: Test Time (Reference Value)
Interface Specifications Test time (Reference value) Measuring time EOM= (INDEX + software processing time + judgment times) × Number of pulse applications (EOM) Note: There is no software processing time or judgment times in degaussing pulses. During multiple pulse applications, control makes sure that the pulse application intervals are not less than the minimum pulse interval setting.
Page 206: L2250 Clip Type Lead (Option)
L2250 Clip Type Lead (Option) 13.5 L2250 Clip Type Lead (Option) General Specifications Operating environment Indoor, pollution level 2, altitude up to 2000 m (6562 ft.) Operating temperature and Temperature: 0 C to 40 C (32 F to 104 F) humidity Humidity: 80% RH or less (no condensation)
Page 207: Maintenance And Service
To ensure the product can be used over the long term, it is recommended to replace these parts on a periodic basis. When replacing parts, please contact your authorized Hioki distributor or reseller. The service life of parts varies with the operating environment and frequency of use. Parts are not guaranteed to operate throughout the recommended replacement cycle.
Page 208: Troubleshooting
14.1 Troubleshooting If damage is suspected, check the “Before sending the instrument for repair” section before contacting your authorized Hioki distributor or reseller. If the cause is unknown, implement a system reset. All settings will return to the default factory settings.
Page 209 Troubleshooting Measurement issues Symptom Check item or cause Corrective action and reference page Detection wave varies or Is an error displayed? Check the relevant items in the error abnormal display, and remove the cause before measuring. Reference: “14.3 Error Display” (p. 207) [UNCAL] is displayed, implement voltage calibration.
Page 210 Troubleshooting Symptom Check item or cause Corrective action and reference page Error occurs during testing Have you checked the details Check the details of the error icon of the error icon displayed displayed onscreen. onscreen? Reference: “14.3 Error Display” (p. 207) Is probing unstable? An open error such as unstable probing may occur.
Page 211 Troubleshooting Communications Symptom Check item or cause Corrective action and reference page Communications are disabled Have communications been Check that the connector connections [REMOTE] icon is not established? are correct. displayed) Check that the interface settings are correct. Reference: “11 Communications Interface”...
Page 212 Troubleshooting External controls (EXT.I/O) Symptom Check item or cause Corrective action and reference page All operations are disabled Is the wiring correct? When wiring is incorrect, check the EXT. I/O again. • Connector is disconnected • Are the pin numbers incorrect? •...
Page 213: Faq Regarding External Control (Ext. I/O)
Troubleshooting FAQ regarding external control (EXT. I/O) Question Explanation/Method How best to connect to START Short (turn on) the START terminals and ISO_COM terminals using signal inputs? switches and open collector outputs. Which is the input signal common It is the ISO_COM terminal. and the output signal common? Is the common terminal shared Use ISO_COM terminal for the common terminal for both the input and...
Page 214: Initializing The Instrument (Full Reset)
IMPORTANT • Remove the test leads from the workpiece and implement a full reset. • If operations are still not normal even after a full reset, repairs are required. Contact your authorized Hioki distributor or reseller. Turn ON the main power supply switch with the power cord connected.
Page 215: Error Display
Error Display 14.3 Error Display If an error is displayed, repairs are required. Contact your authorized Hioki distributor or reseller. Error during tests Communications Total EXT.I/O Judgment Error type measurement judgment Solution results ERR pin status results Normal Normal Normal –...
Page 216 If generated despite manual cancellation not being implemented, there is a risk of malfunction. Contact your authorized Hioki distributor or reseller. Voltage anomaly detection There is an error in the voltage of the response waveform detected during voltage adjustments.
Page 217 Error Display EXT.I/O Communications Error type* Solution VCAL status ERR pin Waveform is unstable • There is a risk of noise influence. Consider noise countermeasures. • There is a risk that the probing status is unstable. Calibrate the voltages while the probing is stable •...
Page 218 If the situation still does not improve, there is a risk of malfunction. Contact your authorized Hioki distributor or reseller. Displayed in the following cases. • Redo the settings. • If the power supply switch was •...
Page 219: Discarding The Instrument (Removing The Lithium Battery)
Discarding the Instrument (Removing the Lithium Battery) 14.4 Discarding the Instrument (Removing the Lithium Battery) When discarding the instrument, remove the lithium battery, and dispose according to local regulations. The instrument has a built-in lithium battery for backup. Required items Phillips screwdriver (No.
Page 220 Discarding the Device (Removing the Lithium Battery)
Page 221: Appendix
15.1 Block Diagram • Outputs impulse signals from 100 V to 3300 V. This is to prevent voltage drop that occurs when the inductance of the workpiece being tested (DUT) is low due to the fast startup of Hioki’s proprietary technology (A).
Page 222: Circuit Configuration
Circuit Configuration 15.2 Circuit Configuration Circuit operations during tests A overview of the internal circuit of the instrument is shown below. 100 V - 3300 V The circuit operations after testing starts are as described below. The detection circuit gain is set automatically according to the output voltage. The set DC voltage (100 V to 3300 V) is generated by the booster circuit using switching.
Page 223: Effects Of Cable Parasitic Components
3300 V Circuit Configuration Effects of cable parasitic components The equivalence circuit of the workpiece to be tested and the cable as seen from the output terminal is as described below. There is parasitic capacity between the core of the coaxial cable and the shield (Ccable1, Ccable2). Model L2250 capacity is approx.
Page 224: Rack Mount
• Use the screws that were used in installation when shipped from the factory to mount to the rack. If you have lost a screw or find that a screw is damaged, please contact your authorized Hioki distributor or reseller.
Page 225: Metal Fitting Dimensions
Rack Mount Metal fitting dimensions Rack mount base (JIS) SPCC t2.0 4 × M3 countersink Unit: mm...
Page 226 Rack Mount Rack mount base (EIA) SPCC t1.6 9 × M4 press nuts (protruding back) Rack mount panel (EIA) 9 × M4 countersink Unit: mm...
Page 227: Installation Method
Rack Mount Installation method When mounting the instrument on a rack, use a commercially available base for reinforcement. Required items Phillips screwdriver (No. 2), countersunk screws (M3 × 10 mm) ×4 Turn OFF the instrument power supply and remove the cable. Remove the screws ×4 that secure the support feet on the base.
Page 228 Rack Mount Required items Phillips screwdriver (No. 2) Turn OFF the instrument power supply and remove the cable. Remove the screws ×4 that secure the support feet on the base. Remove the top screws ×2, and remove the handle. Slide the instrument from the front of the rack mount fittings until it is all the way in.
Page 229: Dimensions Diagram
Dimensions Diagram 15.4 Dimensions Diagram 348±3 215±1 40.3±1 285.6±0.5 15.3±1...
Page 230: Repeat Accuracy (Reference Value)
Repeat Accuracy (Reference Value) 15.5 Repeat Accuracy (Reference Value) Reproducibility of the voltage generated The max. value of the waveform obtained by applying the trigger with the terminal open is defined as the generated voltage. The typical values of the generated voltage variation during 100 repeat outputs is 0.16% max. when the set voltage is 100 V and 0.09% max.
Page 231: Oscillation Waveform Reproducibility
Repeat Accuracy (Reference Value) Oscillation waveform reproducibility Describes the typical values of waveform variation when implementing impulse tests on the coil. The oscillation waveform when implementing impulse tests on a low-loss 1 mH coil using 1000 V is as described below. First peak voltage Third peak voltage Second peak voltage...
Page 232: Max. Applicable Voltage (Reference Value) According To The Workpiece Inductance
Max. Applicable Voltage (Reference Value) According to the Workpiece Inductance 15.6 Max. Applicable Voltage (Reference Value) According to the Workpiece Inductance The smaller the inductance of the workpiece being tested, the stronger the impact of voltage drop inside the impulse winding tester, so the max. voltage that can be applied to the workpiece being tested will become smaller.
Page 233: Voltage Switching Time (Reference Value)
Voltage Switching Time (Reference Value) 15.7 Voltage Switching Time (Reference Value) If implementing low-voltage impulse tests immediately after high-voltage impulse tests, leave enough time for the voltage inside the tester to fall. The longest interval is when switching from 3300 V to 100 V, and the 100 V impulse is output approx.
Page 234: Waveform Differences (Typical Values) Between Instruments
Instrument differences for the voltage peak value and cycle (zero-cross value) obtained with 14 Model ST4030 instruments when using the same workpiece and test leads are described as reference values.
Page 235 A comparison of the response waveforms for the two 10 µH coils with the greatest differences are shown in the following graph. 10 µH coil response waveform ST4030 instrument A ST4030 instrument B Time [µs] When switching instruments, either set with sufficient space to that the judgment threshold values are not affected by the instrument differences, or recalibrate the voltages and then reset the judgment threshold values.
Page 236: Affects On Measurements According To The Length Of The Test Lead
Affects on Measurements According to the Length of the Test Lead 15.9 Affects on Measurements According to the Length of the Test Lead Even if measuring the same workpiece, the length of the test lead changes the waveform. Following are waveforms with test lead lengths of 1.5 m, 3.0 m, and 5.0 m. 1.5 m 3.0 m 5.0 m...
Page 237: Precautions When Processing Test Leads
3.0 m and 5.0 m are available on a special-order basis. Please contact your your authorized Hioki distributor or reseller. • Test lead shielding, the coaxial connector outer conductor, and the instrument’s enclosure are at ground potential.
Page 238 Precautions when Processing Test Leads Variations in oscillation frequency and variations in measurement cable inductance will have a particularly significant effect on test results when testing low-inductance workpieces. It is recommended that you bundle the 2 cables as shown below to minimize impedance changes due to shape.
Page 239: Index
Index Number Discharge judgments ..........71 Discharge judgments flowchart ........ 71 9151-02 GP-IB Connector Cable (2 m) ....148 DISP ............36, 78, 107 9637 RS-232C Cable (9pin-9pin/1.8 m) ....146 Disposal ..............211 9642 LAN Cable ............. 154 Double action function ..........102 Application disc............
Page 240 Index I/F ................145 Magnetic saturation ..........22 Image save format ..........167 Main power supply............ 16 Importing judgment results ........138 Manual save ............164 Impulse response waveform....... 21, 53 Margin............... 58 INFO ................ 119 Master waveform imports ......... 49 Initialization ..............
Page 241 Index PULSE NUM............. 42 Table functions............25 PULSE PERIOD ............42 TCP/IP ..............153 Terminator............... 155 TEST ..............18, 120 Test conditions settings mode ........18 Test lead ..............14 QUERY ERROR ............. 158 Test mode ..............18 QUICK ..............164 Test pulse ..............
Page 242 Index...

Hioki ST4030 Instruction Manual

1 Overview

2 Preparation for Measurements

3 Switching Test Conditions (Table Functions)

4 Setting the Test Conditions

5 Setting Judgment Conditions

[Discharge]

6 Implementing Tests

7 Break down Voltage Test (BDV)

8 Other Functions

9 System Settings

10 External Control

(Ext. I/O)

11 Communications Interface

12 USB Host

13 Speciﬁcations

14 Maintenance and Service

15 Appendix

Index

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Summary of Contents for Hioki ST4030