Page 1 Calibration and Measurement Guide ShockLine™ MS46122A/B and MS46322A/B Series Vector Network Analyzer MS46122A/B-010 VNA, 1 MHz to 8 GHz, 2-Port MS46122A/B-020 VNA, 1 MHz to 20 GHz, 2-Port MS46122A/B-040 VNA, 1 MHz to 43.5 GHz, 2-Port MS46322A-004, 1 MHz to 4 GHz, 2-Port...
Page 2 Front-2 PN: 10410-00336 Rev. H MS46122A/B-322A/B MG...
Page 3: Table Of Contents
Table of Contents Chapter 1—Calibration Overview Manual Scope............. . 1-1 Chapter Summary.
Page 4 Table of Contents (Continued) Chapter 2—Automatic Calibration Procedures Chapter Overview ............2-1 Automatic Calibration Introduction .
Page 5 Table of Contents (Continued) 2-13 Adapter Removal - M-M or F-F Reference Plane ........2-30 Adapter Removal Overview.
Page 6 Table of Contents (Continued) Hybrid Calibrations ............8-5 Chapter 9—Calibration and Measurement Enhancements Chapter Overview .
Page 7 Table of Contents (Continued) 11-6 Markers Overview............11-10 Marker Button Label Changes.
Page 8 Table of Contents (Continued) 13-3 Setting Up Traditional Frequency Sweeps (Linear and Log) ......13-2 13-4 Maximum and Minimum Power Settings......... 13-2 13-5 Frequency-Based Segmented Sweep .
Page 9: Chapter 1-Calibration Overview
This chapter discusses general calibration requirements and the benefits of different calibration types, algorithms, and routines. General calibration setup and measurement procedures are described. Technical references to Anritsu and other calibration-related articles are also presented where appropriate. Some sections provide cross-references to more detailed explanations and procedures in subsequent chapters.
Page 10: Calibration, Verification, And System Performance Verification
1-3 Related Documentation Calibration Overview Calibration, Verification, and System Performance Verification • MN25208A, MN25218A, MN25408A, MN25418A SmartCal Quick Start Guide – 10410-00741 • MN4765B O/E Calibration Module Technical Data Sheet (TDS) – 11410-00843 • MN4765B O/E Calibration Module Operation Manual (OM) – 10410-00742 •...
Page 11: Calibration Kits, Verification Kits, And Test Port Cables
Calibration Kits, Verification Kits, and Test Port Cables Anritsu and other vendors provide calibration kits for a variety of algorithms and circumstances. In all cases, certain information must be provided to the VNA in order to complete the calibration, but the nature of that information varies by kit and application.
Page 12 1-4 Calibration Kits, Verification Kits, and Test Port Cables Calibration Overview Table 1-1. Calibration Equipment Listing (2 of 2) Part Number Name Specifications Connectors 3652A-1 K(2.92 mm) Calibration Kit With sliding loads TOSLK50A-20 Precision Mechanical Calibration Tee Through/Open/Short/Load K(m) TOSLKF50A-20 Precision Mechanical Calibration Tee Through/Open/Short/Load K(f)
Page 13: Autocal Automatic Calibration Modules
“characterized,” generally by the Anritsu factory but also in a customer laboratory in certain cases. When the same states are re-measured during an actual calibration, and the results compared to the characterization data, an accurate picture can be generated of the behaviors and error terms of the VNA and setup being calibrated.
Page 14: Solt/Solr Kits (365Xx)
The CAL KIT menu is shown here. This menu allows calibration kit details to be loaded from external files (as provided with Anritsu calibration kits), saved to a file (for user-defined cal kits), defaulted (for standard connector types), or simply displayed.
Page 15: Calibration Algorithms
The background on calibration mathematics and theory will only be lightly covered in this section; more information is available in Anritsu Application Notes and in the reference literature. While the VNA is a highly linear receiver and has sufficient spectral purity in its sources to make good measurements, there are a...
Page 16: Calibration Types
1-10 About Calibration Calibration Overview Calibration Types MS46122A/B and MS46322A/B Calibration Types Table 1-2. VNA Mode Type Parameters Calibrated Uses Full 2 Port , and S Most complete calibration Full 1 Port or S Reflection calibration only 1 Path 2 Port and S 1 port reflection plus simple transmission (faster, 2-Port VNA...
Page 17: Calibration Algorithms
Calibration Overview 1-10 About Calibration Calibration Algorithms The use of acronyms for the various calibration algorithms is often inconsistent. The following table presents calibration algorithm acronyms as used in Anritsu documentation. Table 1-3. Calibration Algorithms Calibration Algorithm Description Advantages Disadvantages...
Page 18: Calibration Setup
1-11 Calibration Setup Calibration Overview 1-11 Calibration Setup Before proceeding to the calibrations and some of the alternatives available, there are certain instrument setup issues that must be discussed first since they will affect the performance of all calibrations. In almost all cases, the current VNA settings will be used during the calibration so setting up the VNA as desired beforehand will help.
Page 19: Path 2 Port (Forward Or Reverse)
Calibration Overview 1-12 Types of Calibrations 1 Path 2 Port (Forward or Reverse) In this case, reflection measurements on one port are corrected and one transmission path is partially corrected (load match is not). Here forward means S and S are covered while reverse means S and S covered.
Page 20 1-12 Types of Calibrations Calibration Overview • Directivity Directivity (ed1 and ed2) describes the finite directivity of the bridges or directional couplers in the system. Partially includes some internal mismatch mechanisms that contribute to effective directivity. • Source Match Source match (ep1S and ep2S) describes the return loss of a driving port. •...
Page 21: Line Types (Transmission Media)
Calibration Overview 1-13 Line Types (Transmission Media) 1-13 Line Types (Transmission Media) Part of the calibration definition is the selection of line type. The main purpose of this is to assign a dispersion characteristic that will be needed later. Dispersion is the dependence of the phase velocity on the line with frequency.
Page 22 1-13 Line Types (Transmission Media) Calibration Overview --------------- -   r eff low frequency limit Equation 1-3 At higher frequencies when additional mode behavior becomes important, dispersion must be handled. The dielectric constants (media-based and effective) together with a transition frequency f are used to compute this effect which is heavily dependent on the dielectric thickness: ...
Page 23: Connector Precautions
Before mating, measure the pin depth (Figure 1-3) of the device that will mate with the RF component, using an Anritsu Pin Depth Gauge or equivalent (Figure 1-4). Based on RF components returned for repair, destructive pin depth of mating connectors is the major cause of failure in the field. When an RF component is mated with a connector having a destructive pin depth, damage will likely occur to the RF component connector.
Page 24: Over-Torquing Connectors
1-14 Connector Precautions Calibration Overview On the other hand, if the test device connector measures out of tolerance in the “–” region, the center pin is too short. While this will not cause any damage, it will result in a poor connection and a consequent degradation in performance.
Page 25: Connector Cleaning Instructions
Calibration Overview 1-15 Connector Cleaning Instructions 1-15 Connector Cleaning Instructions To prevent unnecessary early failure and inaccurate measurements, connector interfaces must be kept clean and free of dirt and other debris. With repeated connections and disconnections, the threads and outer conductor mating interface builds up a layer of dirt and metal chips which can severely degrade connector electrical and mechanical performance.
Page 26 1-15 Connector Cleaning Instructions Calibration Overview 1. Remove loose particles on the mating surfaces, threads, and similar surfaces using low-pressure (42 PSI max) compressed air applied at a shallow angle so dirt is not forced down into the connector. Figure 1-6. Low Pressure Compressed Air Cleaning 2.
Page 27 Calibration Overview 1-15 Connector Cleaning Instructions 4. After cleaning with swabs, again use low-pressure compressed air to remove any remaining small particles and dry the connector surfaces. Figure 1-9. Compressed Air Drying 5. With the aid of magnification and adequate lighting, inspect the connectors for damage, cotton strands or other debris.
Page 28 1-15 Connector Cleaning Instructions Calibration Overview 1-20 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 29: Chapter 2-Automatic Calibration Procedures
“transfer calibration.” There are a number of impedance and transmission states in the module designed to be extremely stable in time and these states are carefully “characterized”, generally by the Anritsu factory but also in a customer laboratory in certain cases.
Page 30: Automatic Calibration Terms
2-3 Automatic Calibration Terms Automatic Calibration Procedures Automatic Calibration Terms This section defines various terms used with SmartCal and AutoCal calibration modules and procedures used with the ShockLine VNA. Because in many cases, either module can be utilized using the same setups described in this Note chapter, they are referred to as Calibration Modules or Calibrators.
Page 31 C:\AnritsuVNA folder. In addition, each calibration module can be re-characterized using the VNA, although specifications are only valid if Anritsu has performed the characterization (recommended re-characterization interval is 12 months). A valid 12-term calibration must be active, which is used to characterize the standards within the module.
Page 32: Available Calibrator Modules And Adapters
2-4 Available Calibrator Modules and Adapters Automatic Calibration Procedures Available Calibrator Modules and Adapters The two series of auto-calibration units available are the SmartCal and Autocal modules. Examples are shown Figure 2-2 1. MN25418A SmartCal Module 2. 36585V AutoCal Module Figure 2-2.
Page 33: Autocal Modules And Adapters
Operate LED will illuminate when the unit is at temperature). Allow 90 minutes warm-up time for calibrations. The control cable should be connected to the serial port on the back of the VNA to USB adapter (Anritsu part number 2000-1809-R) with the USB connector attached to the VNA. MS46122A/B-322A/B MG...
Page 34: Smartcal Module
2-4 Available Calibrator Modules and Adapters Automatic Calibration Procedures SmartCal Module The SmartCal module is a plug and play device that automatically powers on and loads calibration coefficients from its on-board memory into the ShockLine software. SmartCal has auto sense and port mapping features, allowing it to auto sense the VNA port number to which it is connected.
Page 35: Adapter Removal
Automatic Calibration Procedures 2-4 Available Calibrator Modules and Adapters Adapter Removal The DUT may require a different connector configuration than is on the current calibrator unit (e.g. F-F DUT and the auto cal is M-F). Adapter removal is one way of handling this situation by performing two auto calibrations with an adapter connected to the AutoCal.
Page 36: Ms46122A/B Typical Calibrator Connections
2-5 MS46122A/B Typical Calibrator Connections Automatic Calibration Procedures MS46122A/B Typical Calibrator Connections The typical F-F calibrator connections for MS46122A/B are shown below in Figure 2-4. For MS46322A/B typical calibrator connections see Figure 2-5. AC Power USB Cable to the Controller PC USB Port MS46122A/B Controller PC...
Page 37: Ms46322A/B Typical Calibrator Connections
Automatic Calibration Procedures 2-6 MS46322A/B Typical Calibrator Connections MS46322A/B Typical Calibrator Connections The typical F-F calibrator connections for MS46122A/B are shown in Figure 2-4. For MS46322A/B typical calibrator connections, see Figure 2-5. AC Power Adapter Cable - Required for AutoCal Module only USB Port Control MS46322A...
Page 38: Using The Calibration Module
2-6 MS46322A/B Typical Calibrator Connections Automatic Calibration Procedures Schematically, this setup is shown in Figure 2-6. SmartCal Test Test or AutoCal Port 1 Port 2 Module K(f-f) Test Cable K(m-f) Serial Cable K(m) K(f) K(f) K(m) K(f) K(m) Reference Planes 1.
Page 39 Automatic Calibration Procedures 2-6 MS46322A/B Typical Calibrator Connections 4. Connect the Calibration Module to its power supply • For SmartCal, power is supplied through the USB cable. • For AutoCal, connect the Calibration module to its power supply and AC power •...
Page 40: Copying The Calibrator Characterization File
2-7 Copying the Calibrator Characterization File Automatic Calibration Procedures Copying the Calibrator Characterization File The AutoCal Characterization File (.acd file) is provided on a USB memory device provided with the AutoCal Module. Procedure 1. Inspect the Calibrator kit and make a note of its serial number. Typical Calibrator Kit serial numbers are six-digit integers such as “123456.”...
Page 41: Loading A Previously Stored Autocal Characterization
Automatic Calibration Procedures 2-8 Loading a Previously Stored AutoCal Characterization Loading a Previously Stored AutoCal Characterization This procedure applies to the AutoCal Module only. Use this procedure if the Calibration Characterization File has already been copied onto the ShockLine VNA hard drive. Procedure 1.
Page 42: Pre-Calibration Instrument Setup
2-9 Pre-Calibration Instrument Setup Automatic Calibration Procedures Pre-Calibration Instrument Setup Use this procedure to setup the minimum required instrument configuration parameters: • Frequency Start • Frequency Stop • Number of Points Any other required measurement parameters must be defined and applied before the Calibration procedure. This section provides a highlight of typical additional measurement parameters.
Page 43 Automatic Calibration Procedures 2-9 Pre-Calibration Instrument Setup 3. Navigate to the FREQUENCY menu: • MAIN | Frequency | FREQUENCY 1 – FREQUENCY Menu Figure 2-8. FREQUENCY Menu - Setting Initial Calibration Parameters 4. On the FREQUENCY menu, click the Start frequency button •...
Page 44 2-9 Pre-Calibration Instrument Setup Automatic Calibration Procedures • The # of Points toolbar appears 11. On the # of Points toolbar, enter the required number of points. • In this example, set the # of Points to 200 and then click Enter on the toolbar. •...
Page 45: Calibration - Full Two Port - Internal Through
Automatic Calibration Procedures 2-10 Calibration - Full Two Port - Internal Through 2-10 Calibration - Full Two Port - Internal Through This procedure performs a calibration using a full two port calibration with an internal through, which is sufficiently accurate for most DUTs. For AutoCal the Calibration Characterization file has already been loaded onto the MS46122A/B or MS46322A/B.
Page 46 2-10 Calibration - Full Two Port - Internal Through Automatic Calibration Procedures 4. Navigate to CAL KIT menu. • MAIN | Calibration | CALIBRATION | AutoCal| AUTOCAL | 2-Port Cal| SMARTCAL SETUP| Thru Type Calibrator Module Connections 5. Connect the Calibrator K(f) connector directly to the VNA left side K(m) Test Port 1. 6.
Page 47 Automatic Calibration Procedures 2-10 Calibration - Full Two Port - Internal Through AC Power Adapter Cable - Required for AutoCal Module only USB Port Control MS46322A Cable Test Port 1 Test Port 2 K(m) K(m) SmartCal Test AutoCal Cable Calibrator K(m-f) Power Supply and Cable (Used by AutoCal Module Only)
Page 48 2-10 Calibration - Full Two Port - Internal Through Automatic Calibration Procedures 17. In this example, the required settings are for a Full 2 Port Calibration, with Auto Sense Module Orientation ON, and Internal Through while running on a VNA in 2-Port Mode. The resultant configuration dialog box is names MODIFY 2-PORT AUTOCAL SETUP.
Page 49 Automatic Calibration Procedures 2-10 Calibration - Full Two Port - Internal Through Figure 2-13. Configured SmartCal 2-Port Menu Setup 21. When ready, click the Begin Cal button. 22. If the Calibration module is connected incorrectly, SmartCal Module Not Detected warning message appears.
Page 50: Calibration - Two Port Cal - True Through
2-11 Calibration - Two Port Cal - True Through Automatic Calibration Procedures 2-11 Calibration - Two Port Cal - True Through This procedure performs a Calibrator procedure using a full two port calibration where a True Through (or external through) is required. Required Equipment •...
Page 51 Automatic Calibration Procedures 2-11 Calibration - Two Port Cal - True Through AC Power USB Cable to the Controller PC USB Port MS46122A/B Controller PC Control Cable Test Port 1 Test Port 2 (AutoCal) K(m) K(m) -or- USB Cable SmartCal (SmartCal) Test AutoCal...
Page 52 2-11 Calibration - Two Port Cal - True Through Automatic Calibration Procedures 1. MS46522B VNA with K or N (m) Test Port Connectors 4. DB9 (m-m) Control Cable (AutoCal) -or- USB Cable (SmartCal) 2. SmartCal (K or N) or AutoCal (K) Calibrator (AutoCal does not support N connectors) 5.
Page 53 Automatic Calibration Procedures 2-11 Calibration - Two Port Cal - True Through Part 1 – Calibration True Thru Procedure Part 2 – Calibration True Thru Procedure 1. VNA Test Port 1 K(m) 7. After initial calibrations, user is directed to remove 2.
Page 54: Connect The True Through
2-11 Calibration - Two Port Cal - True Through Automatic Calibration Procedures 8. Select the Auto Sense Module Orientation check box 9. Click OK to close the dialog box. All existing system setups such as IF Bandwidth, Averaging, and Power Level will be applied during Note the calibration procedure.
Page 55 Automatic Calibration Procedures 2-11 Calibration - Two Port Cal - True Through USB Port MS46122A Controller PC Test Port 1 Test Port 2 K(m) K(m) K(f) - K(f) Adapter Test SmartCal Cable K(m-f) AutoCal Calibrator 1. MS46122A/B with K Test Port Connectors 4.
Page 56 2-11 Calibration - Two Port Cal - True Through Automatic Calibration Procedures Adapter Cable - Required AC Power for AutoCal Module only MS46322A Control Cable Test Port 1 Test Port 2 K(m) K(m) K(f) - K(f) Adapter Test SmartCal Cable K(m-f) AutoCal Calibrator...
Page 57: Calibration Module Characterization
2-12 Calibration Module Characterization Characterization Typically, characterization is performed by Anritsu since the process can be very carefully controlled for maximum accuracy. In certain cases, the customer may wish to perform the characterization themselves but it is important to note that all specifications for the calibration are void and the customer takes responsibility for performing a characterization of adequate quality.
Page 58: Adapter Removal - M-M Or F-F Reference Plane
2-13 Adapter Removal - M-M or F-F Reference Plane Automatic Calibration Procedures 2-13 Adapter Removal - M-M or F-F Reference Plane Adapter Removal Overview Adapter removal for Calibration modules primarily refers to the case of connector gender incompatibility when it is not desired to use test port converters such as when the user has a M-F Calibration module and M-M reference planes are required.
Page 59 Automatic Calibration Procedures 2-13 Adapter Removal - M-M or F-F Reference Plane • Consider the Adapter and Calibration module as an “assembly” for the duration the Calibration procedure. Once assembled, do not break the connection between the adapter and the Calibration module, do not disconnect the assembly from the USB Port, and do not disconnect the assembly from AC Note power.
Page 60 2-13 Adapter Removal - M-M or F-F Reference Plane Automatic Calibration Procedures Part 2 – Calibration Module Adapter Removal Part 1 – Calibration Adapter Removal Procedure Procedure 1. First setup for the Adapter Removal procedure. 8. Second setup for the Adapter Removal procedure. 2.
Page 61 Automatic Calibration Procedures 2-13 Adapter Removal - M-M or F-F Reference Plane 8. Make the following changes to the Modify Calibration Setup dialog box settings: a. Select the Auto Sense Module Orientation check box which allows the Calibration module determine the AutoCal Module left/right cable identification or SmartCal Module Port A/B cable identification.
Page 62 2-13 Adapter Removal - M-M or F-F Reference Plane Automatic Calibration Procedures 2-34 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 63: Solt/Solr Introduction
Chapter 3 — SOLT/SOLR Calibration 3-1 SOLT/SOLR Introduction This chapter describes calibration procedures using the SOLT/SOLR (SOLT/R) calibration algorithms. One of the more common calibration algorithms is based on Short-Open-Load-Thru. This is a defined-standards calibration meaning the behavior of all of the components is specified in advance via data or models. Since the behaviors of all standards are known, by measuring them with the VNA we can define all of the error terms.
Page 64 3-3 Setup SOLT/SOLR Calibration Setup The coaxial setup dialog for SOLT/R full 2-Port calibration is shown in below in Figure 3-1. 1. Through selected allows user entries for length, line impedance, line loss and frequency. 2. Reciprocal selected allows user entry for length. 3.
Page 65 SOLT/SOLR Calibration 3-3 Setup 1. A waveguide SOLT/R setup is shown in Figure 3-2 and a setup for microstrip is shown in Figure 3-3. 1. Through Line selected allows user entries for length, line impedance, line loss and frequency. 2. Reciprocal selected allows user entry for length. 3.
Page 66 3-3 Setup SOLT/SOLR Calibration 1. Through Line selected allows user entries for length, line impedance, line loss and frequency. 2. Reciprocal selected allows user entry for length. 3. S2P Thru selected provides buttons for loading, viewing, and characterization (to generate S2P files). Figure 3-3.
Page 67 The standards information dialog for SOLT/R is shown in Figure 3-4. Figure 3-4. STANDARD INFO (SOLT/R) For cal kits loaded from Anritsu cal kit files, the model terms are not editable. When using user-defined cal kits, the model terms can be edited. MS46122A/B-322A/B MG PN: 10410-00336 Rev: H...
Page 68 SOLT/SOLR Calibration The standards information for microstrip does not change but the microstrip media information must be either user-defined (Figure 3-5) or selected from an Anritsu microstrip cal kit (Figure 3-6, typically used with Anritsu Universal Test Fixtures). Figure 3-5.
Page 69 SOLT/SOLR Calibration 3-3 Setup For waveguide, the model parameters and the media parameters are combined in one dialog (Figure 3-7). Figure 3-7. USER-DEFINED WAVEGUIDE (SOLT/R) Information Dialog Box MS46122A/B-322A/B MG PN: 10410-00336 Rev: H...
Page 70 3-4 SOLT/SOLR Calibration SOLT/SOLR Calibration SOLT/SOLR Calibration The following example presumes an MS4652xB Series VNA with K or N connectors. A different connector can be selected in step 4 if a different model/configuration is being used. It is assumed that a M-F cable is connected to port 2 so that a M (port 1) and F (port 2) reference plane pair is available.
Page 71 SOLT/SOLR Calibration 3-4 SOLT/SOLR Calibration 1. Through Line selected allows user entries for length, line impedance, line loss and frequency. 2. Reciprocal selected allows user entry for length. 3. S2P Thru selected provides buttons for loading, viewing, and characterization (to generate S2P files). Figure 3-8.
Page 72 3-4 SOLT/SOLR Calibration SOLT/SOLR Calibration 9. Click on Done. The calibration is now completed and turned on where the Cal Status button on the CALIBRATION menu is set to ON. 3-10 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 73: Chapter 4-Offset Short (Sslt) Calibration
Chapter 4 — Offset Short (SSLT) Calibration SSLT Introduction This chapter describes calibration methods and procedures using the SSLT calibration algorithm. The SSLT calibration differs from an SOLT/SOLR (SOLT/R) calibration by the differing offset lengths between two shorts which are used to help define reflection behavior instead of an open and short. Because of this, the frequency range is limited since, at DC and at higher frequencies, these reflect standards will look the same.
Page 74 Figure 4-2. Defined, un-editable values would be present for Anritsu-defined cal kits. Figure 4-2. Typical parameters for an Offset Short Calibration A simplified short model is used for waveguide, with only an offset length and no inductance terms since usually those terms are small.
Page 75: Sslt Calibration Example
Offset Short (SSLT) Calibration 4-2 SSLT Calibration Example SSLT Calibration Example The following example presumes a MS46122A/B-322A/B is being used with waveguide adapters (since SSLT is commonly used with waveguide). In this example, a full 2-Port SSLT calibration is performed although a number of other options are available.
Page 76 4-2 SSLT Calibration Example Offset Short (SSLT) Calibration a. Reference impedance defaults to 50 ohms. Although this does not represent the waveguide impedance, it is commonly used for conventional Smith chart referencing. Reference impedance can be changed here for certain waveguide applications or it can be changed later on a per trace basis from the DISPLAY menu.
Page 77: Chapter 5-Triple Offset Short (Ssst) Calibration
Chapter 5 — Triple Offset Short (SSST) Calibration SSST Introduction This chapter describes calibration using the triple offset short (SSST) algorithm. The next step in this progression is to remove the load so that the entire reflection space is defined by three shorts of varying offset lengths.
Page 78 5-2 SSST and Reflectivity Error Terms Triple Offset Short (SSST) Calibration The setup and standards information dialogs for SSST are shown in Figure 5-1 Figure 5-2 for a 2-Port calibration. Figure 5-1. TWO PORT CAL SETUP (SSST, COAXIAL) For one port calibrations, only one of the port definitions (unless reflection-only calibrations are being performed for both ports 1 and 2) will be present and the through line section will not be present.
Page 79 Triple Offset Short (SSST) Calibration 5-2 SSST and Reflectivity Error Terms Variations for other line types are similar to those for SOLT/R. For waveguide, the media and standards information are again combined into one dialog (Figure 5-3). Figure 5-3. USER DEFINED WAVEGUIDE (SSST) Information Dialog Box MS46122A/B-322A/B MG PN: 10410-00336 Rev: H...
Page 80: Ssst Calibration Example
5-3 SSST Calibration Example Triple Offset Short (SSST) Calibration SSST Calibration Example The following example presumes an MS46122A/B or MS46322A/B Series VNA in a broadband setup with K connectors. A different connector can be selected in Step 4 below if a different model/configuration is being used.
Page 81 Triple Offset Short (SSST) Calibration 5-3 SSST Calibration Example 5. In the TWO PORT CAL SETUP (SSST, COAXIAL) dialog box, set the following calibration components: a. Reference impedance defaults to 50 ohms. This establishes the reference impedance for reference plane changes and Smith chart plotting but can be changed later on a per-trace basis. b.
Page 82 5-3 SSST Calibration Example Triple Offset Short (SSST) Calibration PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 83: Chapter 6-Lrl/Lrm Calibration
Chapter 6 — LRL/LRM Calibration 6-1 LRL/LRM Introduction This chapter describes LRL/LRM calibration algorithms and procedures. The LRL/LRM family of calibrations relies more on the fundamental behavior of certain components (primarily transmission lines) than it does on characterized/modeled behaviors of components. It makes less use of redundancy, so fewer measurements are needed to complete a calibration, but it is also less tolerant of poor or non-repeatable measurements.
Page 84 6-2 LRL/LRM Comparison LRL/LRM Calibration 360 f L     -------------------------- - Equation 6-1 Where L is in meters, v is the phase velocity of the line (= 2.9978 10 m/s = c for air dielectric) and f can be any frequency in the range of interest, expressed in Hz.
Page 85 LRL/LRM Calibration 6-2 LRL/LRM Comparison Typical parameters - One-Band LRM calibration Figure 6-1. TWO PORT CAL SETUP (LRL/LRM, COAXIAL) Dialog Box Because of the phase restrictions discussed above, each LRL calibration is fundamentally band-limited to something on the order of an 8:1 to 17:1 frequency range (and some users may restrict it further for measurements requiring very low uncertainties when the line losses are low).
Page 86 6-2 LRL/LRM Comparison LRL/LRM Calibration If the first band must work down to 200 MHz with a 20 degree L limit, then the first L=8.333 cm so the second line should be 18.333 cm long. This first band, using the 160 degree limit, should be able to reach 1.6 GHz.
Page 87 LRL/LRM Calibration 6-2 LRL/LRM Comparison Typical parameters - Bands 1, 2, and 4: LRL, Bands 3 and 5: LRM Figure 6-2. TWO PORT CAL SETUP (LRL/LRM, COAXIAL) Dialog Box Typical parameters - Defining the Load for LRM (match info) Figure 6-3. USER DEFINED MATCH DEVICES Dialog Box MS46122A/B-322A/B MG PN: 10410-00336 Rev: H...
Page 88: Reflection Offset Length And Reflection Type
6-2 LRL/LRM Comparison LRL/LRM Calibration Typical parameters - One Band LRM Using Two Reflects Figure 6-4. TWO PORT CAL SETUP (LRL/LRM, COAXIAL) Dialog Box Reflection Offset Length and Reflection Type Some information is requested about the reflection although a full characterization is not needed. The information is used in some root-choice activities and it only needs to be known if the reflect behaves more like an open or a short (since typically opens and shorts are used as the reflect standard).
Page 89: Lrl/Lrm Calibration Step-By-Step Example
LRL/LRM Calibration 6-3 LRL/LRM Calibration Step-by-Step Example 6-3 LRL/LRM Calibration Step-by-Step Example The following example presumes a MS46122A/B and MS46322A/B ShockLine VNA are on a coaxial setup. On-wafer scenarios can be accommodated by modifying the entries in Step 4 below. It is assumed that a mating reference plane pair can be created (either MF in coax or zero length-thru compatible).
Page 90: Procedure
6-3 LRL/LRM Calibration Step-by-Step Example LRL/LRM Calibration 1. CALIBRATION menu 5. CAL SETUP menu 2. CALIBRATE menu 6. CAL METHOD menu 3. MANUAL CAL menu 7. LINE TYPE 4. TWO PORT CAL menu Figure 6-5. Calibration Menu Set for LRL/LRM Coaxial (2 of 2) Procedure The same menu structure appears for Tab A and Tab B.
Page 91 LRL/LRM Calibration 6-3 LRL/LRM Calibration Step-by-Step Example 5. On the TWO PORT CAL SETUP (LRL/LRM, COAXIAL) dialog box, set the following: a. The Reference Impedance establishes the impedance for the load definition, reference plane changes and Smith chart plotting. The default is 50 ohms. b.
Page 92 6-3 LRL/LRM Calibration Step-by-Step Example LRL/LRM Calibration 1. The TWO PORT CAL menu with link/completion 4. Optional ISOLATION Port 1-2 Menu buttons for Port 1-2 Reflective Devices, Port 1-2 5. TWO PORT CAL menu after all calibration Lines/Matches, and Isolation (Optional). procedures successfully completed.
Page 93: Hints And Suggestions
LRL/LRM Calibration 6-4 Hints and Suggestions 6-4 Hints and Suggestions Since there are a number of choices involved in setting up the LRL/LRM family of calibrations, some additional hints and points of emphasis may be of assistance: • Reflect offset lengths are referenced to the ends of Line 1. These lengths are all air-equivalent lengths. The line length entries for the transmission lines are also air-equivalent.
Page 94 6-4 Hints and Suggestions LRL/LRM Calibration Figure 6-9. TRL/LRL is more sensitive to differences between the line impedances than to the absolute line impedance (although problems on that will shift the reference impedance of the calibration). 6-12 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 95: Chapter 7-Adapter Removal Calibrations
Chapter 7 — Adapter Removal Calibrations 7-1 Introduction This chapter describes various methods for handling cases of non-insertable DUTs. In some coaxial cases, this can be handled with a special class of adapter removal calibrations. While it is usually desired to perform a 2-Port calibration with mating connectors of the same type, this is sometimes not possible based on the connectors of the device to be tested.
Page 96: Caveats And Limitations
7-2 Two Related Sets of Reference Planes Adapter Removal Calibrations 1. Test Port 1 5. Original Reference Plane 2’, when adapter is connected to Port 2 Test Cable 2. Test Port 2 6. Original Reference Plane 1’, when adapter is 3.
Page 97 Adapter Removal Calibrations 7-2 Two Related Sets of Reference Planes In the upper half of Figure 7-3, one can see how the first frequency step size would be adequate for this setup. The phase change between points is well below 180 degrees so linear fitting will not run into aliasing problems. In the second setup (next page), the phase change between points is nearly 360 degrees so one may start to run into aliasing issues with the 0-entry-length-estimation.
Page 98 7-2 Two Related Sets of Reference Planes Adapter Removal Calibrations Figure 7-3. Uncalibrated phase plots from an example setup are shown here for two different step sizes. In the second case, the automatic length estimation may run into aliasing problems if much more length is added.
Page 99: Performing An Adapter Removal
Adapter Removal Calibrations 7-3 Performing an Adapter Removal Performing an Adapter Removal Two full 2-Port calibrations must be performed and those calibrations (plus front panel setups) must be stored to the current directory on a USB memory device or hard disk. The setups for the two calibrations should be the same in terms of frequency range and number of points.
Page 100: Example Adapter Removal
7-3 Performing an Adapter Removal Adapter Removal Calibrations Example Adapter Removal The following example should help illustrate the use of the adapter removal utility. An adapter was constructed with about 3 dB of loss and 180 degrees of phase shift at 3 GHz. This leads to an estimate of the delay length of: ...
Page 101 Adapter Removal Calibrations 7-3 Performing an Adapter Removal The through without the adapter was connected after executing the adapter removal utility and the near-perfect through values for S show that the algorithm successfully removed the adapter from the calibration. As expected, the thru without the adapter shows nearly zero insertion loss and phase shift, and a very good match.
Page 102 7-3 Performing an Adapter Removal Adapter Removal Calibrations PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 103: Chapter 8-Other Calibration Procedures
Chapter 8 — Other Calibration Procedures 8-1 Overview of Other Calibration Procedures This chapter provides other calibration procedures not covered in the previous material. Thru Update, Interpolation and Hybrid Cal are discussed. Through (Thru) Update A common question related to calibrations is how often the calibration must be redone. The frequency of re-calibration depends on the environment (both in terms of temperature stability and in terms of the cable/fixture construct that is being used).
Page 104: Interpolation
8-3 Interpolation Other Calibration Procedures Interpolation Typically, calibration is done for a specific list of frequencies and then measurements are made over that same list of frequencies. While this is most accurate, it is not necessarily convenient. If, for example, one is measuring a variety of narrow bandpass filters of different center frequencies, it may be useful to be able to zoom in to look at the passband of each filter without re-calibrating.
Page 105 Other Calibration Procedures 8-3 Interpolation As a general rule, the smaller the step size used during the calibration, the more successful the interpolation will be. It is desirable to keep the step size smaller than the ripple period of the coefficients which will typically range from 50 MHz to 500 MHz.
Page 106 8-3 Interpolation Other Calibration Procedures Now, consider two different sets of hardware, both with a nominal tracking coefficient of unity (for simplicity). At lower frequencies, set 1 may be readily achieved, but at mm-wave frequencies, set 2 may be more practical. The important point is that the interpolation effects are setup-dependent.
Page 107: Hybrid Calibrations
Other Calibration Procedures 8-4 Hybrid Calibrations Hybrid Calibrations The hybrid calibration is a method of taking a pair of distinct 1-Port calibrations, together with some additional measurements, to create a new full 2-Port calibration. The “hybrid” part of the definition comes in that the two 1-Port calibrations may be with completely different connector types, media types, and/or cal algorithms.
Page 108 8-4 Hybrid Calibrations Other Calibration Procedures As an example of the mixed-media case where this type of hybrid calibration is helpful, consider a desired coaxial-waveguide combination reference plane. One could perform adapter removal processing as discussed in Chapter 8, but there are occasions where in one of the media planes, one can only perform one port calibrations (due to physical arrangement of the hardware, calibration kit availability, or other reasons).
Page 109: Chapter 9-Calibration And Measurement Enhancements
Chapter 9 — Calibration and Measurement Enhancements 9-1 Chapter Overview This chapter provides a description of functions that provide additional calibration, post-processing, and display options that increase the usefulness of the instrument data. The topics described include: embedding de-embedding, reference-plane control and modification, and Impedance transformations. These functions go beyond the basic calibration and display tools to help post-process the data in a way that is useful.
Page 110: Chapter Overview
9-1 Chapter Overview Calibration and Measurement Enhancements In addition, there are some clerical tasks to describe including the order of virtual operations and some conversions to other parameter formats (impedances and admittances for example). The measurements menu that contains the majority of these functions is shown below (Figure 9-3, “Reference Plane Control”...
Page 111: Embedding/De-Embedding (E/De)
Calibration and Measurement Enhancements 9-2 Embedding/De-embedding (E/DE) Embedding/De-embedding (E/DE) The MS46122A/B and MS46322A/B is equipped with an embedding/de-embedding system. De-embedding is generally used for removal of test fixture contributions, modeled networks, and other networks described by S-parameters (s2p files) from measurements. Similarly, the embedding function can be used to simulate matching circuits for optimizing amplifier designs or simply adding effects of a known structure to a measurement.
Page 112: Embedding On/Off Control
9-2 Embedding/De-embedding (E/DE) Calibration and Measurement Enhancements Embedding On/Off Control E/DE can be turned on and off with the Embed/De-embed toggle button at the top of the main MEASUREMENT menu as shown above (Figure 9-1) or with a duplicate toggle button at the top of the EMBEDDING control menu as shown below (Figure 9-2).
Page 113 Calibration and Measurement Enhancements 9-2 Embedding/De-embedding (E/DE) Clicking on Edit Network displays the main EDIT EMBEDDING/DE-EMBEDDING dialog box. An example with Embedding, L Circuit, and L(S) selected, but with no network information entered is shown in the figure below. Figure 9-3. EDIT EMBEDDING/DE-EMBEDDING (2 PORT DUT) Dialog Box - L Circuit MS46122A/B-322A/B MG PN: 10410-00336 Rev: H...
Page 114 9-2 Embedding/De-embedding (E/DE) Calibration and Measurement Enhancements Embedding and de-embedding is setup for each port and the networks used on the two ports are Note entirely independent. Also, any number of networks can be cascaded at a given port and the first network entered is always nearest the DUT.
Page 115: Types Of E/De Networks
Calibration and Measurement Enhancements 9-2 Embedding/De-embedding (E/DE) Types of E/DE Networks There are five types of networks that can be entered: • Inductive elements • Capacitive elements • Resistive elements • Transmission lines • .S2P-defined, file-based networks In the Edit Embedding/De-embedding dialog box in Figure 9-3 above, the radio button for entering an LC network has been selected.
Page 116: Entry Mode For Resistive Elements
9-2 Embedding/De-embedding (E/DE) Calibration and Measurement Enhancements Entry Mode for Resistive Elements The entry mode for these resistive elements is shown in the E/DE dialog box below (Figure 9-6). Both series (denoted by an (S)) and shunt (to ground) elements (denoted by a (P) for parallel) are allowed and selectable with the radio buttons.
Page 117: Entry Mode For Transmission Lines
Calibration and Measurement Enhancements 9-2 Embedding/De-embedding (E/DE) Entry Mode for Transmission Lines Transmission line entry is illustrated in the E/DE dialog box below (Figure 9-7). As with transmission line entry in other parts of the system, loss can be entered along with a reference frequency. The loss at other frequencies will be computed using: ...
Page 118: Entry Mode For S2P Defined File-Based Networks
9-2 Embedding/De-embedding (E/DE) Calibration and Measurement Enhancements Entry Mode for S2P Defined File-Based Networks Finally, direct file entry of network S-parameters is shown in the E/DE below (Figure 9-8). A standard S2P file format is assumed and the headers will be interpreted. The system will attempt to interpolate the provided data the best it can in the context of the current channel sweep range.
Page 119: Saving And Recalling Embedding Network Configuration
Calibration and Measurement Enhancements 9-2 Embedding/De-embedding (E/DE) Test Test Port 1 Port 2 .s2p File A .s2p File B 1. Test Port 1 4. .s2p File B – Port 2 to left, Port 1 to right. 2. Test Port 2 5.
Page 120: Reference Plane Control
Reference Plane Control Calibration and Measurement Enhancements 9-3 Reference Plane Control A simplified means of performing de-embedding (and embedding in some contexts) can be accomplished using reference plane control. The function of this control is to remove transmission line lengths from the data. By entering a time or distance, this length of line will be removed (negative lengths are allowed to effectively add length).
Page 121 Calibration and Measurement Enhancements Reference Plane Control Easy to Fit Phase Function Frequencies Being Measured Inaccurate Fit 1. Easier to Fit – Small frequency step size compared to 3. Phase Function phase function is easier to fit and yields higher 4.
Page 122: Impedance Transformation
9-4 Impedance Transformation Calibration and Measurement Enhancements Impedance Transformation Most VNA calibrations are performed referenced to 50 ohms as this is usually set by the calibration kit. While some calibration kits exist for other impedances (75 ohm N and F connectors for example), they are not common and a custom impedance may be of interest.
Page 123: Processing Order
Calibration and Measurement Enhancements 9-5 Processing Order Processing Order With so many post-processing choices available, it is important to note that the order of operations can matter. A few things are fixed by the way computations are performed and others are changeable to suit user needs. The sequence of computations is as follows for S-parameter measurements: •...
Page 124: Conversions
9-6 Conversions Calibration and Measurement Enhancements Conversions While S-parameters (or the un-ratioed wave parameters) are usually the display variables of interest, conversions to other parameters may be required and are possible with the ShockLine VNA. 1/S is sometimes plotted, particularly for oscillators and other negative resistance devices, where it is desirable to fold the outside of the Smith chart back to the inside.
Page 125 Calibration and Measurement Enhancements 9-6 Conversions 1. DISPLAY Menu (on left). 2. CONVERSION Menu (on right). Figure 9-14. Conversion Control Menu The calculations are a function of the current reference impedance which defaults to the calibration reference impedance unless impedance transform has been used (see the section above on “Reference Plane Control”...
Page 126 9-6 Conversions Calibration and Measurement Enhancements 9-18 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 127: Chapter 10-Verification
ShockLine™ MS46122A/B or MS46322A/B Series VNA Operation Manual, sometimes a simpler procedure can be useful. Verification kits available from Anritsu verify the measurement capabilities of the instrument by analyzing the measurement of artifacts that are traceable to national standards laboratories.
Page 128: Metric Of Comparison
The “known” part of this discussion involves a process termed characterization performed on the same devices by Anritsu. Through a traceable process, a VNA at the factory is calibrated and validated against controlled standards before being used to measure the devices that go into the verification kit that is delivered to the user.
Page 129: Verification Kit Creation Process
A national standards laboratory (through standards and measured artifacts) helps validate the calibration and Anritsu which is then used to characterize the verification kit sent to the user. It is important to note that the results are influenced by not only the instrument, the calibration kit, and the verification kit, but also the cables, the environment (temperature, humidity and vibration), connector quality, and the care exercised by the user during calibration and measurement.
Page 130: Verification Kit Components
10-3 Verification Kit Components Verification 10-3 Verification Kit Components The verification kits for the ShockLine Series VNAs are: • 3663-2 MS46122A, MS46322A Verification Kits (for Type N Connectors) • 3668-2 MS46122A, MS46322A Verification Kit (for Type K Connectors) • 3663-3 MS46122B, MS46322B, MS4652xB Verification Kits (for Type N Connectors) •...
Page 131 • PVS Quick Start Guide – 10410-00766 Other combinations of calibration kits with verification kits are not supported. Verification kits based on other connector types such as GPC-7 exist for other Anritsu VNAs but the MS46122A/B-322A/B verification software does not support all of these.
Page 132: Verification Kit Software
The application provided with the verification devices prompts calibration of the VNA, acquires measurements of the devices, and compares those measurements against the characterization values generated by Anritsu (these values ship with the verification kit). The software also generates reports indicating the outcome of the verification.
Page 133: Chapter 11-Measurement Setup Requirements
Chapter 11 — Measurement Setup Requirements 11-1 Chapter Overview This chapter provides general measurement setup fundamental concepts, requirements, and options for different types of measurements. Specifically, this chapter describes traces, limit lines, external analog input/output, averaging and smoothing, and organizes their configuration in the same hierarchy. Traces are concepts that represent a data group with a maximum of 16 traces for MS46122A/B and MS46322A/B.
Page 134: Measurement General Concepts
11-3 Measurement General Concepts Measurement Setup Requirements 11-3 Measurement General Concepts The hierarchy of setups is illustrated in Figure 11-1. At the highest tier is per-system, these are variables that apply to all measurements on a given physical instrument. There are very few of these variables and they include: •...
Page 135: Channels And The Channel Menu
The second tier is that of the channel. As mentioned in the overview, the channel can almost be thought of as a separate virtual VNA. Although this term has been used differently in the past with other Anritsu VNAs, in the MS46122A/B-322A/B Series family, the variables include a frequency list, calibrations and sweep control The channel menu itself is fairly simple.
Page 136 11-4 Channels and the Channel Menu Measurement Setup Requirements Once a given number of channels is selected, the layout of those channels is selected in a submenu shown in Figure 11-3. Note that selecting a layout with more channels will update the channel count since gaps in the sweep processing are not allowed.
Page 137 Measurement Setup Requirements 11-4 Channels and the Channel Menu Once the number of channels and the layout has been selected, it then remains to define each of the channels. The sweep control parameters apply to the active channel so one may cycle through the channels entering values as needed.
Page 138: Traces
11-5 Traces Measurement Setup Requirements 11-5 Traces Up to 16 traces can be specified for display using the # of Traces button of the TRACE menu (Figure 11-4), with sequential trace activation provided by the Trace Next and Trace Previous buttons. Traces can be directly activated by clicking on the graph title, as shown in Figure 11-5.
Page 139 Measurement Setup Requirements 11-5 Traces The TRACE LAYOUT menu (Figure 11-6) provides 12 trace layout options that support up to 16 traces in any configuration. If the number of traces specified in the # of Traces toolbar the exceeds the number of graphs in the selected layout, the extra traces are displayed sequentially as overlays divided among the available graphs, with priority assigned to the first graph.
Page 140: Per-Trace Variables
11-5 Traces Measurement Setup Requirements Per-Trace Variables Per-trace variables include: • Trace format (graph type) • Trace memory and math functions (to include inter-trace math which is sort of a hybrid but is defined on a per-trace basis) • Scale (although autoscale can also be per-channel or per-system) •...
Page 141: Complex Trace Setup Example
Measurement Setup Requirements 11-5 Traces Complex Trace Setup Example A fairly complex trace setup example is shown in Figure 11-8 below. This example covers multiple graph types and scaling options as well as different transformations applied to the data in certain traces. Symbols at the end of the annotation line provide information about these trace definitions.
Page 142: Markers Overview
11-6 Markers Overview Measurement Setup Requirements 11-6 Markers Overview The ShockLine VNA provides up to thirteen markers per trace of which twelve can be direct markers and one a reference marker. Each marker can be individually controlled on/off and positioned as required. If the reference marker is off, each marker provides measurement data based on its display position.
Page 143: Turning All Markers Off
Measurement Setup Requirements 11-6 Markers Overview Turning All Markers Off All markers can be turned off either manually one-by-one or at the MARKERS [2] menu, by clicking the All Markers Off button. Navigation • MAIN | Markers | MARKERS [1] | More Markers | MARKERS [2] | All Markers Off Naming Conventions for Marker Buttons and Toolbars The following conventions are used to label the marker buttons and toolbars in this section.
Page 144 11-6 Markers Overview Measurement Setup Requirements The example below Figure 11-9, depicts a two trace display. On the top trace display, the individual marker [9] is selected, and repositioned. In the bottom trace, the marker data display is repositioned 1. Trace 1 marker data display with nine active markers 3.
Page 145: Hold Functions
Measurement Setup Requirements 11-7 Hold Functions 11-7 Hold Functions Hold events and triggering events are per-channel These menus are shown in Figure 11-10 for hold events. The HOLD FUNCTIONS menu is available from the SWEEP SETUP menu. • MAIN | Sweep | SWEEP SETUP | Hold Functions | HOLD FUNCTIONS .Select Hold Conditions provides a toggle for RF on or off.
Page 146: Overview Of Limit Lines
11-8 Overview of Limit Lines Measurement Setup Requirements 11-8 Overview of Limit Lines There are a number of relatively simple measurement topics that require some comment but are not large topics by themselves. These issues have been grouped into this miscellaneous section to ensure that the information is readily available.
Page 147: Test Result Sign
Measurement Setup Requirements 11-9 Limit Lines Test Result Sign The Test Result Sign button enables a large graphic displaying the pass/fail result. This will be in the middle of the screen and is visible from a large distance. The Limit Test must be on for this sign to appear. If any limit tests fail, the large fail sign will appear with a notation of which channel has failed.
Page 148 11-9 Limit Lines Measurement Setup Requirements An example limit line table is shown in Figure 11-14 using two upper limit segments and two lower limit segments. For each segment, a number of things need to be entered: Upper or lower: Use the pull-down to indicate if it is an upper limit or lower limit.
Page 149: Ripple Limit Lines
Measurement Setup Requirements 11-10 Ripple Limit Lines 11-10 Ripple Limit Lines Limit lines are a powerful tool to help quickly compare a set of measured DUT data against specifications or expectations. All limit testing is per trace and, depending on firmware version, limit testing may only be available on rectilinear graph types.
Page 150 11-10 Ripple Limit Lines Measurement Setup Requirements Editing of Ripple Limit Lines The editing of the Ripple Limit lines is controlled on the one submenu and that is shown in Figure 11-15. When entering this menu, the Edit Ripple Limit Line table will appear at the bottom of the screen (not unlike the multiple source and segmented sweep tables).
Page 151: Response Menu
Measurement Setup Requirements 11-10 Ripple Limit Lines Response Menu These are selectable on the response menu as shown in Figure 11-17 below. The submenu allows a choice of which port is driving during that particular analog in measurement. This port selection may be important particularly with the use of external power detectors.
Page 152: Averaging And Smoothing
11-11 Averaging and Smoothing Measurement Setup Requirements 11-11 Averaging and Smoothing Overview Averaging and smoothing are covered to a considerable extent in the operations manual but there are some measurement-related impacts that should be discussed in this section. The control menu is repeated in Figure 11-18 for reference.
Page 153 Measurement Setup Requirements 11-11 Averaging and Smoothing Averaging Type The Averaging Type button toggles between per-point and per-sweep averaging. • Per-Point Averaging Per-point averaging acquires additional samples at each frequency (or power) point and performs the averaging process at that time. In this sense, it is quite similar to an IFBW reduction (adding 10 per point averages is equivalent to a 10x reduction in IFBW).
Page 154 11-11 Averaging and Smoothing Measurement Setup Requirements 11-22 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 155: Chapter 12-Measurement - Time Domain (Option 002)
Chapter 12 — Measurement - Time Domain (Option 002) 12-1 Chapter Overview This chapter provides time domain measurement guidelines and procedures. General descriptions, key concepts, and example procedures are prevented for time domain measurement modes of low pass, bandpass and gating. 12-2 Introduction The time domain option offers the ability to transform the native frequency domain data of the MS46122A/B and MS46322A/B into time domain information for TDR-like displays, distance-to-fault analysis, and general...
Page 156: Basic Time Domain Modes
12-3 Basic Time Domain Modes Measurement - Time Domain (Option 002) There are a significant number of choices in how to configure the transformations that this section will cover. To begin, time domain is a per-trace invocation so that frequency domain and time domain traces can be freely mixed on any response parameter.
Page 157: General Concepts
Measurement - Time Domain (Option 002) 12-4 General Concepts 12-4 General Concepts Chirp-Z Transform The time domain functionality is provided by a chirp-Z transform (in most cases) of the available frequency domain data for that parameter. Since the transform simply treats the frequency domain values as input data, any parameter can be transformed.
Page 158: Low Pass Mode
12-5 Low Pass Mode Measurement - Time Domain (Option 002) 12-5 Low Pass Mode Low pass mode assumes the existence of data near DC which enables the ability to compute step responses and to create a pure real transform. While any graph type can be used (except Imaginary which would have a flat line), Real is sometimes the most valuable since information about the defect can be determined.
Page 159: Range Setup Menu Functions
Measurement - Time Domain (Option 002) 12-5 Low Pass Mode Range Setup Menu Functions The Range Setup menu for low-pass time domain is shown in Figure 12-4. The top button, Display Unit, toggles between Time and Distance and is a duplicate button to the Display Unit button on the TIME DOMAIN menu (Figure 12-1).
Page 160: Dc Term Menu
12-5 Low Pass Mode Measurement - Time Domain (Option 002) 1 –        X DC X sweepRange ImpulseResponse 1 –          ImpulseResponse A X DC X sweepRange ...
Page 161: Window Shape Menu
Measurement - Time Domain (Option 002) 12-5 Low Pass Mode There are options on how the extrapolation is done, as shown in Figure 12-6. Figure 12-6. The DC Term EXTRAPOLATION Menu The default method, Mag-Phase, extrapolates both portions as would be expected and is energy-conserving. For cases where the start frequency is low and the DUT loss changes slowly over frequency, sometimes the magnitude may be assumed constant and only the phase function need be extrapolated (most common with long cable assemblies).
Page 162 12-5 Low Pass Mode Measurement - Time Domain (Option 002) Since the frequency range of the VNA is finite, the frequency domain data will have a discontinuity at the stop frequency. This introduces side lobes in the time domain data that can obscure smaller defects and hamper separation of defects.
Page 163 Measurement - Time Domain (Option 002) 12-5 Low Pass Mode The Advanced Window selection button brings up the dialog shown in Figure 12-9 that has the previous four choices along with two new parameterized windows, Kaiser-Bessel and Dolph-Chebyshev. Figure 12-9. Advanced Window Setup Dialog The dialog for advanced window setup makes two new window choices available (Kaiser-Bessel and Dolph-Chebyshev).
Page 164 12-5 Low Pass Mode Measurement - Time Domain (Option 002) The approximate relationship between these parameters and the main lobe width (null-to-null) is suggested in Figure 12-11. Here, everything is scaled relative to a rectangular window (a nominal window is at 2, a low side-lobe window is at 3, and a minimum side-lobe window is at 4 on this scale) and the y-axis is normalized relative to the lobe width of a rectangular window.
Page 165: Bandpass Mode
Measurement - Time Domain (Option 002) 12-6 Bandpass Mode 12-6 Bandpass Mode The Bandpass Time Domain mode is similar to low pass but a few menu items change. Any graph type can be used with bandpass mode but log magnitude and linear magnitude are the most common. The top level of the time domain menu is repeated in Figure 12-12 for convenience.
Page 166 12-6 Bandpass Mode Measurement - Time Domain (Option 002) An example bandpass time domain plot is shown below for a short at the end of a transmission line. In a log magnitude display, there is a single impulse of approximately unity amplitude near the 100 ps mark. Figure 12-13.Example Band-pass Time Domain Plot 12-12 PN: 10410-00336 Rev: H...
Page 167 Measurement - Time Domain (Option 002) 12-6 Bandpass Mode The range menu for bandpass mode is shown in Figure 12-14. The differences here are that the response choice and DC terms are gone since they do not apply to this mode, and a new item appears: Phasor Impulse. Figure 12-14.RANGE SETUP Menu for Bandpass Time Domain In low pass mode, the sign of the data can be used to provide some hints as to the nature of the defect (inductive or capacitive).
Page 168 12-6 Bandpass Mode Measurement - Time Domain (Option 002) The window shapes have the same effect as in low pass but the starting resolution is only half that of low pass (the window effects are multiplicative). The window effects are illustrated in Figure 12-15 and correspond to the measurement of...
Page 169: Gating
Measurement - Time Domain (Option 002) 12-7 Gating 12-7 Gating Both lowpass and bandpass work similarly with regards to gating. Gating is the process of selecting or deleting certain defects to study. This can be left in time domain but, more commonly, the gated results are fed back through the forward transform to get the frequency domain result corresponding to the modified defect scenario just created.
Page 170 12-7 Gating Measurement - Time Domain (Option 002) The Notch toggle selects the polarity of the gate. When notch is OFF, the gate will keep everything between start and stop. When notch is ON, the gate will reject everything between start and stop. The main submenu, Gate Function, is shown in Figure 12-18.
Page 171: Dut Example - Gate And Window Nominal
Measurement - Time Domain (Option 002) 12-7 Gating With the advanced gates and windows, selections are not precluded although substantial errors can result if values are chosen without caution. If a more aggressive window is chosen (larger beta or side-lobe level), then the gate must be wider (wide or maximum;...
Page 172 12-7 Gating Measurement - Time Domain (Option 002) Next the gate is turned to on. In Figure 12-20, the suppression of the time domain information outside of the gate area is seen. Figure 12-20.Gate Turned On Example 12-18 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 173: Other Frequency-With-Time-Gate Calculation Items
Measurement - Time Domain (Option 002) 12-7 Gating Finally, frequency with time gating is activated and the result is shown in Figure 12-21. The result from frequency without time gating is shown in memory as a darker trace. The time gating has removed much of the ripple due to the mismatched transmission line and residual source match of the instrument.
Page 174 12-7 Gating Measurement - Time Domain (Option 002) In the time domain sense, an impulse is incident from the left and, at the first interface, some is reflected and some is transmitted. The transmitted impulse then sees the output plane of the DUT and again, some is reflected and some is transmitted.
Page 175: Saving Gated Results
Measurement - Time Domain (Option 002) 12-7 Gating Saving Gated Results As usual, .txt and .csv formats (along with the graphical formats) can be used to save post-processed results. Many users also wish to save gated results in the .sNp file formats but this is not enabled by default to avoid confusion on what the S-parameters represent.
Page 176 12-7 Gating Measurement - Time Domain (Option 002) 12-22 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 177: Chapter 13-Measurement - Sweep Types
Chapter 13 — Measurement - Sweep Types 13-1 Chapter Overview This chapter covers the sweep type available with the ShockLine™ MS46122A/B and MS46322A/B Series VNA to increase measurement functionality. 13-2 Introduction A single sweep type is available within the MS46122A/B and MS46322A/B Series VNAs. •...
Page 178: Setting Up Traditional Frequency Sweeps (Linear And Log)
A summary of the power settings is in Table 13-1 below. Table 13-1. Summary of Maximum and Minimum Power Levels Output Power Power Level Power Setting (Typical) MS46122A/B-010 Maximum Power High -3 dBm MS46122A/B-020 MS46122A/B-040 MS46322A/B-010 Minimum Power -20 dBm...
Page 179: Frequency-Based Segmented Sweep
Measurement - Sweep Types 13-5 Frequency-Based Segmented Sweep Other Setup This Selection opens the Min. Port Power dialog. (See description of dialog below) When Sweep Type is Segmented (Frequency or Indexed), this capability is not available and the button is deactivated and grayed out.
Page 180 13-5 Frequency-Based Segmented Sweep Measurement - Sweep Types The main menu and an example entry table are shown in Figure 13-4 Figure 13-5. The main purpose of this menu is to aid entering data into the table and to help save and recall that data. Note that segmented sweep tables can be saved/recalled separately from this menu or they can be saved/recalled as part of the global setup using the entries under the File menu.
Page 181 Measurement - Sweep Types 13-5 Frequency-Based Segmented Sweep The Add, Delete, and Clear All functions are obvious. The delete function applies to the current row as indicated by the caret in column 1. As with the multiple source tables, there are two ways to enter numbers •...
Page 182 13-5 Frequency-Based Segmented Sweep Measurement - Sweep Types When all of the data points plotted without regard to proportional frequency separation are required. For these occasions, the Index-based graph mode is available and an example is in Figure 13-7 for the same setup as Figure 13-6.
Page 183: Index-Based Segmented Sweep
Measurement - Sweep Types 13-6 Index-Based Segmented Sweep 13-6 Index-Based Segmented Sweep In index-based segmented sweep the frequency segments may be in any order. This may be useful for particular test patterns where reverse sweeps are needed or particular frequencies must be measured before others due to DUT hysteresis.
Page 184 13-6 Index-Based Segmented Sweep Measurement - Sweep Types 13-8 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 185: Chapter 14-E/O And O/E Converter Measurements
Chapter 14 — E/O and O/E Converter Measurements NEW CHAPTER 14-1 Chapter Overview As fiber and free-space optical communication bandwidths increase, the need for very high speed optical modulators and detectors has also increased. The frequency response characterization of these electrical-to-optical (E/O, modulators sometimes integrated with lasers) and optical-to-electrical (O/E, detectors and receivers) converters can be important in terms of such parameters as bandwidth, flatness and phase linearity.
Page 186: Introduction And Background
14-2 Introduction and Background E/O and O/E Converter Measurements 14-2 Introduction and Background Conceptually, the job of the optical modulator is to place a microwave signal as modulation onto an optical carrier. Similarly, the job of the photodetector or receiver is to recover that modulation and regenerate the microwave signal.
Page 187 E/O and O/E Converter Measurements 14-2 Introduction and Background The S-parameters that appear on the instrument display for an O/E or an E/O component then represent a relative responsivity measure (in both magnitude and phase). Often, the frequency response of this quantity is of interest as that determines bandwidth and magnitude vs.
Page 188 14-2 Introduction and Background E/O and O/E Converter Measurements Calibration Reference Planes Calibration Planes after De-embedding of O/E Standard Port 1 Port 2 RF OUT RF IN Polarization Controller Modulator Fiber Fiber Laser Source Photodiode Index Description Index Description VNA Port 1 Photodiode RF OUT VNA Port 2 Photodiode...
Page 189: Device Response
E/O and O/E Converter Measurements 14-2 Introduction and Background Device Response The device response is shown in the figure’s below, but the linear portion has not been removed. The group delay plot (derivative of phase with respect to frequency) is often a more convenient way of looking at the phase behavior.
Page 190: Measurements/(O/E-E/O) Menu
14-2 Introduction and Background E/O and O/E Converter Measurements Example O/E Device Response 0.05 -0.05 -0.1 Frequency (GHz) Figure 14-4. (Continued)The characteristics of an example O/E device are shown here. If one now wanted to measure a different O/E device (not a calibration module), one could then insert that detector into the setup of Figure 14-3 on page 14-4 and instead now de-embed the modulator response that was...
Page 191: Measurement Setups And Considerations
E/O and O/E Converter Measurements 14-3 Measurement Setups and Considerations 14-3 Measurement Setups and Considerations It is not the intent of this chapter to fully cover the optical setup details. However, some common issues and concerns will be discussed. More general information of fiber optic measurement setups can be found elsewhere (e.g., [3]-[4]).
Page 192: Modulator Bias Control
14-3 Measurement Setups and Considerations E/O and O/E Converter Measurements Modulator Bias Control Lithium niobate modulators are generally biased using a modulator bias controller (MBC) to control the operating point of the modulator. When biased in quadrature, the input RF signal linearly modulates the optical carrier.
Page 193: Example 2-Port Procedures
E/O and O/E Converter Measurements 14-4 Example 2-port Procedures 14-4 Example 2-port Procedures With the physical setup described, the next task is really how to interface with the measurement utilities. Consider first the case of a 2-port E/O measurement where one has a characterized O/E device (such as the MN4765X).
Page 194 14-4 Example 2-port Procedures E/O and O/E Converter Measurements Any calibration algorithm can be used as appropriate. Assuming this setup file is now available, it can be loaded in the dialog of Figure 14-7 as can the O/E characterization file (in a .s2p file format). Note the Swap ports checkbox availability near the characterization portion of the dialog box.
Page 195 E/O and O/E Converter Measurements 14-4 Example 2-port Procedures Assuming one has an O/E calibration device (such as the MN4765X), this Go Measure feature allows one to load that photodetector characterization file and use the setup file found on the main E/O dialog to do a quick measurement of the modulator (or assembly).
Page 196 14-4 Example 2-port Procedures E/O and O/E Converter Measurements Figure 14-9. When measuring O/E devices, the characteristics of the E/O device must be known. If a file does not already exist, this dialog can help in doing the intermediate measurement with the help of a calibration O/E device such as the MN4765X.
Page 197 E/O and O/E Converter Measurements 14-4 Example 2-port Procedures Example As an example, consider the following setup: • 2 GHz to 40 GHz, 10 Hz IFBW, power –20 dBm, no averaging. • A full two-port SOLT/SOLR calibration is performed using a 3652A Calibration Kit. •...
Page 198: Uncertainties
14-5 Uncertainties E/O and O/E Converter Measurements 14-5 Uncertainties In the measurements just described, the uncertainty can be broken into two broad categories: 1. Uncertainty associated with the characterization of the calibration device (such as the MN4765X) 2. Uncertainty in the measurement with the DUT Typically the user will purchase a characterized photodiode and receive a data file describing that device’s transfer function.
Page 199: References
4. J. Hecht, Understanding fiber optics, Prentice-Hall, pp. 28-31, 1999. 5. “What is your measurement accuracy,” Anritsu application note 11310-00270, 2001. 6. “E/O and O/E measurements with the 37300c series VNA,” Anritsu Application Note 11410-00311, 2003. MS46122A/B-322A/B MG PN: 10410-00336 Rev: H...
Page 200 14-7 References E/O and O/E Converter Measurements 14-16 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 201: Chapter 15-Maximum Efficiency Analysis (Mea) Measurements
The ability to accurately measure maximum efficiency and the kQ product for Wireless Power Transfer (WPT) systems is becoming very important. Anritsu, in collaboration with Toyohashi University of Technology have provided a measurement system that evaluates the product of the WPT coupling coefficient and quality factor.
Page 202: Software Setup For Maximum Efficiency Analysis
15-2 Introduction Maximum Efficiency Analysis (MEA) Measurements Software Setup for Maximum Efficiency Analysis ShockLine software provides a simple interface to setup parameters for Maximum Efficiency Analysis. The initial parameter that must be setup is the Response type. The Response type is not an S parameter but a Z parameter that is mathematically manipulated to provide key parameters for measuring a WPT system.
Page 203 Maximum Efficiency Analysis (MEA) Measurements 15-2 Introduction When the Response type has been set to Max Efficiency, ShockLine software enables a set of hidden menus that allows the user to access kQ product and maximum efficiency buttons. This menu is accessible via the ShockLine customized toolbar or through the Main menu function.
Page 204 15-2 Introduction Maximum Efficiency Analysis (MEA) Measurements 15-4 PN: 10410-00336 Rev: H MS46122A/B-322A/B MG...
Page 205 Airline ....... . . 10-4 Anritsu Part Numbers E/DE (Embedding/De-embedding) ..9-1, 9-11 3650x SOLT Kits .
Page 206 M to W Log ........13-2 Low pass mode .
Page 208 Anritsu Company 490 Jarvis Drive Anritsu utilizes recycled paper and environmentally conscious inks and toner. Morgan Hill, CA 95037-2809 http://www.anritsu.com...

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Ms46322a/b-010 Ms46122a/b-040 Ms46322a-004 Ms46322a-030 Ms46322a-014 Ms46322a/b-020 ... Show all

Anritsu MS46122A/B-010 Manual

Chapter 1-Calibration Overview

Chapter 2-Automatic Calibration Procedures

Chapter 3 -SOLT/SOLR Calibration

Chapter 4-Offset Short (SSLT) Calibration

Chapter 5-Triple Offset Short (SSST) Calibration

Chapter 6-LRL/LRM Calibration

Chapter 7-Adapter Removal Calibrations

Chapter 8-Other Calibration Procedures

Chapter 9-Calibration And Measurement Enhancements

Chapter 10-Verification

Chapter 11-Measurement Setup Requirements

Chapter 12-Measurement - Time Domain (Option 002)

Chapter 13-Measurement - Sweep Types

Chapter 14-E/O And O/E Converter Measurements

Chapter 15-Maximum Efficiency Analysis (MEA) Measurements

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