Anritsu MS46322A-030 Manuals

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Anritsu MS46322A-030 Programming Manual

Anritsu MS46322A-030 Programming Manual (472 pages)

Series Vector Network Analyzers

Brand: Anritsu | Category: Measuring Instruments | Size: 5 MB

Table of Contents

Table of Contents
3
Chapter 1 - General Information

11
Chapter 2 - Programming the Shockline™ Series VNA

23
- Introduction
  23
- Introduction to SCPI Programming
  23
  - Command Types
    23
- IEEE 488.2 Commands
  24
- System Commands
  24
- SCPI Commands
  24
  - Required SCPI Commands
    24
  - Native SCPI Commands
    25
- Command Requirements
  25
  - Query Commands
    25
  - Command Names
    25
  - Hierarchical Command Structure
    26
  - Data Parameters
    26
- Notational Conventions
  27
  - General Notations
    27
  - Parameter Notations
    28
  - Notational Examples
    29
- Numeric Data Suffix Reference
  30
- Data Transmission Methods
  31
  - Nr1
    31
  - Nr2
    31
  - Nr3
    31
  - Nrf
    31
  - String
    32
  - ASCII> or <Arbitrary ASCII
    32
  - Block> or <Arbitrary Block
    32
  - Char
    34
  - Mpnd
    34
  - Mpnf
    34
  - Mpni
    34
  - Formatting Data Output
    34
  - ASCII or Binary Data Format
    35
- Calculating the Byte Size
  37
- Input Buffer Size and NRFD Holdoff
  38
- Synchronization of Commands
  39
- Forcing the Parser to Stop Waiting
  39
- Aborting an RF or Hardware Calibration
  39
- Time-Out Settings
  39
- Trace Type Parameters and Coefficients
  41
- Input/Output Data Files
  44
- Status System Reporting
  46
  - Status Group Registers
    46
  - Status Group Reporting
    46
- Trigger System
  52
  - Trigger Modes
    52
- Calibration Component Parameters
  53
  - Loads and through Lines
    53
  - Other Connector Coefficients
    53
- Calibration Command Overview
  54
  - Setting up a Two-Port Calibration
    54
  - Defining the Calibration Standards
    55
  - Performing the Calibration
    58
  - Autocal
    60
- Command Script Example - Limit Lines
  63
Chapter 3 - IEEE Commands

71
- Introduction
  71
- Command Descriptions
  71
- Numeric Limits
  72
- IEEE 488.2 Commands
  72
Chapter 4 - Diagnostic and Troubleshooting Commands

81
- Parameters and Notations
  81
- Numeric Limits
  82
- Self Test Commands
  83
Chapter 5 - SCPI Commands: 1-Port and 2-Port Vnas

85
- Introduction
  85
- MS46322A Vs. MS46122A/MS46121A SCPI Configuration
  85
- Minimum/Maximum Frequency Limits and Related Parameters
  85
- Command Level Hierarchy
  86
- General Parameters
  87
- Calculate{1-16}:Correction Subsystem
  89
  - Calibration Option Subsystems
    89
- Calculate{1-16}:Extraction Subsystem
  91
  - Calibration Option Subsystems
    91
  - General Parameters
    91
- Calculate{1-16}:Display:marker Subsystem
  98
  - Marker Subsystems
    98
- Calculate{1-16}:Format Subsystem - Snp Data
  99
  - I/O Configuration and File Operation Subsystems
    99
- Calculate{1-16}:Fsimulator:network Subsystem
  100
  - Calibration Simulation Subsystems
    100
- Calculate{1-16}:Fsimulator:network {1-50} Subsystem
  107
  - Calibration Simulation Subsystems
    107
- Calculate{1-16}:Impedance:transformation Subsystem
  113
  - Calibration Setup Subsystems
    113
- Calculate{1-16}:Marker Subsystem
  115
  - Marker Subsystems
    115
- Calculate{1-16}:Parameter and :Parameter{1-16
  116
  - Trace Subsystems
    116
- Calculate{1-16}:Parameter{1-16}:Marker Subsystem
  121
  - Marker Subsystems
    121
- Calculate{1-16}:Parameter{1-16}:Mstatistics Subsystem
  124
  - Marker Subsystems
    124
- Calculate{1-16}:Parameter{1-16}:Select Subsystem
  126
  - Trace Subsystems
    126
- Calculate{1-16}:Polar Subsystem
  127
  - Trace Subsystems
    127
- Calculate{1-16}:Processing:order Subsystem
  129
  - Time Domain, Group Delay, and Reference Plane Subsystems
    129
- Calculate{1-16}:Reference Subsystem
  130
  - Calibration Setup Subsystems
    130
  - Time Domain, Group Delay, and Reference Plane Subsystems
    130
- Calculate{1-16}[:Selected]:Conversion Subsystem
  133
  - Trace Subsystems
    133
- Calculate{1-16}[:Selected]:Data Subsystem
  135
  - I/O Configuration and File Operation Subsystems
    135
  - Trace Subsystems
    135
- Calculate{1-16}[:Selected]:Format Subsystem
  137
  - Trace Subsystems
    137
- Calculate{1-16}[:Selected]:Limit Subsystem
  139
  - Limit Line and Segment Subsystems
    139
  - Trace Subsystems
    139
- Calculate{1-16}[:Selected]:Marker Subsystem
  143
  - Marker Subsystems
    143
- Calculate{1-16}[:Selected]:Marker{1-13} Subsystem
  156
  - Marker Subsystems
    156
  - Trace Subsystems
    156
- Calculate{1-16}[:Selected]:Math Subsystem
  159
  - Trace Subsystems
    159
- Calculate{1-16}[:Selected]:Mdata Subsystem
  162
  - Trace Subsystems
    162
- Calculate{1-16}[:Selected]:Smoothing Subsystem
  163
  - Trace Subsystems
    163
- Calculate{1-16}[:Selected]:Tdata Subsystem
  164
  - Trace Subsystems
    164
  - I/O Configuration and File Operation Subsystems
    164
- Calculate{1-16}[:Selected]:Transform:time Subsystem
  166
  - Time Domain, Group Delay, and Reference Plane Subsystems
    166
  - Trace Subsystems
    166
- Display Subsystem
  176
  - Trace Subsystems
    176
  - Marker Subsystems
    176
  - Limit Line Subsystems
    176
- Format Subsystem
  190
  - I/O Configuration and File Operation Subsystems
    190
- Hcopy Subsystem
  193
  - I/O Configuration and File Operation Subsystems
    193
- Mmemory Subsystem
  198
  - I/O Configuration and File Operation Subsystems
    198
- Sense{1-16}:Abortcal Subsystem
  205
  - Calibration Subsystems with Actual Calibrations
    205
- Sense{1-16}:Average Subsystem
  206
  - Sweep Subsystems
    206
- Sense{1-16}:Bandwidth Subsystem
  208
  - IF Configuration Subsystems
    208
- Sense{1-16}:Bwidth Subsystem
  209
  - IF Configuration Subsystems
    209
- Sense{1-16}:Correction:coefficient:port
  210
  - Calibration Simulation Subsystems
    210
  - Calibration Type Abbreviations
    210
  - Related Query
    210
- Sense{1-16}:Correction:coefficient Subsystem
  214
  - Calibration Simulation Subsystems
    214
  - Calibration Type Abbreviations
    214
- Sense{1-16}:Correction:collect:ecal Subsystems
  218
- Sense{1-16}:Correction:collect:method Subsystem
  222
  - Calibration Setup Subsystems
    222
- Sense{1-16}:Correction:collect:microstrip Subsystem
  223
  - Calibration Setup Subsystems
    223
- Sense{1-16}:Correction:collect:multiple Subsystem
  228
  - Calibration Setup Subsystems
    228
- Sense{1-16}:Correction:collect:port Subsystem
  229
  - Calibration Subsystems with Actual Calibrations
    229
  - Calibration Type Abbreviations
    229
- Sense{1-16}:Correction:collect Subsystem
  261
  - Calibration Setup Subsystems
    261
- Sense{1-16}:Correction:collect[:Cala]:Port
  262
  - Calibration Abbreviations
    262
- Sense{1-16}:Correction:collect Subsystem
  264
  - Calibration Setup Subsystems
    264
  - Related Command Subsystems
    264
  - Calibration Method Names
    264
- Sense{1-16}:Correction:collect:waveguide
  272
  - Calibration Setup Subsystems
    272
- Sense{1-16}:Correction:extension Subsystem
  279
  - Time Domain, Group Delay, and Reference Plane Subsystems
    279
- Sense{1-16}:Correction:isolation Subsystem
  280
  - Calibration Setup Subsystems
    280
- Sense{1-16}:Correction:state Subsystem
  281
  - Calibration Setup Subsystems
    281
- Sense{1-16}:Frequency Subsystem
  282
  - Sweep Subsystems
    282
  - Frequency Limits
    282
- Sense{1-16}:Fsegment Subsystem
  284
  - Limit Line and Segment Subsystems
    284
- Sense{1-16}:Fsegment{1-50} Subsystem
  291
  - Limit Line and Segment Subsystems
    291
- Sense{1-16}:HOLD Subsystem
  295
  - Trigger, Hold, and External Source Subsystems
    295
- Sense{1-16}:Isegment Subsystem
  295
  - Limit Line and Segment Subsystems
    298
- Sense{1-16}:Isegment{1-50} Subsystem
  304
  - Limit Line and Segment Subsystems
    304
- Sense{1-16}:Receiver Subsystem
  309
- Sense{1-16}:Segment Subsystem
  310
  - Limit Line and Segment Subsystems
    310
- Sense{1-16}:Sweep Subsystem
  311
  - Sweep Subsystems
    311
- Source{1-16}:Effective Subsystem
  313
  - Power Configuration Subsystems
    313
- Status:operation Subsystem
  314
- Status:questionable Subsystem
  316
- System Subsystem
  319
Appendix A - Third Party Programming and Driver Support

329
Appendix B - Agilent ENA SCPI Programming Emulation

331
- Introduction
  331
- ENA Command Listing
  333
Appendix C - IVI Functions

337
- Introduction
  337
  - Error and Status Information
    337
  - IVI-C Driver Information
    338
  - Functions and Attributes General Information
    338
  - Functions and Their Corresponding IVI Class
    339
  - Relevant Files
    339
- Anvna_Channelasynchronoustriggersweep
  340
Anvna_Calstoredata

341
Name

343
Variable Type Description

343
- Viconststring Repcapidentifier
  343
Visession VI

343
Repcapidentifier Viconststring

343
The Visession Handle that You Obtain from the Ividriver_Init or

344

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Anritsu MS46322A-030 Manual

Anritsu MS46322A-030 Manual (208 pages)

ShockLine MS46122A/B and MS46322A/B Series, Vector Network Analyzer

Brand: Anritsu | Category: Measuring Instruments | Size: 16 MB

Table of Contents

Table of Contents
3
Chapter 1-Calibration Overview

9
Chapter 2-Automatic Calibration Procedures

29
- Chapter Overview
  29
- Automatic Calibration Introduction
  29
  - Transfer Calibration
    29
  - Calibration Accuracy
    29
- Automatic Calibration Terms
  30
  - Insertable and Non-Insertable Devices
    30
  - Auto-Sense
    30
  - Characterization File
    30
- Available Calibrator Modules and Adapters
  32
  - Autocal Modules and Adapters
    33
  - Smartcal Modules and Adapters
    33
  - Autocal Components
    33
  - Smartcal Module
    34
  - Connector Care
    34
  - Calibration Parameters and Types
    34
  - Adapter Removal
    35
  - Through Options
    35
  - Smartcal Test Port 1 / Port 2 Naming Assignments
    35
  - Autocal Test Port Left/Right Naming Assignments
    35
- MS46122A/B Typical Calibrator Connections
  36
- MS46322A/B Typical Calibrator Connections
  37
  - Using the Calibration Module
    38
- Copying the Calibrator Characterization File
  40
  - Procedure
    40
- Loading a Previously Stored Autocal Characterization
  41
  - Procedure
    41
- Pre-Calibration Instrument Setup
  42
  - Segmented Sweep
    42
  - IF Bandwidth (IFBW) and Averaging
    42
  - Example Procedure
    42
- Calibration - Full Two Port - Internal through
  45
  - Required Equipment
    45
  - Procedure
    45
- Calibration - Two Port Cal - True through
  50
  - Required Equipment
    50
  - Procedure
    50
  - Connect the True through
    54
- Calibration Module Characterization
  57
  - Characterization
    57
- Adapter Removal - M-M or F-F Reference Plane
  58
  - Adapter Removal Overview
    58
  - Required Equipment
    58
  - Prerequisites
    58
  - Procedure
    58
Chapter 3 -SOLT/SOLR Calibration

63
- SOLT/SOLR Introduction
  63
- Definitions
  63
  - Shorts
    63
  - Opens
    63
  - Loads
    63
  - Thru
    63
  - Reciprocal
    63
- SOLT/SOLR Calibration
  63
Chapter 4-Offset Short (SSLT) Calibration

73
- SSLT Introduction
  73
- SSLT Calibration Example
  75
Chapter 5-Triple Offset Short (SSST) Calibration

77
Chapter 6-LRL/LRM Calibration

83
- LRL/LRM Introduction
  83
- LRL/LRM Comparison
  83
- LRL/LRM Calibration Step-By-Step Example
  89
  - Procedure
    90
- Hints and Suggestions
  93
Chapter 7-Adapter Removal Calibrations

95
- Introduction
  95
- Two Related Sets of Reference Planes
  95
  - Caveats and Limitations
    96
- Performing an Adapter Removal
  99
  - Example Adapter Removal
    100
Chapter 8-Other Calibration Procedures

103
- Overview of Other Calibration Procedures
  103
- Through (Thru) Update
  103
- Interpolation
  104
- Hybrid Calibrations
  107
Chapter 9-Calibration And Measurement Enhancements

109
- Chapter Overview
  109
- Chapter Overview
  110
- Embedding/De-Embedding (E/DE)
  111
  - Embedding Tasks
    111
  - De-Embedding Tasks
    111
  - Embedding On/Off Control
    112
  - Types of E/DE Networks
    115
  - Entry Mode for Resistive Elements
    116
  - Entry Mode for Transmission Lines
    117
  - Entry Mode for S2P Defined File-Based Networks
    118
  - Saving and Recalling Embedding Network Configuration
    119
- Reference Plane Control
  120
  - Auto Button Functions
    120
- Impedance Transformation
  122
- Processing Order
  123
  - Reference Plane Processing Sequence
    123
  - Group Delay Processing Sequence
    123
- Conversions
  124
Chapter 10-Verification

127
- Introduction to Verification
  127
- Basic Concepts
  127
  - Hardware Level
    127
  - Intermediate System Level
    127
  - Comparison to Known Devices
    127
  - Metric of Comparison
    128
  - Verification Kit Creation Process
    129
- Verification Kit Components
  130
  - No Verification with Calibration Kits
    130
- Verification Kit Software
  132
Chapter 11-Measurement Setup Requirements

133
- Chapter Overview
  133
- Channels and Traces Introduction
  133
  - Channel Concept
    133
  - Trace Concept
    133
- Measurement General Concepts
  134
  - Per-System Variables
    134
- Channels and the Channel Menu
  135
- Traces
  138
  - Per-Trace Variables
    140
  - Complex Trace Setup Example
    141
- Markers Overview
  142
  - Marker Button Label Changes
    142
  - Marker Unit Changes
    142
  - Reference Marker off or on
    142
  - Turning Individual Markers off and on
    142
  - Turning All Markers on
    142
  - Turning All Markers off
    143
  - Naming Conventions for Marker Buttons and Toolbars
    143
  - Position Marker(S)
    143
- Hold Functions
  145
- Overview of Limit Lines
  146
- Limit Lines
  146
  - Limit Test
    146
  - Test Result Sign
    147
  - Limit Line
    147
  - Limit Fail Signal
    147
  - Editing Limit Lines
    147
  - Edit Limit Line Menu
    147
- Ripple Limit Lines
  149
  - Response Menu
    151
- Averaging and Smoothing
  152
  - Overview
    152
Chapter 12-Measurement - Time Domain (Option 002)

155
- Chapter Overview
  155
- Introduction
  155
- Basic Time Domain Modes
  156
- General Concepts
  157
  - Chirp-Z Transform
    157
  - Defects as Impulse Functions in the Time Domain
    157
  - One-Way or Round Trip Time
    157
- Low Pass Mode
  158
  - Range Setup Menu Functions
    159
  - DC Term Menu
    160
  - Window Shape Menu
    161
- Bandpass Mode
  165
- Gating
  169
  - Gate Menu
    169
  - DUT Example - Gate and Window Nominal
    171
  - Other Frequency-With-Time-Gate Calculation Items
    173
  - Saving Gated Results
    175
Chapter 13-Measurement - Sweep Types

177
- Chapter Overview
  177
- Introduction
  177
- Setting up Traditional Frequency Sweeps (Linear and Log)
  178
- Maximum and Minimum Power Settings
  178
- Frequency-Based Segmented Sweep
  179
- Index-Based Segmented Sweep
  183
Chapter 14-E/O And O/E Converter Measurements

185
- Chapter Overview
  185
- Introduction and Background
  186
  - Device Response
    189
  - Measurements/(O/E-E/O) Menu
    190
- Measurement Setups and Considerations
  191
  - Optical Linearity
    191
  - Laser Power and Photodetector Bias Sequencing
    191
  - Optical Fiber Lengths
    191
  - Modulator Bias Control
    192
  - Connector Care
    192
- Example 2-Port Procedures
  193
- Uncertainties
  198
- References
  199
- Summary
  199
Chapter 15-Maximum Efficiency Analysis (MEA) Measurements

201
- Overview
  201
- Introduction
  201
  - Software Setup for Maximum Efficiency Analysis
    202

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